会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Method for measuring parameters of quartz crystal unit and a
non-reactive constant resistance element for carrying out the same
    • 用于测量石英晶体单元的参数的方法和用于执行其的无功恒定电阻元件
    • US3992664A
    • 1976-11-16
    • US638914
    • 1975-12-08
    • Issac KogaIsao OkamotoShigeo Kobayashi
    • Issac KogaIsao OkamotoShigeo Kobayashi
    • G01R29/22G01R23/00
    • G01R29/22
    • The present invention discloses a method of constructing a non-reactive high frequency constant resistance unit to be used for measuring parameters of quartz crystal units described in U.S. Pat. No. 3,832,631 and U.S. Pat. No. 3,872,385. First, a non-reactive frequency of a crystal unit A is determined, a radio-frequency current is supplied to the series circuit A+ B composed of said crystal unit A and a circuit B which is adjustable to non-reactiveness, and the circuit B is adjusted so that the phase of the terminal voltage across said series circuit A+B coincides with the phase of the terminal voltage across the circuit B. Next, said crystal unit A is replaced by an element A, whose construction is similar to the said circuit B, and is adjustable to non-reactiveness, and the element A is adjusted so that the phase of the terminal voltage across said series circuit A+B coincides with the phase of the terminal voltage across the circuit B. Lastly, the construction of A is fixed, whereby said element A is always available as a substitute for A, for checking the non-reactiveness of the circuit B.
    • 本发明公开了一种构成非反应性高频恒定电阻单元的方法,该单元用于测量美国专利No. 美国专利3,832,631和美国专利 3,872,385。 首先,确定晶体单元A的非反应频率,将射频电流提供给由所述晶体单元A构成的串联电路A + B和可调整为非反应性的电路B,并且电路B 被调整为使得串联电路A + B两端的端子电压的相位与电路B两端的端子电压的相位一致。接下来,所述晶体单元A被元件A代替,元件A的结构类似于所述 电路B,并且可调整为非反应性,并且调节元件A,使得跨过串联电路A + B的端子电压的相位与电路B两端的端子电压的相位一致。最后, A固定,由此所述元件A始终可用作A的替代物,用于检查电路B的非反应性。