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1. 发明授权

US07590504B2 Graphical user interface for creation of IBIST tests 有权
标题翻译：用于创建IBIST测试的图形用户界面
公开(公告)号：US07590504B2
公开(公告)日：2009-09-15
申请号：US11465082
申请日：2006-08-16
申请人： James Ernest Chorn , Thomas Green Hudiburgh , Jay Joseph Nejedlo , Edward Keith Simpson
发明人： James Ernest Chorn , Thomas Green Hudiburgh , Jay Joseph Nejedlo , Edward Keith Simpson
IPC分类号： G06F19/00
CPC分类号： G01R31/31912 , G01R31/318314
摘要： A graphical user interface (GUI) that configures a test for a circuit. More particularly, the circuit includes a built-in-self-test (BIST) compatible device and has a test configuration. The device has an associated value. Moreover, the circuit, the device, and the associated value are defined in a circuit definition. The GUI includes a GUI object representing the circuit, a GUI object representing the BIST compatible device, and a GUI object representing the associated value. Furthermore, at least one of the GUI objects is configured to allow a modification to the GUI object and to reconfigure the test configuration in response to the GUI object modification. Also, the GUI object is further configured to modify itself to reflect a modification of the circuit definition. More particularly, the device may be an interconnect built-in self-test (IBIST) compatible device having registers, ports and lanes of the ports.
摘要翻译：配置电路测试的图形用户界面（GUI）。更具体地，该电路包括内置自测（BIST）兼容设备并且具有测试配置。设备具有相关联的值。此外，电路，设备和相关联的值在电路定义中定义。 GUI包括表示电路的GUI对象，表示BIST兼容设备的GUI对象和表示关联值的GUI对象。此外，GUI对象中的至少一个被配置为允许对GUI对象的修改，并且响应于GUI对象修改而重新配置测试配置。此外，GUI对象还被配置为修改自身以反映电路定义的修改。更具体地，该设备可以是具有端口的寄存器，端口和通道的互连内置自检（IBIST）兼容设备。

2. 发明授权

US07562274B2 User data driven test control software application the requires no software maintenance 有权
标题翻译：用户数据驱动的测试控制软件应用程序，无需软件维护
公开(公告)号：US07562274B2
公开(公告)日：2009-07-14
申请号：US11465080
申请日：2006-08-16
申请人： James Ernest Chorn , Thomas Green Hudiburgh , Jay Joseph Nejedlo , Edward Keith Simpson , Walter Michael Coldewey
发明人： James Ernest Chorn , Thomas Green Hudiburgh , Jay Joseph Nejedlo , Edward Keith Simpson , Walter Michael Coldewey
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/318583 , G01R31/31855
摘要： Methods and apparatus for performing a data driven test on a circuit including at least one built-in-self-test compatible device. In one embodiment, the method includes describing the device using a descriptive language including setting at least one default value associated with the device. The method also includes defining a scan path associated with the device, defining a netlist of the circuit, and configuring a test control program for the circuit. Additionally, the method includes changing the default value associated with the device. Testing the circuit after changing the value and using the test control program is also included wherein a portion of the test control program associated with the value remains substantially unmodified.
摘要翻译：在包括至少一个内置自测兼容装置的电路上执行数据驱动测试的方法和装置。在一个实施例中，该方法包括使用描述语言描述设备，包括设置与设备相关联的至少一个默认值。该方法还包括定义与设备相关联的扫描路径，定义电路的网表，以及配置电路的测试控制程序。此外，该方法包括更改与设备相关联的默认值。还包括在更改值和使用测试控制程序之后测试电路，其中与该值相关联的测试控制程序的一部分基本上未被修改。

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