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    • 1. 发明授权
    • System and method for processor dual voltage detection and over stress protection
    • 用于处理器双电压检测和过压保护的系统和方法
    • US06327663B2
    • 2001-12-04
    • US09176737
    • 1998-10-21
    • Gerald G. IsaacDervinn D. CaldwellLance L. SmithJoseph A. Brcich
    • Gerald G. IsaacDervinn D. CaldwellLance L. SmithJoseph A. Brcich
    • G06F1310
    • G06F1/26
    • Method and system for preventing electronic overstress during powering up a processor with voltage detection capabilities employing a mechanism for detecting the voltage requirements of the processor to be coupled into a motherboard and accordingly adjusts the power supply of the motherboard to the processor voltage requirements. The detection mechanism includes sensing of logic signals by sensing a voltage from one or more pins of the processor. Those pins are internally connected to ground or internally not connected thus facilitating sensing of logic signals prior to powering up the processor. The probed signals are used to control the power supplied to the processor by adjustment mechanisms applied to power regulator or programmable logic devices. Since the detection of the proper operating voltage requirements of the processor and the consequent adjustment of the voltage power to be supplied to the processor occur during the powering up of the processor, electrical over stress and potential damage of the processor are eliminated.
    • 用于在使用电压检测能力的处理器加电处理器期间防止电子过载的方法和系统,该机构用于检测要耦合到母板中的处理器的电压要求,并因此将主板的电源调整为处理器电压要求。 检测机构包括通过感测来自处理器的一个或多个引脚的电压来检测逻辑信号。 这些引脚内部连接到地或内部不连接,从而便于在处理器上电之前检测逻辑信号。 探测信号用于通过应用于功率调节器或可编程逻辑器件的调节机制来控制提供给处理器的功率。 由于在处理器的加电期间检测到处理器的正确的工作电压要求以及随之而来的调整供应给处理器的电压功率,所以消除了处理器的电过压和潜在的损坏。