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1. 发明授权

US08907675B2 Method for determining a state of health for an electrochemical device 有权
标题翻译：用于确定电化学装置的健康状态的方法
公开(公告)号：US08907675B2
公开(公告)日：2014-12-09
申请号：US13202607
申请日：2010-02-22
申请人： Vincent Phlippoteau , André Rakotondrainibe , Christophe Turpin , Guillaume Fontes
发明人： Vincent Phlippoteau , André Rakotondrainibe , Christophe Turpin , Guillaume Fontes
IPC分类号： G01N27/416 , G01R31/36 , H01M8/04
CPC分类号： G01R31/3679 , H01M8/04679 , Y02E60/50
摘要： The invention relates to a method for determining a state of health of an electrochemical device in particular having improved reliability. Said method in particular consists of: applying (10) to said electrochemical device an input signal comprising electrical excitations of different categories, and measuring an output signal (20) including the response signals to each electrical excitation; estimating (41) at least one first parameter from an electrical excitation belonging to a first category and the corresponding response signal; estimating (43) said at least one physicochemical parameter representative of the physicochemical behavior of the device from an electrical excitation of a different category, of the corresponding response signal and said first estimated parameter; estimating (50) said state of health of the electrochemical device as deviation between the previously estimated value of the physicochemical parameter and a reference value.
摘要翻译：本发明涉及一种用于确定电化学装置的健康状况的方法，特别是具有改进的可靠性。所述方法特别包括：向所述电化学装置施加包括不同类别的电激励的输入信号（10），并测量包括对每个电激励的响应信号的输出信号（20）; 从属于第一类别的电激励和相应的响应信号估计（41）至少一个第一参数; 估计（43）表示来自相应响应信号和所述第一估计参数的不同类别的电激励的表示所述设备的物理化学行为的至少一个物理化学参数; 将所述电化学装置的所述健康状态估计为（50）所述物理化学参数的先前估计值与参考值之间的偏差。

2. 发明申请

US20120038452A1 METHOD FOR DETERMINING A STATE OF HEALTH FOR AN ELECTROCHEMICAL DEVICE 有权
标题翻译：用于确定电化学装置的健康状态的方法
公开(公告)号：US20120038452A1
公开(公告)日：2012-02-16
申请号：US13202607
申请日：2010-02-22
申请人： Vincent Phlippoteau , Andre Rakotondrainibe , Christophe Turpin , Guillaume Fontes
发明人： Vincent Phlippoteau , Andre Rakotondrainibe , Christophe Turpin , Guillaume Fontes
IPC分类号： G05B23/02 , G06F19/00
CPC分类号： G01R31/3679 , H01M8/04679 , Y02E60/50
摘要： The invention relates to a method for determining a state of health of an electrochemical device in particular having improved reliability. Said method in particular consists of: applying (10) to said electrochemical device an input signal comprising electrical excitations of different categories, and measuring an output signal (20) including the response signals to each electrical excitation; estimating (41) at least one first parameter from an electrical excitation belonging to a first category and the corresponding response signal; estimating (43) said at least one physicochemical parameter representative of the physicochemical behavior of the device from an electrical excitation of a different category, of the corresponding response signal and said first estimated parameter; estimating (50) said state of health of the electrochemical device as deviation between the previously estimated value of the physicochemical parameter and a reference value.
摘要翻译：本发明涉及一种用于确定电化学装置的健康状况的方法，特别是具有改进的可靠性。所述方法特别包括：向所述电化学装置施加包括不同类别的电激励的输入信号（10），并测量包括对每个电激励的响应信号的输出信号（20）; 从属于第一类别的电激励和相应的响应信号估计（41）至少一个第一参数; 估计（43）表示来自相应响应信号和所述第一估计参数的不同类别的电激励的表示所述设备的物理化学行为的至少一个物理化学参数; 将所述电化学装置的所述健康状态估计为（50）所述物理化学参数的先前估计值与参考值之间的偏差。

