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1. 发明申请

US20130340936A1 METHOD FOR EX-SITU LIFT-OUT SPECIMEN PREPARATION 有权
标题翻译：用于外场提升样本准备的方法
公开(公告)号：US20130340936A1
公开(公告)日：2013-12-26
申请号：US14010780
申请日：2013-08-27
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： H01J37/30
CPC分类号： H01J37/3002 , G01N1/00 , G01N1/32 , H01J37/20 , H01J2237/201 , H01J2237/31745
摘要： A method for mounting a specimen on a specimen carrier for milling in an ex-situ lift-out (EXLO) milling process is described where “cross-section” specimens, plan view specimens, or bulk specimens may be lifted-out for analysis. The method comprising positioning the specimen on a recessed surface within a specimen carrier top surface so that a region to be milled is centered about a carrier opening formed through the specimen carrier. Peripheral edges of the specimen are then wedged against inwardly sloping side walls framing the recessed surface. Finally, the specimen is mounted to the specimen carrier so that a path of a milling beam intersects the region to be milled and carrier opening.
摘要翻译：描述了一种将样品安装在样本载体上用于在非原位提取（EXLO）铣削过程中进行铣削的方法，其中可以将“横截面”样本，平面图样本或体积样本提起以进行分析。该方法包括将样品定位在样品载体顶表面内的凹陷表面上，使得待研磨的区域围绕通过样品载体形成的载体开口居中。然后将试样的外围边缘楔入抵靠凹陷表面的向内倾斜的侧壁。最后，将样品安装到试样载体上，使得铣削梁的路径与要研磨的区域和载体开口相交。

2. 发明授权

US08789826B2 Method for ex-situ lift-out specimen preparation 有权
标题翻译：异地提取样品制备方法
公开(公告)号：US08789826B2
公开(公告)日：2014-07-29
申请号：US14010780
申请日：2013-08-27
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： B23Q3/00 , G21K5/10 , H01J37/00 , G01N1/00 , H01J37/20 , H01J37/30
CPC分类号： H01J37/3002 , G01N1/00 , G01N1/32 , H01J37/20 , H01J2237/201 , H01J2237/31745
摘要： A method for mounting a specimen on a specimen carrier for milling in an ex-situ lift-out (EXLO) milling process is described where “cross-section” specimens, plan view specimens, or bulk specimens may be lifted-out for analysis. The method comprising positioning the specimen on a recessed surface within a specimen carrier top surface so that a region to be milled is centered about a carrier opening formed through the specimen carrier. Peripheral edges of the specimen are then wedged against inwardly sloping side walls framing the recessed surface. Finally, the specimen is mounted to the specimen carrier so that a path of a milling beam intersects the region to be milled and carrier opening.
摘要翻译：描述了一种将样品安装在样本载体上用于在非原位提取（EXLO）铣削过程中进行铣削的方法，其中可以将“横截面”样本，平面图样本或体积样本提起以进行分析。该方法包括将样品定位在样品载体顶表面内的凹陷表面上，使得待研磨的区域围绕通过样品载体形成的载体开口居中。然后将试样的外围边缘楔入抵靠凹陷表面的向内倾斜的侧壁。最后，将样品安装到试样载体上，使得铣削梁的路径与要研磨的区域和载体开口相交。

3. 发明公开

US20230236095A1 METHOD AND APPARATUS FOR CRYOGENIC AND ENVIRONMENTAL CONTROLLED SPECIMEN HANDLING 审中-公开
公开(公告)号：US20230236095A1
公开(公告)日：2023-07-27
申请号：US17586565
申请日：2022-01-27
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： G01N1/42
CPC分类号： G01N1/42
摘要： A method for manipulating a cryogenic specimen for subsequent examination includes mounting a cryogenic specimen on a work surface of a specimen holder and placing the specimen holder within a pumped cryostat chamber having a layer of cryogenic liquid therein. The cryostat chamber is vented and kept at low humidity in order to generate a cryogenic vapor layer above the cryogenic liquid so that the work surface of the specimen holder is within the cryogenic vapor layer and low humidity and inert environment. The cryogenic specimen in then manipulated to a specimen carrier contained on a different portion of the work surface while keeping the cryogenic specimen within the cryogenic vapor layer.

