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    • 2. 发明授权
    • Two pass automated application instrumentation
    • 双程自动化应用仪器
    • US08938729B2
    • 2015-01-20
    • US12903102
    • 2010-10-12
    • David Brooke MartinMarco GagliardiMark Jacob Addleman
    • David Brooke MartinMarco GagliardiMark Jacob Addleman
    • G06F11/36G06F11/34
    • G06F11/3612G06F11/3466G06F11/3644
    • A two-pass technique for instrumenting an application is disclosed. One pass may be performed statically by analyzing the application and inserting probes while the application is not running. Another pass may be performed dynamically by analyzing data collected by the probes while the application runs to derive metrics for the probes. One or more metrics for each probe may be analyzed to determine whether to dynamically modify the probe. By dynamically modifying the probe, the application does not need to be shut down. Dynamically modifying the probe could include removing the probe from the application or moving the probe to another component (e.g., method) in the application, as examples. For example, the probe might be moved to a component that is either up or down the call graph from the component that the probe is presently in.
    • 公开了一种用于仪器应用的双程技术。 可以通过在应用程序未运行时分析应用程序和插入探针来静态执行一遍。 可以通过在应用程序运行时分析由探针收集的数据来导出探针的度量来动态执行另一遍。 可以分析每个探针的一个或多个度量以确定是否动态修改探针。 通过动态修改探测器,应用程序不需要关闭。 作为示例,动态修改探针可以包括从应用中去除探针或将探针移动到应用中的另一个组件(例如,方法)。 例如,探针可能被移动到从探头当前所在组件的调用图中向上或向下的组件。
    • 3. 发明申请
    • TWO PASS AUTOMATED APPLICATION INSTRUMENTATION
    • 两通自动应用仪表
    • US20120089966A1
    • 2012-04-12
    • US12903102
    • 2010-10-12
    • David Brooke MartinMarco GagliardiMark Jacob Addleman
    • David Brooke MartinMarco GagliardiMark Jacob Addleman
    • G06F9/44
    • G06F11/3612G06F11/3466G06F11/3644
    • A two-pass technique for instrumenting an application is disclosed. One pass may be performed statically by analyzing the application and inserting probes while the application is not running. Another pass may be performed dynamically by analyzing data collected by the probes while the application runs to derive metrics for the probes. One or more metrics for each probe may be analyzed to determine whether to dynamically modify the probe. By dynamically modifying the probe, the application does not need to be shut down. Dynamically modifying the probe could include removing the probe from the application or moving the probe to another component (e.g., method) in the application, as examples. For example, the probe might be moved to a component that is either up or down the call graph from the component that the probe is presently in.
    • 公开了一种用于仪器应用的双程技术。 可以通过在应用程序未运行时分析应用程序和插入探针来静态执行一遍。 可以通过在应用程序运行时分析由探针收集的数据来导出探针的度量来动态执行另一遍。 可以分析每个探针的一个或多个度量以确定是否动态修改探针。 通过动态修改探测器,应用程序不需要关闭。 作为示例,动态修改探针可以包括从应用中去除探针或将探针移动到应用中的另一个组件(例如,方法)。 例如,探针可能被移动到从探头当前所在组件的调用图中向上或向下的组件。