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1. 发明申请

US20100058126A1 Programmable Self-Test for Random Access Memories 有权
标题翻译：随机存取存储器可编程自检
公开(公告)号：US20100058126A1
公开(公告)日：2010-03-04
申请号：US12198949
申请日：2008-08-27
申请人： Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
发明人： Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
IPC分类号： G11C29/04 , G06F11/22
CPC分类号： G11C29/16 , G11C2029/3602
摘要： A system that provides large instruction sets for testing memory yet reduces area overhead is disclosed. The system for testing a memory of an integrated circuit comprises a set of registers providing element based programmability for a plurality of tests, wherein each test includes a plurality of test elements; a finite state machine for receiving a plurality of test instructions from the set of registers, wherein the finite state machine dispatches signals instructing a test pattern generator to generate a test pattern; a memory control module for applying the generated test pattern to the memory; and a comparator module for comparing a response received from the memory to a stored, known response.
摘要翻译：公开了一种提供用于测试存储器的大指令集并减少区域开销的系统。用于测试集成电路的存储器的系统包括一组寄存器，用于为多个测试提供基于元素的可编程性，其中每个测试包括多个测试元件; 用于从该组寄存器接收多个测试指令的有限状态机，其中所述有限状态机器调度指示测试模式发生器产生测试模式的信号; 存储器控制模块，用于将生成的测试图案应用于存储器; 以及用于将从存储器接收的响应与存储的已知响应进行比较的比较器模块。

2. 发明授权

US08446161B2 Method of self monitoring and self repair for a semiconductor IC 有权
标题翻译：半导体IC的自我监测和自我修复方法
公开(公告)号：US08446161B2
公开(公告)日：2013-05-21
申请号：US12625235
申请日：2009-11-24
申请人： Chingwen Chang
发明人： Chingwen Chang
IPC分类号： G01R31/3187 , G01R31/10
CPC分类号： G01R31/3187
摘要： A method for self repair of a semiconductor IC is presented. An IC state is set to test/repair mode upon powering up the IC. Fuse data is loaded from an e-fuse module. Defects or faults are detected by employing a built in self test (BIST) module. The IC self repairs using redundant circuitry by employing a built in self repair (BISR) module to repair each fault using redundant circuitry. The fault locations and repair locations are stored in the e-fuse module. The semiconductor IC state is changed to mission mode.
摘要翻译：提出了半导体IC的自修复方法。在IC上电时，IC状态被设置为测试/修复模式。保险丝数据从电子熔丝模块加载。通过使用内置自检（BIST）模块检测缺陷或故障。通过采用内置自修复（BISR）模块，使用冗余电路来修复每个故障，使用冗余电路的IC自身进行维修。故障位置和维修位置存储在电熔丝模块中。半导体IC状态变为任务模式。

3. 发明申请

US20090122589A1 ELECTRICAL FUSE SELF TEST AND REPAIR 有权
标题翻译：电气保险丝自检和维修
公开(公告)号：US20090122589A1
公开(公告)日：2009-05-14
申请号：US11939982
申请日：2007-11-14
申请人： Chingwen Chang
发明人： Chingwen Chang
IPC分类号： G01R31/07 , G11C17/16
CPC分类号： G11C29/02 , G11C29/027 , G11C29/4401
摘要： A circuit for testing and repairing a fuse device having a plurality of fuse units and being able to serially input and output data is disclosed, the circuit comprises a first multiplexer configured to select either a true or an inverted data for being stored in the fuse device, a second multiplexer configured to select either a true or an inverted data being read out from the fuse device, a storage unit configured to store information of faulty fuse units, and an indication bit being programmed to reflect a comparison between the data intended to be stored in the fuse device and the stored faulty unit information, wherein when the indication bit is at a first state, the first and second multiplexers select the true data, and when the indication bit is at a second state, the first and second multiplexers select the inverted data.
摘要翻译：公开了一种用于测试和修复具有多个熔丝单元并且能够串行输入和输出数据的熔丝装置的电路，该电路包括：第一多路复用器，被配置为选择存储在熔丝装置中的真或反相数据，第二多路复用器，被配置为选择从熔丝器件读出的真或反相数据;存储单元，被配置为存储故障熔丝单元的信息，以及指示位被编程以反映将要被存储的数据之间的比较存储在保险丝装置和存储的故障单元信息中，其中当指示位处于第一状态时，第一和第二多路复用器选择真实数据，并且当指示位处于第二状态时，第一和第二多路复用器选择倒数据。

