会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Ring illumination reflective elements on a generally planar surface
    • 环形照明反射元件在一般平面上
    • US5828449A
    • 1998-10-27
    • US898844
    • 1997-07-25
    • Steven Joseph KingJonathan Edmund LudlowGeorge Schurr
    • Steven Joseph KingJonathan Edmund LudlowGeorge Schurr
    • G01B11/24G01B11/03G01N21/84G01N21/88G01N21/956H05K13/08G01N21/00G06K9/00H04N7/18H04N9/47
    • G01N21/95684G01N21/8806H05K13/08
    • An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more edges of each reflected image element representing an illuminated reflective element. The edges of the reflected image elements are located by determining the maximum intensity gradient in the pixels forming the reflected image element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.
    • 检查系统和方法使用环形照明装置来照射一个或多个反射元件,例如电子部件上的焊球或其它突出的表面或物体。 环形照明装置包括基本上环形的光源,其在一个或多个反射元件上提供基本均匀的照明。 照明检测装置检测用于形成反射图像的照射反射元件反射的光束。 处理反射图像的方法包括定位表示照明反射元件的每个反射图像元素的一个或多个边缘。 通过确定形成反射图像元素的像素中的最大强度梯度来定位反射图像元素的边缘。 检查系统和方法由此确定各种特征,例如每个反射元件的不存在,存在,位置,间距,尺寸和形状。
    • 5. 发明申请
    • TITANIUM DIOXIDE FINISHING PROCESS
    • 二氧化钛精加工工艺
    • US20070095253A1
    • 2007-05-03
    • US11263702
    • 2005-11-01
    • Russell DiemerAlan EatonNarayanan SubramanianStephen TaylorGEORGE SCHURRDAVID ZIMMERMAN
    • Russell DiemerAlan EatonNarayanan SubramanianStephen TaylorGEORGE SCHURRDAVID ZIMMERMAN
    • C09C1/36C01G23/047
    • C01G23/07B82Y30/00C01G23/075C01G23/08C01P2004/62C01P2004/64C01P2006/80C09C1/3607
    • This disclosure relates to process for producing titanium dioxide (TiO2) pigments, comprising the following steps: a) oxidizing a mixture of titanium tetrahalide and a rutile forming agent, such as aluminum halide, present in the vapor phase and in the presence of a nucleant to form a gaseous suspension comprising titanium dioxide particles; b) passing the gaseous suspension to a cooling conduit; c) introducing scouring material into the cooling conduit; wherein the particles of the scouring material have a diameter in the range of about 0.25 mm to about 12.7 mm; d) separating the vapor phase to form a powder comprising the titanium dioxide particles and the scouring material; and e) simultaneously subjecting the powder to substantially uniform heating at a temperature of about 300° C. to about 600° C. and reducing the size of the titanium dioxide particles and the particles of the scouring material in the powder to a mean particle size of about 50 nm to about 1000 nm, whereby the titanium dioxide pigment has a chloride content of less than about 500 ppm. The so treated powder may have a residual free chlorine content of less than about 1 ppm.
    • 本公开涉及生产二氧化钛(TiO 2)颜料的方法,包括以下步骤:a)氧化四卤化钛和存在于蒸气中的金红石形成剂如卤化铝的混合物 并在成核剂存在下形成包含二氧化钛颗粒的气态悬浮液; b)将气态悬浮液通过冷却管道; c)将精练材料引入冷却管道; 其中所述精练材料的颗粒的直径在约0.25mm至约12.7mm的范围内; d)分离气相以形成包含二氧化钛颗粒和洗涤材料的粉末; 和e)在约300℃至约600℃的温度下同时对粉末进行基本上均匀的加热,并将粉末中二氧化钛颗粒和擦洗材料的颗粒的尺寸减小到平均粒度 为约50nm至约1000nm,由此二氧化钛颜料的氯化物含量小于约500ppm。 如此处理的粉末可具有小于约1ppm的残余游离氯含量。
    • 7. 发明授权
    • Inspection method
    • 检验方法
    • US5926557A
    • 1999-07-20
    • US824173
    • 1997-03-26
    • Steven Joseph KingJohathan Edmund LudlowGeorge Schurr
    • Steven Joseph KingJohathan Edmund LudlowGeorge Schurr
    • G01B11/03G01N21/88G01N21/956G06T1/00H05K13/08G06K9/00
    • H05K13/08G01N21/8806G01N21/95684
    • An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element representing an illuminated reflective element. The points on the reflected image elements are used to located the pattern of the reflected image elements and/or to fit an outline around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.
    • 检查系统和方法使用环形照明装置来照射一个或多个反射元件,例如电子部件上的焊球或其它突出的表面或物体。 环形照明装置包括基本上环形的光源,其在一个或多个反射元件上提供基本均匀的照明。 照明检测装置检测用于形成反射图像的照射反射元件反射的光束。 处理反射图像的方法包括在表示照明反射元件的每个反射图像元件上定位一个或多个点。 反射图像元件上的点用于定位反射图像元素的图案和/或将每个图像元素周围的轮廓与每个焊球或其它反射元件的真实尺寸的已知百分比相对应。 检查系统和方法由此确定各种特征,例如每个反射元件的不存在,存在,位置,间距,尺寸和形状。