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1. 发明授权

US6154712A Test procedure and test station for carrying out the test procedure 失效
标题翻译：试验程序和试验台进行试验程序
公开(公告)号：US6154712A
公开(公告)日：2000-11-28
申请号：US237167
申请日：1999-01-25
申请人： Johann Breu , Ludwig Pirkl , Thomas Wagner , Peter Wojtalla , Franz Stegerer , Otto Voggenreiter , Leon Masseus , Mee-Moi Yap , Walter Juri
发明人： Johann Breu , Ludwig Pirkl , Thomas Wagner , Peter Wojtalla , Franz Stegerer , Otto Voggenreiter , Leon Masseus , Mee-Moi Yap , Walter Juri
IPC分类号： G01R31/00 , G01R31/01 , G01R31/26 , G01R31/316 , G01R35/00 , H01L21/66 , G01R36/00 , G08B29/00
CPC分类号： G01R31/2601 , G01R31/01 , G01R31/316
摘要： A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.
摘要翻译：用于测试产品的测试程序或测试台，特别是在装配线型生产过程中完成的产品，执行以下步骤：首先，使用第一输入信号测试具有第一测试装置的产品的参数以产生第一测试结果。其次，使用独立于第一输入信号的第二输入信号用第二测试装置测试产品的相同参数，以产生第二测试结果。第三，从测试设备获得的测试结果中得出差分值。第四，根据差分值确定测试台的一致性，并且当微分值偏离预定范围时输出错误消息。第五，重复上述步骤至少一个其他参数。

2. 发明授权

US07221180B2 Device and method for testing electronic components 有权
标题翻译：电子元件测试装置和方法
公开(公告)号：US07221180B2
公开(公告)日：2007-05-22
申请号：US11316342
申请日：2005-12-23
申请人： Hardy Dallabetta , Walter Diez , Franz Stegerer
发明人： Hardy Dallabetta , Walter Diez , Franz Stegerer
IPC分类号： G01R31/28 , B07C5/344
CPC分类号： G01R31/01
摘要： A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.
摘要翻译：测试装置包括第一和第二测试器，每个具有至少一个用于与电子部件的至少一个外部触点接触的测试触点; 以及传送装置，其以同步的方式将电子部件传送到第一和第二测试器，使得电子部件的外部触点形成与测试触点的电连接。通过测试触点，可以向电子部件施加输入电压和输入电流，并且可以测量电子部件中的电压，电流和电阻。测试人员根据预定的整套测试标准或基于整套测试标准的子集来检查电子元件。

3. 发明申请

US20060132156A1 Device and method for testing electronic components 有权
标题翻译：电子元件测试装置和方法
公开(公告)号：US20060132156A1
公开(公告)日：2006-06-22
申请号：US11316342
申请日：2005-12-23
申请人： Hardy Dallabetta , Walter Diez , Franz Stegerer
发明人： Hardy Dallabetta , Walter Diez , Franz Stegerer
IPC分类号： G01R31/02
CPC分类号： G01R31/01
摘要： A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.
摘要翻译：测试装置包括第一和第二测试器，每个具有至少一个用于与电子部件的至少一个外部触点接触的测试触点; 以及传送装置，其以同步的方式将电子部件传送到第一和第二测试器，使得电子部件的外部触点形成与测试触点的电连接。通过测试触点，可以向电子部件施加输入电压和输入电流，并且可以测量电子部件中的电压，电流和电阻。测试人员根据预定的整套测试标准或基于整套测试标准的子集来检查电子元件。

4. 发明授权

US09153369B2 Bias field generator including a body having two body parts and holding a packaged magnetic sensor 有权
标题翻译：偏置场发生器包括具有两个主体部分并保持封装的磁性传感器的本体
公开(公告)号：US09153369B2
公开(公告)日：2015-10-06
申请号：US13453199
申请日：2012-04-23
申请人： Franz Stegerer , Klaus Elian , Michael Weber
发明人： Franz Stegerer , Klaus Elian , Michael Weber
IPC分类号： G01B7/30 , H01F7/02 , G01R33/09 , G01R33/00
CPC分类号： H01F7/0294 , G01R33/0011 , G01R33/0017 , G01R33/09 , Y10T29/4902
摘要： A device is disclosed. In one embodiment the device comprises a bias field generator configured to provide a magnetic bias field for a magnetic sensor, the bias field generator including a body comprising magnetic or magnetizable material, a packaged magnetic sensor accommodating the magnetic sensor and a recess disposed in the body, wherein the packaged magnetic sensor is arranged in the recess, and wherein the body includes two separate body parts, each body part include a part of the recess, and each body part is configured to hold in place the packaged magnetic sensor.
摘要翻译：公开了一种设备。在一个实施例中，该装置包括被配置为为磁传感器提供磁偏置场的偏置场发生器，偏置场发生器包括包括磁性或可磁化材料的主体，容纳磁传感器的封装磁传感器和设置在本体中的凹部，其中所述封装的磁性传感器布置在所述凹部中，并且其中所述主体包括两个单独的主体部分，每个主体部分包括所述凹部的一部分，并且每个主体部分被配置成将所述封装的磁性传感器保持在适当位置。

5. 发明申请

US20130278246A1 Bias Field Generator and Method 有权
标题翻译：偏置场发生器和方法
公开(公告)号：US20130278246A1
公开(公告)日：2013-10-24
申请号：US13453199
申请日：2012-04-23
申请人： Franz Stegerer , Klaus Elian , Michael Weber
发明人： Franz Stegerer , Klaus Elian , Michael Weber
IPC分类号： G01R33/025 , H01F7/06
CPC分类号： H01F7/0294 , G01R33/0011 , G01R33/0017 , G01R33/09 , Y10T29/4902
摘要： A bias field generator can provide a magnetic bias field for a magnetic sensor. The bias field generator includes a body with magnetic or magnetizable material. A recess is formed in the body. The recess is adapted to a package of the magnetic sensor.
摘要翻译：偏置场发生器可为磁传感器提供磁偏置场。偏置场发生器包括具有磁性或可磁化材料的主体。在体内形成凹部。该凹部适于磁性传感器的封装。

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