专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5239536A Loop test system in an integrated circuit 失效
标题翻译：集成电路中的环路测试系统
公开(公告)号：US5239536A
公开(公告)日：1993-08-24
申请号：US671614
申请日：1991-03-19
申请人： Hiroyo Masuko , Ryouzi Takano , Takashi Hatano , Kiyohumi Mitsuze , Ang Kar Keong
发明人： Hiroyo Masuko , Ryouzi Takano , Takashi Hatano , Kiyohumi Mitsuze , Ang Kar Keong
IPC分类号： G01R31/28 , G06F11/22 , H04J3/14 , H04L29/14
CPC分类号： H04J3/14
摘要： In the transmission data test mode of the integrated circuit, the user sets test transmission data as transmission data and supplies a transmission data test command to a returning unit, whereby the test transmission data output from the transmission unit is returned by the returning unit and received by the reception unit. In that case, a format converting unit receives the test transmission data in the data format of the transmission data. Then, by comparing the test transmission data and data received by the reception unit, the user can carry out a transmission data test. In the reception data test mode of the integrated circuit, the user sets test reception data, designates a reception timing and supplies a reception data test command to a test reception data input unit, whereby the test reception data is received by the reception unit via the test reception data input unit. Then, by comparing the test reception data and data received by the reception unit and corresponding to the designated reception timing, the user can perform a reception data test.
摘要翻译：在集成电路的发送数据测试模式中，用户将测试发送数据设置为发送数据，并将发送数据测试命令提供给返回单元，由此，从发送单元输出的测试发送数据由返回单元返回并接收由接待单位。在这种情况下，格式转换单元以发送数据的数据格式接收测试发送数据。然后，通过比较测试发送数据和接收单元接收的数据，用户可以进行发送数据测试。在集成电路的接收数据测试模式中，用户设置测试接收数据，指定接收定时，并将接收数据测试命令提供给测试接收数据输入单元，由此接收单元经由测试接收数据输入单元。然后，通过比较测试接收数据和由接收单元接收的数据并与指定的接收定时相对应，用户可以进行接收数据测试。

IPRDB

热门服务

关于我们

友情链接

联系方式