4. 发明授权

US10801926B2 Probe with solid beveled tip and method for using same for specimen extraction 有权
公开(公告)号：US10801926B2
公开(公告)日：2020-10-13
申请号：US16033600
申请日：2018-07-12
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： G01N1/06 , G01N1/08 , H01J37/20 , G01N1/28 , H01J37/26
摘要： A probe includes a solid elongate body disposed along a long axis of the probe and terminating in a probe tip, and a solid planar beveled surface at or adjacent an end of the probe tip formed at a non-zero beveled angle relative to a normal of the long axis of the probe, The solid planar beveled surface is configured to impart Van der Waals attractive force to a sample surface positioned immediately adjacent the solid beveled surface of the probe so that the sample can be detached from and lifted from the bulk material and transported to a grid for investigation. Various embodiments of the beveled surface are described, including an elliptical probe tip surface beveled between 10 and 45 degrees to the normal to the probe long axis and planar surfaces formed in the sides of the probe body that are parallel to the probe long axis.

5. 发明授权

US11808679B2 Method and apparatus for cryogenic and environmental controlled specimen handling 有权
公开(公告)号：US11808679B2
公开(公告)日：2023-11-07
申请号：US17586565
申请日：2022-01-27
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： G01N1/42
CPC分类号： G01N1/42
摘要： A method for manipulating a cryogenic specimen for subsequent examination includes mounting a cryogenic specimen on a work surface of a specimen holder and placing the specimen holder within a pumped cryostat chamber having a layer of cryogenic liquid therein. The cryostat chamber is vented and kept at low humidity in order to generate a cryogenic vapor layer above the cryogenic liquid so that the work surface of the specimen holder is within the cryogenic vapor layer and low humidity and inert environment. The cryogenic specimen in then manipulated to a specimen carrier contained on a different portion of the work surface while keeping the cryogenic specimen within the cryogenic vapor layer.

6. 发明授权

US10522324B1 Method of producing lift out specimens for teaching, practice, and training 有权
公开(公告)号：US10522324B1
公开(公告)日：2019-12-31
申请号：US16052788
申请日：2018-08-02
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： G01N1/00 , H01J37/20 , H01J37/26 , H01J37/305 , H01J37/31 , G01N1/32
摘要： A method for creating a low-cost specimen used for training users in lift out techniques is prepared using additive manufacturing. This replaces the more expensive and time-intensive subtractive manufacturing methods traditionally used that operate by milling or ablation with charged particle focused ion beam (FIB) instruments or lasers. The method comprises building up a sample from a substrate surface using additive manufacturing, building up trench walls within the sample that frame a trench using additive manufacturing, and building up a specimen between the trench walls using additive manufacturing. In a preferred form, the specimen has a shape taken from the group consisting of a lamella, a rectangular cuboid, a triangular prism, and a regular prism. Tabs and other support structures may be eliminated using subtractive milling or chemical dissolving methods to create a freestanding specimen separate from the trench.

7. 发明申请

US20190017904A1 PROBE WITH SOLID BEVELED TIP AND METHOD FOR USING SAME FOR SPECIMEN EXTRACTION 审中-公开
公开(公告)号：US20190017904A1
公开(公告)日：2019-01-17
申请号：US16033600
申请日：2018-07-12
申请人： EXpressLO LLC
发明人： Lucille A. Giannuzzi
IPC分类号： G01N1/06 , G01N1/08 , H01J37/20
CPC分类号： G01N1/06 , G01N1/08 , G01N1/28 , H01J37/20 , H01J37/26 , H01J2237/208 , H01J2237/28 , H01J2237/31745
摘要： A probe includes a solid elongate body disposed along a long axis of the probe and terminating in a probe tip, and a solid planar beveled surface at or adjacent an end of the probe tip formed at a non-zero beveled angle relative to a normal of the long axis of the probe, The solid planar beveled surface is configured to impart Van der Waal attractive force to a sample surface positioned immediately adjacent the solid beveled surface of the probe so that the sample can be detached from and lifted from the bulk material and transported to a grid for investigation. Various embodiments of the beveled surface are described, including an elliptical probe tip surface beveled between 10 and 45 degrees to the normal to the probe long axis and planar surfaces formed in the sides of the probe body that are parallel to the probe long axis.

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