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1. 发明申请

US20100070211A1 ROLLING AVERAGE TEST 审中-公开
标题翻译：滚动平均测试
公开(公告)号：US20100070211A1
公开(公告)日：2010-03-18
申请号：US12210090
申请日：2008-09-12
申请人： Brian Surette , Thomas W. Kelly , James E. Martin , Bernard Tan
发明人： Brian Surette , Thomas W. Kelly , James E. Martin , Bernard Tan
IPC分类号： G01R31/26
CPC分类号： G01R31/2894 , G01R31/3167 , G01R31/31718
摘要： A system and method for performing dynamic in-line testing of semiconductor devices sequentially tests a plurality of semiconductor devices. Test data associated with a predetermined number of semiconductor devices of the sequentially tested semiconductor devices is stored in a data structure. After test data corresponding to a predetermined number of semiconductor devices is stored in the data structure, the following steps are iteratively performed. Statistics concerning the selected devices are calculated using the associated test data. A device that fails to meet a precision setting based on the statistics is marked as an outlier device. Test data stored in the data structure corresponding to an earliest tested semiconductor device in sequence is evicted from the data structure. Test data associated with the next passing tested semiconductor device in sequence is stored in the data structure.
摘要翻译：用于执行半导体器件的动态在线测试的系统和方法顺序地测试多个半导体器件。与依次测试的半导体器件的预定数量的半导体器件相关联的测试数据被存储在数据结构中。对应于预定数量的半导体器件的测试数据被存储在数据结构中之后，迭代地执行以下步骤。使用关联的测试数据计算所选设备的统计数据。基于统计信息不符合精度设置的设备被标记为异常值设备。与数据结构对应的数据结构中存储的测试数据依次从数据结构中消失。与下一次通过的测试半导体器件相关的测试数据按顺序存储在数据结构中。

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