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    • 1. 发明申请
    • PHOTO SENSOR AND METHOD OF FABRICATING THE SAME
    • 照相传感器及其制造方法
    • US20130009143A1
    • 2013-01-10
    • US13253656
    • 2011-10-05
    • Chih ChenChien-Min LiuYuan-Chieh Tseng
    • Chih ChenChien-Min LiuYuan-Chieh Tseng
    • H01L31/0264H01L31/18
    • H01L31/035227H01L31/108
    • A photo sensor and a method of fabricating the same are disclosed, the photo sensor of the present invention has ultra-high Schottky junction area per unit volume, and the photo sensor comprises: a first conductive layer; plural metallic nanowires, in which one end of each metallic nanowire connects with the first conductive layer and is covered with a semiconductive layer having a width of 1 nm to 20 nm; and a second conductive layer locating opposite to the first conductive layer, whereby the plural metallic nanowires locate between the first conductive layer and the second conductive layer, and the semiconductive layer contacts with the second conductive layer, wherein the photo sensor of the present invention is used to detect ultra violet (UV) light with a wavelength of 10 nm-400 nm.
    • 公开了一种光传感器及其制造方法,本发明的光传感器具有每单位体积的超高肖特基结面积,光传感器包括:第一导电层; 多个金属纳米线,其中每个金属纳米线的一端与第一导电层连接并且被宽度为1nm至20nm的半导体层覆盖; 以及与所述第一导电层相对定位的第二导电层,由此所述多个金属纳米线位于所述第一导电层和所述第二导电层之间,并且所述半导体层与所述第二导电层接触,其中本发明的光电传感器为 用于检测波长为10nm-400nm的紫外(UV)光。