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1. 发明授权

US4118719A Microscope attachment camera 失效
标题翻译：显微镜附件相机
公开(公告)号：US4118719A
公开(公告)日：1978-10-03
申请号：US792852
申请日：1977-05-02
申请人： Herbert Leiter , Gunter Reinheimer
发明人： Herbert Leiter , Gunter Reinheimer
IPC分类号： G03B7/099 , G02B21/00 , G02B21/36 , G03B7/00 , G03B17/48
CPC分类号： G02B21/361
摘要： Microscope-attachment camera with a system for measuring the brightness of an object detail and with markings for indicating at least the detail metering-field and the image-field of the camera in the observation beam. The metering field-marking (14) and the image field-marking (22) are positioned on two separate plates, the metering field-marking plate being designed as a metering field-stop (14), and the two markings which differ in shape and size (14,22) are simultaneously reflected into the observation beam.
摘要翻译：具有用于测量物体细节的亮度的系统的显微镜附件相机以及用于在观察光束中至少指示相机的细节计量场和图像场的标记。测量场标记（14）和图像场标记（22）位于两个分开的板上，计量场标记板被设计为计量场停止（14），并且形状不同的两个标记和尺寸（14,22）同时被反射到观察光束中。

2. 发明授权

US4595829A Apparatus for automatically focusing objects to be viewed in optical instruments 失效
标题翻译：用于自动对焦在光学仪器中观察的物体的装置
公开(公告)号：US4595829A
公开(公告)日：1986-06-17
申请号：US496587
申请日：1983-05-20
申请人： Burkhard Neumann , Gunter Reinheimer
发明人： Burkhard Neumann , Gunter Reinheimer
IPC分类号： G02B7/28 , G02B7/32 , G02B7/34 , G02B21/00 , G02B21/24 , G01J1/20
CPC分类号： G02B7/32 , G02B21/247
摘要： An automatic focusing apparatus for optical instruments, in particular for reflected light microscopes, wherein a measuring point is produced on the surface of an object by an eccentric measuring beam formed by blocking a portion of the path of a full beam. The measuring point is imaged onto a photoelectric device by reflecting the measuring beam along the blocked out path. When the object plane wanders from the focal plane, the photoelectric device actuates a control device which returns the object plane to the focal plane. The apparatus comprises a source of light to produce a, preferably pulsed, laser light for the full measuring beam, an optical structural element for geometrically blocking one-half of the full measuring beam to produce the eccentric measuring beam and simultaneously for geometrically blocking the reflected measuring beam from the path of the full measuring beam. A lens is positioned in the measuring beam and a photodetector device in the form of a differential photodiode pair is positioned to receive the reflected measuring beam. A divider mirror, preferably dichromatic, is provided for introducing the measuring beam into the path of the illuminating beam of the optical device and for reflecting the reflected measuring beam from the path of the illuminating beam of the optical instrument.
摘要翻译：一种用于光学仪器的自动对焦装置，特别是用于反射光学显微镜的自动对焦装置，其中通过通过阻挡全光束的路径的一部分形成的偏心测量光束在物体的表面上产生测量点。测量点通过沿着阻挡输出路径反射测量光束而成像到光电装置上。当物平面从焦平面移动时，光电装置致动将物平面返回焦平面的控制装置。该装置包括用于产生用于全测量光束的优选脉冲激光的光源，用于几何地阻挡整个测量光束的一半以产生偏心测量光束并同时用于几何阻挡反射的光学结构元件从整个测量光束的路径测量光束。透镜位于测量光束中，并且以差分光电二极管对形式的光电检测器装置被定位成接收反射的测量光束。提供分光镜，优选为二色，用于将测量光束引入到光学装置的照明光束的路径中，并用于从光学仪器的照明光束的路径反射反射的测量光束。

3. 发明授权

US4174159A Exposure meter for photomicrography 失效
标题翻译：曝光仪用于显微照相
公开(公告)号：US4174159A
公开(公告)日：1979-11-13
申请号：US895477
申请日：1978-04-11
申请人： Winfried Kraft , Gunter Reinheimer , Herbert Leiter
发明人： Winfried Kraft , Gunter Reinheimer , Herbert Leiter
IPC分类号： G03B7/099 , G02B21/00 , G02B21/36 , G03B7/08 , G03B17/48
CPC分类号： G02B21/361 , G02B21/0096
摘要： Photomicrographic exposure meter for cameras attached to microscopes in which part of the picture-taking beam is reflected by means of a beam-splitter and where the reflected beam part projects an image of the object onto an image plane, measuring field stop is located in the image plane with an aperture for detail or spot measurements and an insertable photo-electric detector cooperates therewith downstream of the stop in the direction of light.The beam part is reflected by at least one specular means (12,61) to the measuring field stop (13). The stop is gimbal-suspended and means are provided both for displacing the gimbal-suspended specular means (12,61) and for viewing the object detail appearing in the stop aperture.
摘要翻译：显微镜照相机的显微照相曝光仪，其中摄影光束的一部分通过分束器反射，并且其中反射光束部分将物体的图像投影到图像平面上，测量场停止位于具有用于细节或点测量的孔的图像平面，并且可插入的光电检测器在光的方向上与停止的下游配合。光束部分被至少一个镜面装置（12,61）反射到测量场停止（13）。挡块是万向悬挂的，并且设置有用于移动万向架悬挂的镜面装置（12,61）并且用于观察出现在停止孔中的物体细节的装置。

