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    • 2. 发明授权
    • Formation of nanoscale wires
    • 纳米线的形成
    • US06773616B1
    • 2004-08-10
    • US10033408
    • 2001-12-26
    • Yong ChenDouglas A. A. OhlbergTheodore I. KaminsR. Stanley Williams
    • Yong ChenDouglas A. A. OhlbergTheodore I. KaminsR. Stanley Williams
    • B44C122
    • C30B23/02C30B25/02C30B29/605Y10S977/888
    • Self-organized, or self-assembled, nanowires of a first composition may be used as an etching mask for fabrication of nanowires of a second composition. The method for forming such nanowires comprises: (a) providing an etchable layer of the second composition and having a buried insulating layer beneath a major surface thereof; (b) growing self-assembled nanowires on the surface of the etchable layer; and (c) etching the etchable layer anisotropically down to the insulating layer, using the self-assembled nanowires as a mask. The self-assembled nanowires may be removed or left. In either event, nanowires of the second composition are formed. The method enables the formation of one-dimensional crystalline nanowires with widths and heights at the nanometer scale, and lengths at the micrometer scale, which are aligned along certain crystallographic directions with high crystal quality. Further, the method of the present invention avoids traditional lithography methods, minimizes environmental toxic chemicals usage, simplifies the manufacturing processes, and allows the formation of high-quality one-dimensional nanowires over large areas.
    • 可以将第一组合物的自组织或自组装的纳米线用作用于制造第二组合物的纳米线的蚀刻掩模。 形成这种纳米线的方法包括:(a)提供第二组合物的可蚀刻层,并在其主表面下方具有掩埋绝缘层; (b)在可蚀刻层的表面上生长自组装纳米线; 和(c)使用自组装纳米线作为掩模,各向异性地将可蚀刻层蚀刻到绝缘层。 自组装纳米线可以被去除或留下。 在任一情况下,形成第二组合物的纳米线。 该方法能够形成具有纳米尺度的宽度和高度的一维结晶纳米线,以及在具有高晶体质量的某些晶体方向上对准的微米尺度的长度。 此外,本发明的方法避免了传统的光刻方法,使环境有毒化学品的使用最小化,简化了制造工艺,并且允许在大面积上形成高质量的一维纳米线。