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1. 发明申请

US20090084959A1 Methods of Thermoreflectance Thermography 失效
标题翻译：热反射热成像方法
公开(公告)号：US20090084959A1
公开(公告)日：2009-04-02
申请号：US12240981
申请日：2008-09-29
申请人： Janice A. Hudgings , Joseph Summers
发明人： Janice A. Hudgings , Joseph Summers
IPC分类号： G01N21/17
CPC分类号： G01J5/0003 , G01J5/08 , G01J5/0809 , G01J5/0831 , G01J5/084 , G01J5/0896 , G01J2005/0048 , G01N21/1717 , G01N21/55
摘要： An embodiment of a method of performing thermoreflectance measurements with an imaging system comprises: reflecting radiation from a number of points in a sample in response to an illuminating radiation while a temperature modulation is applied to the sample; acquiring digital images of the reflected radiation after the reflected radiation passes through an aperture; and deriving a map of relative reflectivity of the sample based on the digital images. At least a portion of the illuminating radiation passes through at least a portion of the sample and is reflected at a change refractive index interface.
摘要翻译：使用成像系统执行热反射测量的方法的实施例包括：当对样品施加温度调制时，响应于照射辐射反射来自样品中的多个点的辐射; 在反射的辐射通过孔径之后获取反射的辐射的数字图像; 并且基于数字图像得到样本的相对反射率的图。照射辐射的至少一部分通过样品的至少一部分并在变化的折射率界面反射。

2. 发明申请

US20090245322A1 OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS 有权
标题翻译：光电集成电路的光学特性
公开(公告)号：US20090245322A1
公开(公告)日：2009-10-01
申请号：US12115201
申请日：2008-05-05
申请人： Janice A. Hudgings , Rajeev J. Ram , Maryam Farzaneh
发明人： Janice A. Hudgings , Rajeev J. Ram , Maryam Farzaneh
IPC分类号： G01N25/00
CPC分类号： G01K11/125
摘要： In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.
摘要翻译：一方面，本发明提供了用于光子器件和/或电路的光学表征的技术和装置。作为示例，这些技术可用于识别光子集成电路中的损坏设备。在一些实施例中，热成像被用作诊断工具，用于表征所研究的装置/电路。例如，在一个实施例中，可以使用来自一个放大器的放大的自发发射作为热调制输入到另一个放大器来表征集成级联半导体放大器。第二放大器的反射反射图像可以显示缺陷（如果存在）。此外，在一些实施例中，可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。

3. 发明授权

US08408786B2 Optical characterization of photonic integrated circuits 有权
标题翻译：光子集成电路的光学表征
公开(公告)号：US08408786B2
公开(公告)日：2013-04-02
申请号：US12115201
申请日：2008-05-05
申请人： Janice A. Hudgings , Rajeev J. Ram , Maryam Farzaneh
发明人： Janice A. Hudgings , Rajeev J. Ram , Maryam Farzaneh
IPC分类号： G01K3/00 , G01K1/00 , G01K11/00
CPC分类号： G01K11/125
摘要： In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.
摘要翻译：一方面，本发明提供了用于光子器件和/或电路的光学表征的技术和装置。作为示例，这些技术可用于识别光子集成电路中的损坏设备。在一些实施例中，热成像被用作诊断工具，用于表征所研究的装置/电路。例如，在一个实施例中，可以使用来自一个放大器的放大的自发发射作为热调制输入到另一个放大器来表征集成级联半导体放大器。第二放大器的反射反射图像可以显示缺陷（如果存在）。此外，在一些实施例中，可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。

4. 发明授权

US6026108A Vertical-cavity surface-emitting laser with an intracavity quantum-well optical absorber 失效
标题翻译：具有腔内量子阱光吸收器的垂直腔表面发射激光器
公开(公告)号：US6026108A
公开(公告)日：2000-02-15
申请号：US71653
申请日：1998-05-01
申请人： Sui F. Lim , Janice A. Hudgings , Kam-Yin Lau , Connie J. Chang-Hasnain
发明人： Sui F. Lim , Janice A. Hudgings , Kam-Yin Lau , Connie J. Chang-Hasnain
IPC分类号： H01S5/187 , G02F3/02 , H01S5/026 , H01S5/042 , H01S5/06 , H01S5/065 , H01S5/183 , H01S5/20 , H01S3/19
CPC分类号： H01S5/0264 , G02F3/026 , H01S5/0425 , H01S5/0601 , H01S5/0658 , H01S5/18302 , H01S5/18308 , H01S5/18311 , H01S5/18316 , H01S5/18325 , H01S5/2063
摘要： A laser comprises a first contact to receive an active region control signal, a second contact to receive an optical absorber control signal, and a sandwich of distributed Bragg reflector mirror stacks. Each distributed Bragg reflector mirror stack has an alternate doping with respect to an adjacent distributed Bragg reflector mirror stack. An active region is positioned in the sandwich to provide optical gain in response to the active region control signal. An optical absorber is positioned in the sandwich. The optical absorber has wavelength dependent absorption in response to the optical absorber control signal. The device of the invention may be utilized as an integrated detector, a self-pulsating laser, a high speed intracavity modulator, or an optical pick-up device.
摘要翻译：激光器包括用于接收有源区域控制信号的第一触点，用于接收光吸收器控制信号的第二触点和分布式布拉格反射镜叠层的夹层。每个分布式布拉格反射镜叠层相对于相邻的布拉格反射镜叠层具有交替掺杂。有源区域位于三明治中以提供响应于有源区域控制信号的光学增益。光吸收器位于三明治中。光吸收剂响应于光吸收器控制信号而具有波长依赖性吸收。本发明的装置可以用作集成检测器，自脉动激光器，高速腔内调制器或光学拾取装置。