4. 发明授权

US07499519B1 Bidirectional shift register 有权
标题翻译：双向移位寄存器
公开(公告)号：US07499519B1
公开(公告)日：2009-03-03
申请号：US11954640
申请日：2007-12-12
申请人： Chen-Hui Hsieh , Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
发明人： Chen-Hui Hsieh , Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
IPC分类号： G11C19/00
CPC分类号： G11C19/00 , G11C19/28
摘要： A bidirectional shift register is disclosed which comprises a first and second flip-flop, a first multiplexer having an output coupled to an input of the first flip-flop, and a second multiplexer having an output coupled to an input of the second flip-flop wherein an output of the first flip-flop is coupled to an input of the second multiplexer, an output of the second flip-flop is coupled to an input of the first multiplexer.
摘要翻译：公开了一种双向移位寄存器，其包括第一和第二触发器，具有耦合到第一触发器的输入的输出的第一多路复用器，以及耦合到第二触发器的输入的第二多路复用器其中所述第一触发器的输出耦合到所述第二多路复用器的输入，所述第二触发器的输出耦合到所述第一多路复用器的输入。

5. 发明授权

US07941713B2 Programmable self-test for random access memories 有权
标题翻译：可编程自检随机存取存储器
公开(公告)号：US07941713B2
公开(公告)日：2011-05-10
申请号：US12198949
申请日：2008-08-27
申请人： Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
发明人： Chingwen Chang , Wei-Chia Cheng , Shih-Chieh Lin
IPC分类号： G11C29/00
CPC分类号： G11C29/16 , G11C2029/3602
摘要： A system that provides large instruction sets for testing memory yet reduces area overhead is disclosed. The system for testing a memory of an integrated circuit comprises a set of registers providing element based programmability for a plurality of tests, wherein each test includes a plurality of test elements; a finite state machine for receiving a plurality of test instructions from the set of registers, wherein the finite state machine dispatches signals instructing a test pattern generator to generate a test pattern; a memory control module for applying the generated test pattern to the memory; and a comparator module for comparing a response received from the memory to a stored, known response.
摘要翻译：公开了一种提供用于测试存储器的大指令集并减少区域开销的系统。用于测试集成电路的存储器的系统包括一组寄存器，用于为多个测试提供基于元素的可编程性，其中每个测试包括多个测试元件; 用于从该组寄存器接收多个测试指令的有限状态机，其中所述有限状态机器调度指示测试模式发生器产生测试模式的信号; 存储器控制模块，用于将生成的测试图案应用于存储器; 以及用于将从存储器接收的响应与存储的已知响应进行比较的比较器模块。

6. 发明申请

US20100237876A1 Method of Self Monitoring and Self Repair for a Semiconductor IC 有权
标题翻译：半导体IC的自我监测和自我修复方法
公开(公告)号：US20100237876A1
公开(公告)日：2010-09-23
申请号：US12625235
申请日：2009-11-24
申请人： Chingwen Chang
发明人： Chingwen Chang
IPC分类号： G01R31/02
CPC分类号： G01R31/3187
摘要： A method for self repair of a semiconductor IC is presented. An IC state is set to test/repair mode upon powering up the IC. Fuse data is loaded from an e-fuse module. Defects or faults are detected by employing a built in self test (BIST) module. The IC self repairs using redundant circuitry by employing a built in self repair (BISR) module to repair each fault using redundant circuitry. The fault locations and repair locations are stored in the e-fuse module. The semiconductor IC state is changed to mission mode.
摘要翻译：提出了半导体IC的自修复方法。在IC上电时，IC状态被设置为测试/修复模式。保险丝数据从电子熔丝模块加载。通过使用内置自检（BIST）模块检测缺陷或故障。通过采用内置自修复（BISR）模块，使用冗余电路来修复每个故障，使用冗余电路的IC自身进行维修。故障位置和维修位置存储在电熔丝模块中。半导体IC状态变为任务模式。

7. 发明授权

US07545666B2 Electrical fuse self test and repair 有权
标题翻译：电气保险丝自检和维修
公开(公告)号：US07545666B2
公开(公告)日：2009-06-09
申请号：US11939982
申请日：2007-11-14
申请人： Chingwen Chang
发明人： Chingwen Chang
IPC分类号： G11C17/16
CPC分类号： G11C29/02 , G11C29/027 , G11C29/4401
摘要： A circuit for testing and repairing a fuse device having a plurality of fuse units and being able to serially input and output data is disclosed, the circuit comprises a first multiplexer configured to select either a true or an inverted data for being stored in the fuse device, a second multiplexer configured to select either a true or an inverted data being read out from the fuse device, a storage unit configured to store information of faulty fuse units, and an indication bit being programmed to reflect a comparison between the data intended to be stored in the fuse device and the stored faulty unit information, wherein when the indication bit is at a first state, the first and second multiplexers select the true data, and when the indication bit is at a second state, the first and second multiplexers select the inverted data.
摘要翻译：公开了一种用于测试和修复具有多个熔丝单元并且能够串行输入和输出数据的熔丝装置的电路，该电路包括：第一多路复用器，被配置为选择存储在熔丝装置中的真或反相数据，第二多路复用器，被配置为选择从熔丝器件读出的真或反相数据;存储单元，被配置为存储故障熔丝单元的信息，以及指示位被编程以反映将要被存储的数据之间的比较存储在保险丝装置和存储的故障单元信息中，其中当指示位处于第一状态时，第一和第二多路复用器选择真实数据，并且当指示位处于第二状态时，第一和第二多路复用器选择倒数据。

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