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    • 1. 发明授权
    • Display substrate and method of manufacturing the same
    • 显示基板及其制造方法
    • US08952876B2
    • 2015-02-10
    • US12900846
    • 2010-10-08
    • Hyung-Jun KimSung-Haeng ChoYong-Mo Choi
    • Hyung-Jun KimSung-Haeng ChoYong-Mo Choi
    • G09G3/36G11C19/28G02F1/1362G11C19/18
    • G11C19/28G02F1/1362G02F2202/104G11C19/184
    • A display substrate includes a base substrate, a first insulating layer formed on a base substrate, a pixel including a pixel electrode having the first insulating layer, and a circuit including a circuit transistor disposed on a peripheral area to drive the pixel. The pixel includes a first channel formed on the base substrate having the first insulating layer formed thereon. The first channel includes a poly-silicon layer, a first source electrode and a first drain electrode formed on the first channel that are spaced apart from each other, and a first gate electrode formed on the first source electrode and the first drain electrode corresponding to the first channel which is formed of the transparent conductive material. The poly-silicon layer is formed at a front channel portion of the first channel proximal to the first gate electrode through the first gate electrode.
    • 显示基板包括基底基板,形成在基底基板上的第一绝缘层,包括具有第一绝缘层的像素电极的像素,以及包括设置在外围区域上以驱动像素的电路晶体管的电路。 像素包括形成在其上形成有第一绝缘层的基底基板上的第一通道。 第一通道包括形成在第一通道上彼此间隔开的多晶硅层,第一源电极和第一漏极,以及形成在第一源电极和第一漏电极上的第一栅电极, 由透明导电材料形成的第一通道。 多晶硅层通过第一栅电极形成在靠近第一栅电极的第一通道的前通道部分处。
    • 6. 发明申请
    • SPIN TRANSISTOR USING N-TYPE AND P-TYPE DOUBLE CARRIER SUPPLY LAYER STRUCTURE
    • 使用N型和P型双载波供电层结构的旋转晶体管
    • US20110284937A1
    • 2011-11-24
    • US12858702
    • 2010-08-18
    • Hyung Jun KIMJin Dong SongHyun Cheol KooKyung Ho KimSuk Hee Han
    • Hyung Jun KIMJin Dong SongHyun Cheol KooKyung Ho KimSuk Hee Han
    • H01L29/82
    • H01L29/66984G11C11/161G11C11/1675G11C11/18Y10S257/902
    • A spin transistor that includes: a semiconductor substrate including an upper cladding layer and a lower cladding layer, and a channel layer interposed between the upper and lower cladding layers; a ferromagnetic source and a ferromagnetic drain formed on the semiconductor substrate and spaced from each other in a length direction of the channel layer; and a gate electrode formed on the semiconductor substrate between the source and the drain and having applied a gate voltage thereto to control a spin precession of an electron passing through the channel layer, wherein the semiconductor substrate includes a first carrier supply layer of a first conductivity type disposed below the lower cladding layer and supplying carriers to the channel layer, and a second carrier supply layer of a second conductivity type opposite to the first conductivity type formed on the upper cladding layer and supplying the carriers to the channel layer.
