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    • 3. 发明申请
    • Method for estimating propagation noise based on effective capacitance in an integrated circuit chip
    • 基于集成电路芯片中的有效电容估计传播噪声的方法
    • US20060190881A1
    • 2006-08-24
    • US11048422
    • 2005-02-01
    • Haihua SuDavid WidigerYing LiuByron KrauterChandramouli Kashyap
    • Haihua SuDavid WidigerYing LiuByron KrauterChandramouli Kashyap
    • G06F17/50
    • G06F17/5036
    • A system and method for estimating propagation noise that is induced by a non-zero noise glitch at the input of the driver circuit. Such propagation noise is a function of both the input noise glitch and the driver output effective capacitive load, which is typically part of the total wiring capacitance due to resistive shielding in deep sub-micron interconnects. The noise-driven effective capacitance solution provided herein also estimates the propagation noise induced by a non-zero noise glitch at the input of the driving gate. Gate propagation noise rules describing a relationship between the output noise properties and the input noise properties and the output loading capacitance are used within the noise-driven effective capacitance process to determine the linear Thevenin model of the driving gate. The linearized Thevenin driver model is then employed to analyze both the propagation noise and the combined coupling and propagation noise typically seen in global signal nets.
    • 用于估计在驱动器电路的输入处由非零噪声毛刺引起的传播噪声的系统和方法。 这种传播噪声是输入噪声毛刺和驱动器输出有效电容性负载两者的函数,这通常是由于深亚微米互连中的电阻屏蔽而导致的总布线电容的一部分。 本文提供的噪声驱动的有效电容解决方案还估计在驱动门的输入处由非零噪声毛刺引起的传播噪声。 在噪声驱动的有效电容过程中使用描述输出噪声特性和输入噪声特性与输出负载电容之间的关系的门传播噪声规则来确定驱动门的线性戴维宁模型。 然后使用线性化的戴维南驱动器模型来分析传播噪声和通常在全局信号网中看到的组合耦合和传播噪声。