3. 发明授权

US08773145B2 Method for characterizing an electrical system by impedance spectroscopy 有权
标题翻译：通过阻抗谱法表征电气系统的方法
公开(公告)号：US08773145B2
公开(公告)日：2014-07-08
申请号：US13202621
申请日：2010-02-22
申请人： Vincent Phlippoteau , Christophe Turpin , André Rakotondrainibe
发明人： Vincent Phlippoteau , Christophe Turpin , André Rakotondrainibe
IPC分类号： G01R27/02 , G01R23/00 , G01R23/16 , G01R31/26
CPC分类号： G01R27/02 , G01R23/00 , G01R23/16 , G01R31/2612 , G01R31/3662 , H01M8/04634
摘要： The invention relates to a method for more precisely characterizing an electrical system by impedance spectrometry. The method consists of applying an input signal to the electrical system that comprises a sequence of sinusoidal perturbations, so as to scan a primary series (A) of frequencies; measuring an output signal of the electrical system in response to the input signal for each of the applied perturbations; and estimating a characteristic size of the impedance of the electrical system for each of the applied perturbations; wherein the perturbations of the sequence are applied so as to scan, turn by turn, a plurality of sub-series (A1, . . . , An) of frequencies resulting from the primary series (A), each sub-series of the plurality being interlaced with at least one other sub-series of the same plurality.
摘要翻译：本发明涉及通过阻抗光谱法更精确地表征电气系统的方法。该方法包括将包括一系列正弦扰动的输入信号施加到电气系统，以扫描频率的主要序列（A）; 响应于每个所施加的扰动的输入信号，测量电气系统的输出信号; 以及估计每个所施加的扰动的电气系统的阻抗的特征尺寸; 其中应用所述序列的扰动以便依次扫描由所述主序列（A）产生的多个子序列（A1，...，An），所述多个子序列（A1，...，An），所述多个子序列与至少一个相同多个的其它子系列交错。

4. 发明申请

US20120105075A1 METHOD FOR CHARACTERIZING AN ELECTRICAL SYSTEM BY IMPEDANCE SPECTROSCOPY 有权
标题翻译：用阻抗谱表征电气系统的方法
公开(公告)号：US20120105075A1
公开(公告)日：2012-05-03
申请号：US13202621
申请日：2010-02-22
申请人： Vincent Phlippoteau , Christophe Turpin , André Rakotondrainibe
发明人： Vincent Phlippoteau , Christophe Turpin , André Rakotondrainibe
IPC分类号： G01R27/00
CPC分类号： G01R27/02 , G01R23/00 , G01R23/16 , G01R31/2612 , G01R31/3662 , H01M8/04634
摘要： The invention relates to a method for more precisely characterizing an electrical system by impedance spectrometry. Said method consists of: applying an input signal to said electrical system that comprises a sequence of sinusoidal perturbations, so as to scan a primary series (A) of frequencies; measuring an output signal of said electrical system in response to said input signal for each of said applied perturbations; and estimating a characteristic size of the impedance of said electrical system for each of said applied perturbations; characterized in that the perturbations of said sequence are applied so as to scan, turn by turn, a plurality of sub-series (A1, . . . , An) of frequencies resulting from said primary series (A), each sub-series of said plurality being interlaced with at least one other sub-series of the same plurality.
摘要翻译：本发明涉及通过阻抗光谱法更精确地表征电气系统的方法。所述方法包括：将包括一系列正弦扰动的输入信号施加到所述电气系统，以扫描频率的主要序列（A）; 响应于每个所述应用扰动的所述输入信号，测量所述电气系统的输出信号; 以及估计所述电气系统的每个所述应用扰动的阻抗的特征尺寸; 其特征在于，施加所述序列的扰动以便依次扫描由所述主要序列（A）产生的多个子序列（A1，...，An），每个子序列所述多个与多个相同的至少一个其它子系列交错。

5. 发明申请

US20070059859A1 Hydrogen reservoir based on silicon nano-structures 审中-公开
标题翻译：基于硅纳米结构的氢储层
公开(公告)号：US20070059859A1
公开(公告)日：2007-03-15
申请号：US10566041
申请日：2004-07-27
申请人： Volodymyr Lysenko , Christophe Turpin
发明人： Volodymyr Lysenko , Christophe Turpin
IPC分类号： H01L51/40
CPC分类号： H01M8/04216 , C01B3/001 , C01B33/02 , C25F3/12 , Y02E60/324 , Y02E60/364 , Y02P70/56
摘要： The invention relates to a hydrogen reservoir comprising a substance suitable for storing hydrogen wherein said substance is made up of nano-structured silicon. It also relates to a process for manufacturing and a method for use of this hydrogen reservoir.
摘要翻译：本发明涉及一种包含适于储存氢的物质的储氢器，其中所述物质由纳米结构硅组成。它还涉及一种制造方法和该储氢器的使用方法。

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