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    • 4. 发明授权
    • System for measuring the concentration of a gaseous component by
detecting positions of mode jumps in a laser diode
    • 通过检测激光二极管中的模式脉冲的位置来测量气体组分的浓度的系统
    • US5202560A
    • 1993-04-13
    • US904676
    • 1992-06-26
    • Edmund KochJens-Uwe HagenahChristoph MaurerUlrich HeimWilfried DiekmannJohann Otten
    • Edmund KochJens-Uwe HagenahChristoph MaurerUlrich HeimWilfried DiekmannJohann Otten
    • H01S5/0683H01S5/0687
    • H01S5/0687H01S5/06837
    • The invention is directed to a method of operating a laser diode in a measuring system for spectroscopically measuring the concentration of a gaseous component in a gas sample. This method is improved in that the mode jumps of the laser diode are easily recognized when adjusting the temperature-current operating point of the laser diode. An optical filter is placed in the beam path for adjusting the temperature-current operating point of the laser diode and, by changing the temperature T and the operating current I of the laser diode while simultaneously receiving the output signal supplied by an evaluation unit, the spectral positions of the mode jumps of the laser diode are determined which are included in the absorption lines of the gas sample. Thereafter, the temperature-current operating point is adjusted so that the distance of this operating point to the positions of the mode jumps is not less than a fixed spacing. The invention is also directed to a measuring system for spectroscopically measuring the concentration of a gaseous component in a gas sample.
    • 本发明涉及一种在测量系统中操作激光二极管的方法,用于光谱测量气体样品中气态组分的浓度。 改进了这种方法,因为当调节激光二极管的温度 - 电流工作点时,可以容易地识别出激光二极管的模式跳变。 光滤波器被放置在光束路径中,用于调节激光二极管的温度 - 电流工作点,并且通过改变激光二极管的温度T和工作电流I同时接收由评估单元提供的输出信号, 确定激光二极管的模式跳跃的光谱位置,其包括在气体样品的吸收线中。 此后,调整温度 - 电流工作点,使得该工作点与模式跳跃位置的距离不小于固定间距。 本发明还涉及用于光谱测量气体样品中气态组分浓度的测量系统。
    • 6. 发明授权
    • Method and device for reading deep barcodes by way of optical interference
    • 通过光学干涉读取深条形码的方法和装置
    • US07484665B2
    • 2009-02-03
    • US10551308
    • 2004-03-13
    • Peter KochGereon HuettmannEdmund KochEva Lankenau
    • Peter KochGereon HuettmannEdmund KochEva Lankenau
    • G06K7/10
    • G06K7/10712G06K19/06046G06K2019/06234
    • This invention relates to a method for reading, while using optical interference, a barcode that extends into the depth of a substrate. The barcode is represented by an area with marks in the substrate that is partially transparent to electromagnetic radiation. The inventive method comprises the steps of irradiating the substrate with short coherence length light from a broad-band light source, dividing the light up into reference light and measuring light, returning the reference light and the measuring light back-scattered or reflected in the marked area to an analytical unit, determining the reflectance or the reflectivity of the substrate for all layer depths in the marked area from the interference of the reference light and the measuring light and interpreting the result as a barcode.
    • 本发明涉及一种在使用光学干涉的情况下读取延伸到基板深度的条形码的方法。 条形码由在基板中具有对电磁辐射部分透明的标记的区域表示。 本发明的方法包括以下步骤:从宽带光源照射具有短相干长度光的基板,将光分成参考光和测量光,返回参考光和被散射或反射在标记的光 区域到分析单元,从参考光和测量光的干涉中确定标记区域中所有层深度的衬底的反射率或反射率,并将结果解释为条形码。
    • 7. 发明授权
    • Interferometric device
    • 干涉仪
    • US07480057B2
    • 2009-01-20
    • US10587120
    • 2005-01-20
    • Peter KochEdmund Koch
    • Peter KochEdmund Koch
    • G01B9/02
    • G01B9/02032G01B9/02012G01B9/02091
    • Device for white light interferometry comprising a light source of main emission wavelength λ0 and spectral width Δλ and an evaluating unit with a line sensor of pixel width P for detecting an interference fringe pattern with a fringe spacing F, a mask being placed in front of the line sensor having a periodically modulated light transmittance along said line sensor, characterized in that the period length M of the mask is such as to fulfill the condition Δ ⁢ ⁢ λ λ 0
    • 用于白光干涉测量的装置,包括主发射波长λ0和光谱宽度Deltalambda的光源和具有像素宽度P的线传感器的评估单元,用于检测具有边缘间隔F的干涉条纹图案,掩模被放置在 线传感器,沿着所述线传感器具有周期性调制的透光率,其特征在于,掩模的周期长度M满足条件 Delta / mstyle> > << / mo> 1 - mi> M << / mo> mn> 2 F P mo> - Delta mo>
        • 8. 发明申请
        • Interferometric Device
        • 干涉仪
        • US20080024865A1
        • 2008-01-31
        • US10587120
        • 2005-01-20
        • Peter KochEdmund Koch
        • Peter KochEdmund Koch
        • G02B5/18G02B27/00
        • G01B9/02032G01B9/02012G01B9/02091
        • Device for white light interferometry comprising a light source of main emission wavelength λ0 and spectral width Δλ and an evaluating unit with a line sensor of pixel width P for detecting an interference fringe pattern with a fringe spacing F, a mask being placed in front of the line sensor having a periodically modulated light transmittance along said line sensor, characterized in that the period length M of the mask is such as to fulfill the condition Δ   λ λ 0
        • 用于白光干涉测量的装置,其包括主发射波长λλ和光谱宽度Deltalλ的光源和具有像素宽度P的线传感器的评估单元,用于检测具有边缘间隔F的干涉条纹图案, 掩模被放置在线传感器的前面,沿着所述线传感器具有周期性调制的透光率,其特征在于,掩模的周期长度M满足条件 Delta λ << / MO> 1 - MI> F M << / MO> MFRAC> / MFRAC> - Delta lambda lambda 0 >