5. 发明授权

US08362431B2 Methods of thermoreflectance thermography 失效
标题翻译：热反射热敏成像方法
公开(公告)号：US08362431B2
公开(公告)日：2013-01-29
申请号：US12240981
申请日：2008-09-29
申请人： Janice A. Hudgings , Joseph Summers
发明人： Janice A. Hudgings , Joseph Summers
IPC分类号： G01J5/02 , G01J5/06
CPC分类号： G01J5/0003 , G01J5/08 , G01J5/0809 , G01J5/0831 , G01J5/084 , G01J5/0896 , G01J2005/0048 , G01N21/1717 , G01N21/55
摘要： An embodiment of a method of performing thermoreflectance measurements with an imaging system comprises: reflecting radiation from a number of points in a sample in response to an illuminating radiation while a temperature modulation is applied to the sample; acquiring digital images of the reflected radiation after the reflected radiation passes through an aperture; and deriving a map of relative reflectivity of the sample based on the digital images. At least a portion of the illuminating radiation passes through at least a portion of the sample and is reflected at a change refractive index interface.
摘要翻译：使用成像系统执行热反射测量的方法的实施例包括：当对样品施加温度调制时，响应于照射辐射反射来自样品中的多个点的辐射; 在反射的辐射通过孔径之后获取反射的辐射的数字图像; 并且基于数字图像得到样本的相对反射率的图。照射辐射的至少一部分通过样品的至少一部分并在变化的折射率界面反射。

6. 发明申请

US20090297017A1 HIGH RESOLUTION MULTIMODAL IMAGING FOR NON-DESTRUCTIVE EVALUATION OF POLYSILICON SOLAR CELLS 审中-公开
标题翻译：用于多晶硅太阳能电池非破坏性评估的高分辨率多模式成像
公开(公告)号：US20090297017A1
公开(公告)日：2009-12-03
申请号：US12411187
申请日：2009-03-25
申请人： Janice A. Hudgings , Rajeev Ram , Kevin McCarthy
发明人： Janice A. Hudgings , Rajeev Ram , Kevin McCarthy
IPC分类号： G06K9/00
CPC分类号： G06T7/0008 , G06T7/001 , G06T2207/10016 , G06T2207/10048 , G06T2207/10056 , G06T2207/30148
摘要： A non-destructive evaluation system for evaluating an article such as a test sample, the system comprising: a silicon-based CCD camera for obtaining a series of images of the article; first apparatus for receiving the series of images of the article from the silicon-based CCD camera and using a first imaging modality to generate a first data set spatially correlated to the article; second apparatus for receiving the series of images of the article from the silicon-based CCD camera and using a second imaging modality to generate a second data set spatially correlated to the article; and processing apparatus for processing at least one of the first and second data sets so as to evaluate at least one physical characteristic of the article.
摘要翻译：一种用于评估诸如测试样品的物品的非破坏性评估系统，所述系统包括：用于获得所述物品的一系列图像的硅基CCD照相机; 用于从所述硅基CCD照相机接收所述物品的一系列图像并使用第一成像模式生成与所述物品空间相关的第一数据集的第一装置; 用于从所述硅基CCD照相机接收所述物品的一系列图像并使用第二成像模态生成与所述物品空间相关的第二数据集的第二装置; 以及处理装置，用于处理第一和第二数据集中的至少一个，以评估物品的至少一个物理特性。

7. 发明授权

US07429735B2 High performance CCD-based thermoreflectance imaging using stochastic resonance 失效
标题翻译：使用随机共振的高性能CCD基热反射成像
公开(公告)号：US07429735B2
公开(公告)日：2008-09-30
申请号：US11376722
申请日：2006-03-15
申请人： Dietrich Lueerssen , Rajeev J. Ram , Janice A. Hudgings , Peter M. Mayer
发明人： Dietrich Lueerssen , Rajeev J. Ram , Janice A. Hudgings , Peter M. Mayer
IPC分类号： G01N21/17
CPC分类号： G01J5/0003 , G01K11/125 , G01N21/1717 , G01N21/55 , G01N25/18 , G01N2021/1731
摘要： The invention is directed to systems and methods of digital signal processing and in particular to systems and methods for measurements of thermoreflectance signals, even when they are smaller than the code width of a digital detector used for detection. For example, in some embodiments, the number of measurements done is selected to be sufficiently large so as to obtain an uncertainty less than the code width of the detector. This allows for obtaining images having an enhanced temperature resolution. The invention is also directed to methods for predicting the uncertainty in measurement of the signal based on one or more noise variables associated with the detection process and the number of measurement iterations.
摘要翻译：本发明涉及数字信号处理的系统和方法，特别涉及用于测量热反射信号的系统和方法，即使它们小于用于检测的数字检测器的代码宽度。例如，在一些实施例中，完成的测量数量被选择为足够大，以便获得小于检测器的代码宽度的不确定性。这允许获得具有增强的温度分辨率的图像。本发明还涉及用于基于与检测过程相关联的一个或多个噪声变量和测量迭代次数来预测信号测量的不确定性的方法。

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