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    • 1. 发明申请
    • Method and System for Determining a Polarization Dependent Characteristic of Optical and Opto-Electrical Devices
    • 用于确定光学和光电器件的极化相关特性的方法和系统
    • US20070002321A1
    • 2007-01-04
    • US11427985
    • 2006-06-30
    • Eric DesfondsKirill Pimenov
    • Eric DesfondsKirill Pimenov
    • G01J4/00
    • G01J4/04G01M11/337H04Q2213/1301
    • The present invention relates to a method for determining a polarization dependent characteristic of an optical or opto-electronic device. Using the Mueller matrix data, a matrix M corresponding to a difference between a first and a second transmission spectrum is determined. The first and the second transmission spectrum correspond to a first Stokes vector and a second Stokes vector, respectively, with the second Stokes vector being opposite to the first Stokes vector. Eigenvalues of the matrix M are then determined and the first Stokes vector is determined by selecting the largest eigenvalue of the matrix M and determining a corresponding eigenvector. The second Stokes vector is then determined as a vector opposite to the first Stokes vector. Finally, the data indicative of the polarization dependent characteristic of the device are determined using the first and the second Stokes vector and the Mueller matrix data. This method is highly beneficial by providing highly accurate data related to polarization dependent parameters while simultaneously providing a nearly instantaneous result with minimum computational effort.
    • 本发明涉及一种用于确定光学或光电子器件的偏振相关特性的方法。 使用Mueller矩阵数据,确定与第一和第二透射光谱之间的差对应的矩阵M. 第一和第二透射光谱分别对应于第一斯托克斯矢量和第二斯托克斯矢量,第二斯托克斯矢量与第一斯托克斯矢量相反。 然后确定矩阵M的特征值,并且通过选择矩阵M的最大特征值并确定对应的特征向量来确定第一斯托克斯向量。 然后将第二斯托克斯矢量确定为与第一斯托克斯矢量相反的向量。 最后,使用第一和第二斯托克斯矢量和米勒矩阵数据确定指示设备的偏振相关特性的数据。 该方法通过提供与偏振相关参数相关的高精度数据而非常有益,同时以最小的计算量提供几乎瞬时的结果。
    • 4. 发明授权
    • Method and system for determining a polarization dependent characteristics of optical and opto-electrical devices
    • 用于确定光学和光电器件的偏振相关特性的方法和系统
    • US07471378B2
    • 2008-12-30
    • US11427985
    • 2006-06-30
    • Eric DesfondsKirill Pimenov
    • Eric DesfondsKirill Pimenov
    • G01N21/00G01J4/00
    • G01J4/04G01M11/337H04Q2213/1301
    • The present invention relates to a method for determining a polarization dependent characteristic of an optical or opto-electronic device. Using the Mueller matrix data, a matrix M corresponding to a difference between a first and a second transmission spectrum is determined. The first and the second transmission spectrum correspond to a first Stokes vector and a second Stokes vector, respectively, with the second Stokes vector being opposite to the first Stokes vector. Eigenvalues of the matrix M are then determined and the first Stokes vector is determined by selecting the largest eigenvalue of the matrix M and determining a corresponding eigenvector. The second Stokes vector is then determined as a vector opposite to the first Stokes vector. Finally, the data indicative of the polarization dependent characteristic of the device are determined using the first and the second Stokes vector and the Mueller matrix data. This method is highly beneficial by providing highly accurate data related to polarization dependent parameters while simultaneously providing a nearly instantaneous result with minimum computational effort.
    • 本发明涉及一种用于确定光学或光电子器件的偏振相关特性的方法。 使用Mueller矩阵数据,确定与第一和第二透射光谱之间的差对应的矩阵M. 第一和第二透射光谱分别对应于第一斯托克斯矢量和第二斯托克斯矢量,第二斯托克斯矢量与第一斯托克斯矢量相反。 然后确定矩阵M的特征值,并且通过选择矩阵M的最大特征值并确定对应的特征向量来确定第一斯托克斯向量。 然后将第二斯托克斯矢量确定为与第一斯托克斯矢量相反的向量。 最后,使用第一和第二斯托克斯矢量和米勒矩阵数据确定指示设备的偏振相关特性的数据。 该方法通过提供与偏振相关参数相关的高精度数据而非常有益,同时以最小的计算量提供几乎瞬时的结果。