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    • 2. 发明申请
    • SOLID STATE BACK-ILLUMINATED PHOTON SENSOR
    • 固态背光照明传感器
    • US20110175185A1
    • 2011-07-21
    • US13010328
    • 2011-01-20
    • William Edward AsherMichael Alan CaseJason McClure
    • William Edward AsherMichael Alan CaseJason McClure
    • H01L31/0232
    • H01L27/14685H01L27/14621H01L27/1464H01L31/02162
    • A backside-illuminated image sensor is disclosed having improved quantum efficiency (QE) in the near infrared wavelengths (NIR: 750-1100 nm) with minimal optical interference fringes produced by multiple reflected rays within the photosensitive Si region of the sensor, which may be a charge-coupled device, a complementary metal oxide sensor or an electron-multiplication sensor. The invention comprises a fringe suppression layer applied to the backside surface of the photosensitive Si region of a detector (Si substrate) whereby the fringe suppression layer functions in concert with the Si substrate to reduce the occurrence of interference fringes in the NIR while maintaining a high QE over a broad range of wavelengths (300-1100 nm). The combination of a fringe suppression layer applied to a Si substrate provides a new class of back illuminated solid state detectors for imaging.
    • 公开了背照式图像传感器,其在近红外波长(NIR:750-1100nm)中具有改善的量子效率(QE),具有由传感器的感光Si区域内的多个反射光线产生的最小光学干涉条纹,其可以是 电荷耦合器件,互补金属氧化物传感器或电子倍增传感器。 本发明包括施加到检测器(Si衬底)的感光Si区域的背面的边缘抑制层,由此边缘抑制层与Si衬底一起起作用,以减少NIR中的干涉条纹的发生,同时保持高 在宽范围的波长(300-1100nm)上的QE。 施加到Si衬底的边缘抑制层的组合提供了一类用于成像的背照式固态检测器。
    • 7. 发明授权
    • Solid state back-illuminated photon sensor
    • 固态背照光子传感器
    • US08436423B2
    • 2013-05-07
    • US13010328
    • 2011-01-20
    • William Edward AsherMichael Alan CaseJason McClure
    • William Edward AsherMichael Alan CaseJason McClure
    • H01L29/00
    • H01L27/14685H01L27/14621H01L27/1464H01L31/02162
    • A backside-illuminated image sensor is disclosed having improved quantum efficiency (QE) in the near infrared wavelengths (NIR: 750-1100 nm) with minimal optical interference fringes produced by multiple reflected rays within the photosensitive Si region of the sensor, which may be a charge-coupled device, a complementary metal oxide sensor or an electron-multiplication sensor. The invention comprises a fringe suppression layer applied to the backside surface of the photosensitive Si region of a detector (Si substrate) whereby the fringe suppression layer functions in concert with the Si substrate to reduce the occurrence of interference fringes in the NIR while maintaining a high QE over a broad range of wavelengths (300-1100 nm). The combination of a fringe suppression layer applied to a Si substrate provides a new class of back illuminated solid state detectors for imaging.
    • 公开了背照式图像传感器,其在近红外波长(NIR:750-1100nm)中具有改善的量子效率(QE),具有由传感器的感光Si区域内的多个反射光线产生的最小光学干涉条纹,其可以是 电荷耦合器件,互补金属氧化物传感器或电子倍增传感器。 本发明包括施加到检测器(Si衬底)的感光Si区域的背面的边缘抑制层,由此边缘抑制层与Si衬底一起起作用,以减少NIR中的干涉条纹的发生,同时保持高 在宽范围的波长(300-1100nm)上的QE。 施加到Si衬底的边缘抑制层的组合提供了一类用于成像的背照式固态检测器。
    • 8. 发明授权
    • Method for calibrating imaging spectrographs
    • 校准成像光谱仪的方法
    • US07999933B2
    • 2011-08-16
    • US12541586
    • 2009-08-14
    • Jason McClure
    • Jason McClure
    • G01J3/00
    • G01J3/28G01J2003/2866
    • Disclosed is a method for calibrating optical spectrographs, and in particular optical spectrographs having focal plane array detectors. The method comprises the steps of detecting a spectrum of a known source, referencing a table of known spectral wavelengths and relative intensities, and deriving a spectrograph model based on the spectrograph's physical properties to approximate the observed spectrum, wherein non-linear optimization techniques refine the theoretical model parameters, thereby minimizing the residual difference between observed and calculated spectral intensities in an iterative process producing a set of physical model parameters that best describe the modeling spectrograph for calibration of subsequent spectral acquisitions.
    • 公开了一种用于校准光学光谱仪的方法,特别是具有焦平面阵列检测器的光学光谱仪。 该方法包括以下步骤:检测已知源的光谱,参考已知光谱波长和相对强度的表格,以及基于所述光谱仪的物理特性导出近似观测光谱的光谱仪模型,其中非线性优化技术改进 理论模型参数,从而最小化迭代过程中观察和计算的光谱强度之间的剩余差异,产生最佳描述建模光谱仪的一组物理模型参数,用于后续光谱采集的校准。