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    • 4. 发明申请
    • Driver of display device
    • 显示设备的驱动程序
    • US20060238472A1
    • 2006-10-26
    • US11384993
    • 2006-03-20
    • Eung-Sang LeeByoung-Suk KimMyeong-Su Kim
    • Eung-Sang LeeByoung-Suk KimMyeong-Su Kim
    • G09G3/36
    • G09G3/3688G09G3/2074G09G2360/18
    • A driver of a display device is provided. The driver for a display device includes a signal controller receiving first and second input image data, converting the first input image data into first output image data having a grayscale higher than that of the first input image data and converting the second input image data into second output image data having a grayscale lower than that of the second input image data; and a data driver converting the first and second output image data received from the signal controller into first and second data voltages and applying the first and second data voltages to corresponding pixels, respectively.
    • 提供了显示装置的驱动器。 用于显示装置的驱动器包括接收第一和第二输入图像数据的信号控制器,将第一输入图像数据转换成具有高于第一输入图像数据的灰度的第一输出图像数据,并将第二输入图像数据转换为第二输入图像数据 输出具有低于第二输入图像数据的灰度的灰度级的图像数据; 以及数据驱动器,将从信号控制器接收的第一和第二输出图像数据转换为第一和第二数据电压,并将第一和第二数据电压分别施加到对应的像素。
    • 10. 发明授权
    • Semiconductor device test system having high fidelity tester access fixture (HIFIX) board
    • 半导体器件测试系统具有高保真测试器访问夹具(HIFIX)板
    • US08446164B2
    • 2013-05-21
    • US12747267
    • 2008-10-17
    • Kyung-hun ChangSe-kyung OhEung-sang Lee
    • Kyung-hun ChangSe-kyung OhEung-sang Lee
    • G01R31/26
    • G01R31/31924G01R31/31905
    • A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator-functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.
    • 公开了半导体器件测试系统。 半导体器件测试系统将驱动器和比较器功能作为测试头的重要功能扩展到测试头的外部部件(例如HIFIX板),从而使测试的生产率提高一倍,而不需要升级测试 标题。 半导体器件测试系统包括用于由测试控制器测试半导体器件的测试头和用于在半导体器件和测试头之间建立电连接的HIFIX板,并且包括被测器件(DUT)测试单元,其处理 通过与测试头的驱动器进行一对并从处理的读取信号发送到测试头,从半导体器件产生的读取信号。