4. 发明授权

US4302087A Microscope attachment camera 失效
标题翻译：显微镜附件相机
公开(公告)号：US4302087A
公开(公告)日：1981-11-24
申请号：US159161
申请日：1980-06-13
申请人： Gunter Reinheimer , Herbert Leiter
发明人： Gunter Reinheimer , Herbert Leiter
IPC分类号： G02B21/36 , G02B21/18 , G03B17/48
CPC分类号： G02B21/0096 , G02B21/18
摘要： An attachment camera for microscopes, comprising an apparatus for measuring the brightness of an object detail and markings for sighting at least the detail metering field and the image field of the camera in the observation beam. The metering field markings and the image field markings are located on two separate plates, the plate with the metering field marking is defined by a measuring field stop. The two markings differ in size and shape and are simultaneously reflected into the observation beam by means of a photographic ocular located in the picture taking beam and by means of optical components with partly or fully reflecting surfaces located before or after the photographic ocular.A holder (5a) seating in exchangeable manner the photographic ocular (5) is provided between the housing (24) of the attachment-camera and the binocular tube (25).
摘要翻译：一种用于显微镜的附件相机，包括用于测量物体细节的亮度的装置和用于至少观察观察光束中的照相机的细节计量场和图像场的标记的装置。计量现场标记和图像场标记位于两个独立的板上，具有计量场标记的板由测量场停止定义。两个标记的尺寸和形状不同，并且通过位于拍摄光束中的摄影目镜以及位于摄影目的之前或之后的具有部分或全部反射表面的光学部件同时反射到观察光束中。在照相机的壳体（24）和双目管（25）之间设置有可更换的照相机（5）的保持器（5a）。

5. 发明授权

US4329014A Incident light illumination instrument for selective light and dark field illumination 失效
标题翻译：入射光照明仪器，用于选择性的光和暗场照明
公开(公告)号：US4329014A
公开(公告)日：1982-05-11
申请号：US159192
申请日：1980-06-13
申请人： Gunter Reinheimer , Norbert Gaul
发明人： Gunter Reinheimer , Norbert Gaul
IPC分类号： G02B21/06 , G02B21/08 , G02B21/10 , B02B7/00
CPC分类号： G02B21/082
摘要： An incident light illumination apparatus for generating light and dark field illumination along an optical axis. The illumination apparatus is coupled to a stage arm of a microscope and a microscope tube is coupled to the illumination apparatus.An illumination stub (7) is located in the illumination apparatus along the optical axis between a light source (8) and an optical deflecting element (11). An aperture (13) passes through the stub from side-to-side for the interchangeable insertion of an insertion module (14,15). This insertion module contains at least two functional groups (I,II; III,II) which can be sequentially placed into the optical axis (9) and the functional groups consist of light attenuating (25) and/or light bounding (19,20,23,24,27) optical components, and additional means (28,29) for pivoting a center stop (30) into the optical axis (9).
摘要翻译：一种用于沿光轴产生光和暗场照明的入射光照明装置。照明装置耦合到显微镜的舞台臂，显微管耦合到照明装置。照明短截线（7）沿着光源（8）和光学偏转元件（11）之间的光轴位于照明设备中。孔（13）从一侧到另一侧穿过短截线，以便插入模块（14,15）的可互换插入。该插入模块包含至少两个可以顺序地放置在光轴（9）中的官能团（I，II; III，II），功能团由光衰减（25）和/或光界（19,20 ，23,24,27）光学部件，以及用于将中心止动件（30）枢转到光轴（9）中的附加装置（28,29）。

6. 发明授权

US4127318A Direct illumination apparatus for light and dark field illumination 失效
标题翻译：用于浅色和暗场照明的直接照明装置
公开(公告)号：US4127318A
公开(公告)日：1978-11-28
申请号：US724854
申请日：1976-09-20
申请人： Hans Determann , Gunter Reinheimer , Hans W. Stankewitz
发明人： Hans Determann , Gunter Reinheimer , Hans W. Stankewitz
IPC分类号： G02B21/06 , G02B21/08 , G02B21/10 , G02B21/12 , G02B21/14
CPC分类号： G02B21/082 , G02B21/084
摘要： Direct illumination apparatus for microscopes for generating illumination of light fields, phase contrasts, interference contrast and dark fields. A deflecting mirror is located in the observation beam, which is partly specular at its center region and fully specular in an annular zone, and an annular condensor is associated with the illumination system. The apparatus is provided with an adjustable stop or diaphragm for the purpose of suppressing the light field beam and with optical components for illuminating an objective pupil for the light field and the annular condensor with collimated light for the dark field. An aperture stop is located in the path of the light field beam nearly or approximately limiting the illumination of the object field in the path of the dark field beam. An annular lens (17) is mounted centrally to the optical axis (15) in the at least approximately collimated dark field beam, this annular lens imaging the diaphragm or aperture stop plane (7) in a plane (18) located near the threaded portion (3') of microscope objective (3).
摘要翻译：用于产生光场照明，相位对比度，干涉对比度和暗场的显微镜的直接照明装置。偏转镜位于观察光束中，其在其中心区域部分镜面并在环形区域中完全镜面，并且环形冷凝器与照明系统相关联。为了抑制光场光束和用于照明光场的目标光瞳的光学部件和具有用于暗场的准直光的环形冷凝器，该装置设置有可调节的停止或光阑。孔径光阑位于光场光束的路径中，几乎或近似地限制了暗场光束的路径中物场的照明。环形透镜（17）在至少近似准直的暗场光束中心地安装在光轴（15）的中心，该环形透镜在位于螺纹部分附近的平面（18）中成像光阑或孔径光阑平面（7）（3'）。

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