    • 一种自旋晶体管,包括:包括上包层和下包层的半导体衬底,以及介于上包层和下包层之间的沟道层; 形成在所述半导体基板上并且在所述沟道层的长度方向上彼此间隔开的铁磁源和铁磁性漏极; 以及形成在所述源极和漏极之间的所述半导体衬底上并且施加了栅极电压以用于控制通过所述沟道层的电子的自旋进动的栅电极,其中所述半导体衬底包括具有第一导电性的第一载流子供应层 类型,其设置在所述下包层下方并且将沟道层供给到所述沟道层;以及第二导电类型的第二载流子供应层,其形成在所述上包层上并且将所述载流子提供给所述沟道层。
    • 8. 发明申请
    • HEATING FURNACE FOR TESTING MIDDLE AND LONG SPAN STRUCTURES
    • 用于测试中间和长跨度结构的加热炉
    • US20110110393A1
    • 2011-05-12
    • US12941255
    • 2010-11-08
    • HEUNG YOUL KIMBONG JAE LEEHYUNG JUN KIM
    • HEUNG YOUL KIMBONG JAE LEEHYUNG JUN KIM
    • G01N3/18
    • G01N3/60G01M99/002G01N3/08G01N2203/0226G01N2203/0264G01N2203/0282G01N2203/0694
    • Provided is a heating furnace for testing middle and long span structures including a modular partition structure to adjust an inner volume of the heating furnace, effectively performing a load-coupled heating test of full scale members such as a beam, a short column, a slab, a conjunction frame, and a deck plate.The heating furnace for testing middle and long span structures includes a partition unit formed of a refractory material and partitioning a heating space in a main body to block transfer of heat generated from one space to the other space. A test sample is installed in the heating space of the main body partitioned by the partition unit according to a size of the test sample, and then, heat and a compression force are applied to the test sample to perform a fireproof performance test.The fireproof performance test of structure members having various lengths of 4 m, 6 m and 10 m can be performed, and consumption of various utilities consumed during the test can be optimized. In addition, since the heating furnace can perform an actual material test of full scale structures such as continuous span beams and long span beams, deck plates, or bridge trusses of civil structures, deck plates for ships, and so on, target fireproof performance estimation of various shape conditions can be performed to increase applicability of the test.
    • 提供了一种用于测试中长跨距结构的加热炉,包括模块化分隔结构以调节加热炉的内部容积,有效地执行诸如梁,短塔,板坯之类的全尺寸构件的负载耦合加热试验 ,连接框架和甲板板。 用于测试中间和长跨度结构的加热炉包括由耐火材料形成并且分隔主体中的加热空间的分隔单元,以阻挡从一个空间产生的热量传递到另一个空间。 将测试样品安装在根据测试样本的尺寸由分隔单元分隔的主体的加热空间中,然后对测试样品施加热和压缩力以进行耐火性能测试。 可以进行各种长度为4m,6m和10μm的结构件的耐火性能测试,并且可以优化在测试期间消耗的各种实用程序的消耗。 另外,由于加热炉可以进行全尺寸结构的实际材料试验,例如连续跨梁和长跨梁,甲板或者民用结构的桥梁桁架,船舶甲板等,目标防火性能估计 可以执行各种形状条件以增加测试的适用性。
    • 10. 发明授权
    • Apparatus and method for automatic conversion to digital zoom mode
    • 用于自动转换为数码变焦模式的装置和方法
    • US07817195B2
    • 2010-10-19
    • US11375266
    • 2006-03-13
    • Hyung-Jun Kim
    • Hyung-Jun Kim
    • H04N5/262H04N5/225
    • H04N5/232
    • An apparatus and method of automatic conversion to a digital zoom mode allow a digital zoom to be executed by automatically converting from a high-resolution mode that does not support a digital zoom to a highest resolution mode supporting the digital zoom when a digital zoom key is pushed. The apparatus includes a key pad having a digital zoom key, a video processing unit for processing video data from the camera unit to determine a resolution and execute a digital zoom function, and a control unit for controlling the video processing unit to convert a resolution mode that does not support the digital zoom function to a highest resolution mode among resolution modes supporting the digital zoom function and execute the digital zoom function when the digital zoom key is pressed in the resolution mode that does not support the digital zoom function.
    • 自动转换为数字变焦模式的装置和方法允许通过在不支持数字变焦的高分辨率模式下自动转换数字变焦到支持数字变焦的最高分辨率模式,当数字变焦键为 推。 该装置包括具有数字变焦键的键盘,用于处理来自相机单元的视频数据以确定分辨率并执行数字变焦功能的视频处理单元,以及控制单元,用于控制视频处理单元转换分辨率模式 在支持数字变焦功能的分辨率模式中,数字变焦功能不支持数字变焦功能,并且在不支持数码变焦功能的分辨率模式下按数字变焦键时,执行数码变焦功能。