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    • 3. 发明授权
    • X-ray detector comprising a directly converting semiconductor layer and calibration method for such an X-ray detector
    • X射线检测器包括直接转换半导体层和用于这种X射线检测器的校准方法
    • US08389928B2
    • 2013-03-05
    • US13088448
    • 2011-04-18
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • G01D18/00
    • G01T1/249G01T1/247G01T7/005
    • An X-ray detector includes a directly converting semiconductor layer for converting an incident radiation into electrical signals with a band gap energy characteristic of the semiconductor layer, and at least one light source for coupling light into the semiconductor layer, wherein the generated light, for the simulation of incident X-ray quanta, has an energy above the band gap energy of the semiconductor layer. One embodiment includes at least one evaluation unit for calculating an evaluation signal from the electrical signals generated when the light is coupled into the semiconductor layer, and at least one calibration unit for calibrating at least one pulse discriminator on the basis of the evaluation signal. This provides the prerequisites for a rapidly repeatable calibration of the X-ray detector taking into account of the present polarization state without using X-ray radiation. Another embodiment additionally relates to a calibration method for such an X-ray detector.
    • X射线检测器包括用于将入射辐射转换成具有半导体层的带隙能量特性的电信号的直接转换半导体层和用于将光耦合到半导体层中的至少一个光源,其中所产生的光用于 入射X射线量子点的模拟具有高于半导体层带隙能量的能量。 一个实施例包括至少一个评估单元,用于根据当光耦合到半导体层中时产生的电信号计算评估信号;以及至少一个校准单元,用于基于评估信号校准至少一个脉冲鉴别器。 这提供了在不使用X射线辐射的情况下考虑到目前的极化状态来快速重复地校准X射线检测器的先决条件。 另一个实施例另外涉及这种X射线检测器的校准方法。
    • 5. 发明授权
    • Radiation converter comprising a directly converting semiconductor layer and method for producing such a radiation converter
    • 包括直接转换半导体层的辐射转换器和用于产生这种辐射转换器的方法
    • US08946838B2
    • 2015-02-03
    • US13111275
    • 2011-05-19
    • Christian Schröter
    • Christian Schröter
    • H01L31/0224H01L31/0304H01L31/0296H01L31/18G01T1/24H01L31/08
    • G01T1/249G01T1/24H01L31/085
    • A radiation converter includes a directly converting semiconductor layer having grains whose interfaces predominantly run parallel to a drift direction—constrained by an electric field—of electrons liberated in the semiconductor layer. Charge carriers liberated by incident radiation quanta are accelerated in the electric field in the direction of the radiation incidence direction and on account of the columnar or pillar-like texture of the semiconductor layer, in comparison with the known radiation detectors, cross significantly fewer interfaces of the grains that are occupied by defect sites. This increases the charge carrier lifetime/mobility product in the direction of charge carrier transport. Consequently, it is possible to realize significantly thicker semiconductor layers for the counting and/or energy-selective detection of radiation quanta. This increases the absorptivity of the radiation converter which in turn makes it possible to reduce a radiation dose applied to the patient.
    • 辐射转换器包括直接转换半导体层,其具有主要平行于漂移方向的界面的晶粒,该漂移方向受半导体层中释放的电子的电场约束。 通过入射辐射量子放电的电荷载体在辐射入射方向的方向上被加速,并且由于半导体层的柱状或柱状结构,与已知的辐射检测器相比,交叉显着更少的界面 由缺陷部位占据的颗粒。 这就增加了电荷载流子传输方向上的载流子寿命/迁移率。 因此,可以实现用于辐射量子的计数和/或能量选择性检测的明显更厚的半导体层。 这增加了辐射转换器的吸收率,这进一步降低了施加到患者的辐射剂量。
    • 7. 发明授权
    • X-ray radiation detector for use in a CT system
    • 用于CT系统的X射线辐射检测器
    • US08445854B2
    • 2013-05-21
    • US12591577
    • 2009-11-24
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • H01L27/146
    • G01T1/00
    • At least one embodiment of the invention relates to an X-ray radiation detector, in particular for use in a CT system. In at least one embodiment, the X-ray radiation detector includes a semiconductor material used for detection, at least two ohmic contacts between the semiconductor material and a contact material, the semiconductor material and contact material each having a specific excitation energy of the charge carriers, with the excitation energy of the contact material corresponding to the excitation energy of the semiconductor material. At least one embodiment of the invention furthermore relates to a CT system in which an X-ray radiation detector is used, the X-ray radiation detector advantageously having at least two ideal ohmic contacts according to at least one embodiment of the invention.
    • 本发明的至少一个实施例涉及一种X射线辐射检测器,特别是用于CT系统中。 在至少一个实施例中,X射线辐射检测器包括用于检测的半导体材料,半导体材料和接触材料之间的至少两个欧姆接触,半导体材料和接触材料各自具有电荷载体的特定激发能 ,其中接触材料的激发能对应于半导体材料的激发能。 本发明的至少一个实施例还涉及其中使用X射线辐射检测器的CT系统,根据本发明的至少一个实施例,X射线辐射检测器有利地具有至少两个理想的欧姆接触。
    • 10. 发明申请
    • X-ray radiation detector for use in a CT system
    • 用于CT系统的X射线辐射检测器
    • US20100127182A1
    • 2010-05-27
    • US12591577
    • 2009-11-24
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • Peter HackenschmiedChristian SchröterMatthias Strassburg
    • H01L31/0296H01L31/0272
    • G01T1/00
    • At least one embodiment of the invention relates to an X-ray radiation detector, in particular for use in a CT system. In at least one embodiment, the X-ray radiation detector includes a semiconductor material used for detection, at least two ohmic contacts between the semiconductor material and a contact material, the semiconductor material and contact material each having a specific excitation energy of the charge carriers, with the excitation energy of the contact material corresponding to the excitation energy of the semiconductor material. At least one embodiment of the invention furthermore relates to a CT system in which an X-ray radiation detector is used, the X-ray radiation detector advantageously having at least two ideal ohmic contacts according to at least one embodiment of the invention.
    • 本发明的至少一个实施例涉及一种X射线辐射检测器,特别是用于CT系统中。 在至少一个实施例中,X射线辐射检测器包括用于检测的半导体材料,半导体材料和接触材料之间的至少两个欧姆接触,半导体材料和接触材料各自具有电荷载体的特定激发能 ,其中接触材料的激发能对应于半导体材料的激发能。 本发明的至少一个实施例还涉及其中使用X射线辐射检测器的CT系统,根据本发明的至少一个实施例,X射线辐射检测器有利地具有至少两个理想的欧姆接触。