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1. 发明授权

US4649556A Method and apparatus for the "on-line", nondestructive measurement and control of grain size in materials 失效
标题翻译： “在线”方法和设备，材料中晶粒尺寸的无损测量和控制
公开(公告)号：US4649556A
公开(公告)日：1987-03-10
申请号：US584115
申请日：1984-02-27
申请人： Christine Rinik , Jerome B. Cohen , John E. Hilliard
发明人： Christine Rinik , Jerome B. Cohen , John E. Hilliard
IPC分类号： G01N15/02 , G01N23/20
CPC分类号： G01N15/02 , G01N23/20
摘要： A method and apparatus for the "on-line", nondestructive measurement and control of grain size in various materials, such as steel, powders, ceramics, semiconductors, and crystalline polymers. A substantially monochromatic beam of X-rays is directed at the material as it moves relative to a predetermined measuring station. The incident X-ray beam has a predetermined cross-sectional area so that over a plurality of time intervals a plurality of corresponding non-overlapping area segments are irradiated. The time-integrated intensity of diffracted radiation from each non-overlapping area segment is measured and the relative variance of the intensity measurements within the total area irradiated is determined. The relative variance of the measured intensities is then used to determine the grain size of the products which is generally reported as the mean grain diameter, weighted with respect to volume.
摘要翻译：用于“在线”，非破坏性测量和控制各种材料（如钢，粉末，陶瓷，半导体和结晶聚合物）中的晶粒尺寸的方法和装置。当材料相对于预定测量站移动时，基本单色的X射线束被引导到材料。入射的X射线束具有预定的横截面积，使得在多个时间间隔内照射多个对应的非重叠区域段。测量来自每个非重叠区域段的衍射辐射的时间积分强度，并确定所辐射总面积内的强度测量值的相对方差。然后使用测量的强度的相对方差来确定通常以相对于体积加权的平均颗粒直径报告的产品的晶粒尺寸。

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