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    • 4. 发明申请
    • LIQUID CRYSTAL DISPLAY
    • 液晶显示器
    • US20120033148A1
    • 2012-02-09
    • US13198810
    • 2011-08-05
    • Byung-Duk YANGYoung-Hoon YOODong-Yoon KIMHyang-Shik KONGJang-Soo KIM
    • Byung-Duk YANGYoung-Hoon YOODong-Yoon KIMHyang-Shik KONGJang-Soo KIM
    • G02F1/1343
    • G02F1/13624G02F1/133707G02F1/134309G02F1/136213G02F2001/133742G02F2001/134354G09G3/3659
    • A liquid crystal display includes first and second gate lines, a data line crossing the first and second gate lines, a pixel electrode including first and second sub-pixel electrodes electrically disconnected from each other, a first thin film transistor connected to the first gate line, the data line, and the first sub-pixel electrode, a second thin film transistor connected to the first gate line, the data line, and the second sub-pixel electrode, and a third thin film transistor connected to the second gate line, the second sub-pixel electrode, and a charge sharing capacitor including a first and second electrode. A data voltage applied to the second sub-pixel electrode and to a first electrode swings between a negative voltage and a positive voltage with respect to a common voltage, and a voltage smaller than an average value of the negative voltage and the positive voltage is applied to a second electrode.
    • 液晶显示器包括第一和第二栅极线,与第一和第二栅极线交叉的数据线,包括彼此电断开的第一和第二子像素电极的像素电极,连接到第一栅极线的第一薄膜晶体管 数据线和第一子像素电极,连接到第一栅极线,数据线和第二子像素电极的第二薄膜晶体管和连接到第二栅极线的第三薄膜晶体管, 第二子像素电极以及包括第一和第二电极的电荷共享电容器。 施加到第二子像素电极和第一电极的数据电压相对于公共电压在负电压和正电压之间摆动,并且施加小于负电压和正电压的平均值的电压 到第二电极。
    • 10. 发明申请
    • THIN FILM TRANSISTOR ARRAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME AND SYSTEM FOR INSPECTING THE SUBSTRATE
    • 薄膜晶体管阵列基板,其制造方法和用于检测基板的系统
    • US20100044707A1
    • 2010-02-25
    • US12574915
    • 2009-10-07
    • Hyang-Shik KONGSung-Wook HuhYoung-Bae Park
    • Hyang-Shik KONGSung-Wook HuhYoung-Bae Park
    • H01L29/786
    • G02F1/1362G02F1/13458G02F2001/136254H01L21/32134H01L21/32136H01L27/124H01L27/1255H01L27/1288
    • Disclosed is a thin film transistor substrate and a system for inspecting the same. The thin film transistor substrate comprises gate wiring formed on an insulation substrate and including gate lines, and gate electrodes and gate pads connected to the gate lines; a gate insulation layer covering the gate wiring; a semiconductor layer formed over the gate insulation layer; data wiring formed over the gate insulation layer and including data pads; a protection layer covering the data wiring; auxiliary pads connected to the data pads through contact holes formed in the protection layer; and a pad auxiliary layer formed protruding a predetermined height under the data pads. The inspection system for determining whether a thin film transistor substrate is defective, in which the thin film transistor substrate comprises gate wiring including gate lines, gate electrodes and gate pads, and data wiring including source electrodes and drain electrodes, includes a probe pin for contacting the gate pads or data pads and transmitting a corresponding signal, wherein a contact tip at a distal end of the probe pin for contacting the gate pads or the data pads is rounded, and a radius of the rounded contact tip is 2 μm or less, or the rounded contact tip is coated with gold (Au).
    • 公开了一种薄膜晶体管基板及其检查系统。 薄膜晶体管基板包括形成在绝缘基板上并包括栅极线的栅极布线,以及连接到栅极线的栅电极和栅极焊盘; 覆盖栅极布线的栅极绝缘层; 形成在所述栅绝缘层上的半导体层; 数据布线形成在栅极绝缘层上并包括数据焊盘; 覆盖数据线的保护层; 辅助焊盘通过形成在保护层中的接触孔连接到数据焊盘; 以及在数据焊盘下方突出预定高度形成的焊盘辅助层。 用于确定薄膜晶体管基板是否缺陷的检查系统,其中薄膜晶体管基板包括包括栅极线,栅电极和栅极焊盘的栅极布线,以及包括源电极和漏电极的数据布线,包括用于接触的探针 所述栅极焊盘或数据焊盘并传输相应的信号,其中用于接触所述栅极焊盘或所述数据焊盘的所述探针的远端处的接触尖端是圆形的,并且所述圆形接触尖端的半径为2μm或更小, 或圆形接触尖端涂有金(Au)。