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    • 2. 发明申请
    • Apparatus for measuring uniformity of a laminar material
    • 用于测量层状材料的均匀性的装置
    • US20070078557A1
    • 2007-04-05
    • US10551498
    • 2004-04-01
    • Niall FinnAndrzej Krajewski
    • Niall FinnAndrzej Krajewski
    • G06F19/00
    • G01N33/367G01N21/8983G01N2021/8904G01N2021/8908G01N2201/062
    • There is described apparatus for measuring uniformity of a laminar material (1) as the material is delivered from a laminar material delivery machine (2), the apparatus has a measurement rig (10) arranged across the width of the laminar material. The measurement rig carries a linear array of light sources (21) arranged to direct light onto the laminar material (1), a linear array of optical sensors (20), each optical sensor (20) being paired with a light source (21) and being configured to receive light reflected by the laminar material (1) from at least the light source (21) with which it is paired and to thereafter produce a signal indicative of the amount of reflected light it receives, and a processor (11) for receiving signals from each of the optical sensors (20) and processing each of the signals to produce measures of uniformity of the linear material (1) for each optical sensor (20), whereby said apparatus produces measures of uniformity related to spaced apart locations across the width of the laminar material (1).
    • 描述了当从层状材料输送机(2)输送材料时测量层状材料(1)的均匀性的装置,该装置具有横跨层状材料的宽度布置的测量装置(10)。 所述测量装置携带布置成将光引导到层状材料(1)上的光源(21)的线性阵列,光学传感器(20)的线性阵列,每个光学传感器(20)与光源(21)配对, 并且被配置为从至少与其成对的光源(21)接收由层状材料(1)反射的光,然后产生指示其所接收的反射光的量的信号;以及处理器(11) 用于从每个光学传感器(20)接收信号并处理每个信号以产生每个光学传感器(20)的线性材料(1)的均匀度的测量,由此所述设备产生与间隔开的位置相关的均匀度 横跨层状材料(1)的宽度。