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    • 2. 发明授权
    • Integrated semiconductor product with metal-insulator-metal capacitor
    • 集成半导体产品与金属 - 绝缘体 - 金属电容器
    • US07233053B2
    • 2007-06-19
    • US10865463
    • 2004-06-10
    • Klaus KollerHeinrich KörnerMichael Schrenk
    • Klaus KollerHeinrich KörnerMichael Schrenk
    • H01L29/00H01L21/00
    • H01L28/75H01L21/76838H01L28/55
    • To fabricate an integrated semiconductor product with integrated metal-insulator-metal capacitor, first of all a dielectric auxiliary layer (6) is deposited on a first electrode (2, 3, 5). This auxiliary layer (6) is then opened up (15) via the first electrode. Then, a dielectric layer (7) is produced, and the metal track stack (8, 9, 10) for the second electrode is then applied to the dielectric layer (6). This is followed by the patterning of the metal-insulator-metal capacitor using known etching processes. This makes it possible to produce dielectric capacitor layers of any desired thickness using materials which can be selected as desired. In particular, this has the advantage that via etches can be carried out significantly more easily than in the prior art, since it is not necessary to etch through the residual dielectric capacitor layer above the metal tracks.
    • 为了制造具有集成金属 - 绝缘体 - 金属电容器的集成半导体产品,首先将介电辅助层(6)沉积在第一电极(2,3,5)上。 然后,该辅助层(6)经由第一电极打开(15)。 然后,制造电介质层(7),然后将用于第二电极的金属轨道堆叠(8,9,10)施加到电介质层(6)。 然后使用已知的蚀刻工艺对金属 - 绝缘体 - 金属电容器进行图案化。 这使得可以使用可以根据需要选择的材料来制造任何所需厚度的介电电容器层。 特别地,这具有以下优点:通过蚀刻可以比现有技术更容易地进行蚀刻,因为不需要通过金属轨道上方的残余介电电容器层进行蚀刻。
    • 5. 发明授权
    • Integrated semiconductor product comprising a metal-insulator-metal capacitor
    • 包括金属 - 绝缘体 - 金属电容器的集成半导体产品
    • US06958509B2
    • 2005-10-25
    • US10865000
    • 2004-06-10
    • Heinrich KörnerMichael SchrenkMarkus Schwerd
    • Heinrich KörnerMichael SchrenkMarkus Schwerd
    • H01L21/02H01L21/768H01L27/108
    • H01L28/55H01L23/5223H01L28/75H01L2924/0002H01L2924/00
    • To fabricate an integrated semiconductor product with integrated metal-insulator-metal capacitor, first of all a dielectric protective layer (5) and a dielectric auxiliary layer (16) are deposited on a first electrode (2). The protective layer and the auxiliary layer (16) are then opened up (17) via the first electrode. Then, a dielectric layer (6) is produced, and the metal track stack (7, 8, 9) for the second electrode is then applied to the dielectric layer (6). This is followed by the patterning of the metal-insulator-metal capacitor using known etching processes. This makes it possible to produce dielectric capacitor layers of any desired thickness using materials which can be selected as desired. In particular, this has the advantage that via etches can be carried out significantly more easily than in the prior art, since it is not necessary to etch through the residual dielectric capacitor layer above the metal tracks.
    • 为了制造具有集成金属 - 绝缘体 - 金属电容器的集成半导体产品,首先在第一电极(2)上沉积介电保护层(5)和介电辅助层(16)。 然后通过第一电极将保护层和辅助层(16)打开(17)。 然后,制造电介质层(6),然后将用于第二电极的金属轨道堆叠(7,8,9)施加到电介质层(6)。 然后使用已知的蚀刻工艺对金属 - 绝缘体 - 金属电容器进行图案化。 这使得可以使用可以根据需要选择的材料来制造任何所需厚度的介电电容器层。 特别地,这具有以下优点:通过蚀刻可以比现有技术更容易地进行蚀刻,因为不需要通过金属轨道上方的残留介电电容器层进行蚀刻。