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1. 发明授权

US06376792B1 Method and apparatus for individual destruction of syringe needles by melting under the effect of electric current 失效
标题翻译：在电流作用下通过熔化而单独破坏注射针的方法和装置
公开(公告)号：US06376792B1
公开(公告)日：2002-04-23
申请号：US09530784
申请日：2000-05-05
申请人： Jean Cebollero , Fabrice Bounaix , Bruno Golliard , Jacques Marcandelli
发明人： Jean Cebollero , Fabrice Bounaix , Bruno Golliard , Jacques Marcandelli
IPC分类号： A61M0532
CPC分类号： A61M5/3278 , A61M2005/3107 , A61M2005/3283
摘要： A process and an apparatus for the individual destruction of syringe needles by melting under the effect of a high-intensity electric current. The apparatus includes a lower electrode adapted to accommodate the free end of a needle and to form therewith an electrical contact, connected electrically to a first terminal of an electric power source, a first upper electrode connected electrically to a second terminal of the electric power source. The apparatus also includes a second upper electrode adapted to be placed in electrical contact with the surface of the needle at least substantially radially opposite the first upper electrode. The second upper electrode is connected electrically to the first terminal.
摘要翻译：一种用于通过在高强度电流的作用下熔化来单独破坏注射针的方法和装置。该装置包括适于容纳针的自由端的下电极，并与其形成电触点，该电触点与电源的第一端电电连接;第一上电极，电连接到电源的第二端。该装置还包括第二上电极，其适于与第一上电极至少基本上径向相对地与针的表面电接触。第二上电极与第一端子电连接。

2. 发明申请

US20060119851A1 Method and device for detecting gases by absorption spectroscopy 有权
标题翻译：通过吸收光谱法检测气体的方法和装置
公开(公告)号：US20060119851A1
公开(公告)日：2006-06-08
申请号：US10525850
申请日：2002-09-06
申请人： Fabrice Bounaix
发明人： Fabrice Bounaix
IPC分类号： G01N21/61
CPC分类号： G01N21/61 , G01N21/031 , G01N2201/0668
摘要： A method and device for measuring a concentration of a preselected gas in a gas sample are disclosed. The device comprises a Herriott type multipass cell (10) having a center axle (74) and a housing (80A, 80B) surrounding and spaced from the axle to provide a tubular sample cavity (84). The gas sample is pumped through the sample cavity via apertures (154, 156) provided in opposed ends of the axle. A first mirror (44) and a second mirror (46) are supported at opposed ends of the axle. A light source, e.g. a laser or LED, is provided for emitting a light beam into the sample cavity via an entry aperture (30) in the first mirror, the light beam having a wave length at which the preselected gas strongly absorbs. The beam is reflected between the mirrors for a number of times before exiting the cell via an exit aperture (48) in the second mirror and impinging on a detector (52). The device further comprises a reference detector (32) for monitoring the intensity of the unattenuated light beam and a detector for detecting the intensity of light transmitted through the second mirror after a single pass through the cell. The light source is operatively connected to a heat control assembly having a heat sink and the gas sample is passed said heat sink to augment temperature control of the light source.
摘要翻译：公开了一种用于测量气体样品中预选气体浓度的方法和装置。该装置包括具有中心轴（74）的赫里奥多型多通道电池（10）和围绕轴并与轴间隔开的壳体（80A，80B），以提供管状样品腔（84）。气体样品通过设置在轴的相对端的孔（154,156）泵送通过样品腔。第一反射镜（44）和第二反射镜（46）被支撑在轴的相对端。光源，例如提供激光器或LED，用于经由第一反射镜中的入口孔（30）将光束发射到样品腔中，所述光束具有预定气体强吸收的波长。光束在反射镜之间反射多次，然后经由第二反射镜中的出射孔（48）离开单元并撞击检测器（52）。该装置还包括用于监测未衰减的光束的强度的参考检测器（32）和用于在单次通过电池之后检测透过第二反射镜的光的强度的检测器。光源可操作地连接到具有散热器的热控制组件，并且气体样品通过所述散热器以增加光源的温度控制。

3. 发明授权

US5705816A Process and device for analyzing traces of impurities in a gas sample by means of a diode laser 失效
标题翻译：用于通过二极管激光分析气体样品中杂质痕迹的工艺和装置
公开(公告)号：US5705816A
公开(公告)日：1998-01-06
申请号：US634725
申请日：1996-04-19
申请人： Catherine Ronge , Fabrice Bounaix , Patrick Mauvais , Frederic Stoeckel
发明人： Catherine Ronge , Fabrice Bounaix , Patrick Mauvais , Frederic Stoeckel
IPC分类号： G01J3/42 , G01N21/35 , G01N21/39 , G01N21/25
CPC分类号： G01N21/39
摘要： The invention relates to a process for analyzing traces of at least one impurity in a gas sample, by absorption by the impurity to be detected of a light beam emitted by a semiconductor diode laser, the beam emitted by the diode being split into at least two branched beams, one called the measurement beam which passes through the gas sample to be analyzed in a multipassage cell before being focused onto a measurement photodetector, another branched beam, called the reference beam, being along a reference path and directly focused onto a reference photodetector without encountering the gas sample, in which process the gas sample is at a pressure at least equal to atmospheric pressure, and a modulation of the supply current of the diode has been introduced, which comprises at least one function of the exponential type.
摘要翻译：本发明涉及一种用于分析气体样品中痕量至少一种杂质的方法，通过被待检测的杂质吸收由半导体二极管激光器发射的光束，由二极管发射的光束被分成至少两个分支光束，一个被称为测量光束，其在被聚焦到测量光电检测器之前通过多分散单元中待分析的气体样品，称为参考光束的另一个分支光束沿着参考光路并且直接聚焦到参考光电检测器在没有遇到气体样品的情况下，气体样品处于至少等于大气压的压力，并且已经引入了二极管的供应电流的调制，其包括指数型的至少一种功能。

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