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    • 5. 发明申请
    • Method and apparatus for selecting multiple settings for an integrated circuit function
    • 用于选择集成电路功能的多个设置的方法和装置
    • US20050231406A1
    • 2005-10-20
    • US11130614
    • 2005-05-16
    • Jeremy FlasckAndrew BursteinDavid LidskyMichael McJimsey
    • Jeremy FlasckAndrew BursteinDavid LidskyMichael McJimsey
    • H03K19/173H03M1/00
    • G11C29/028G11C2029/5004H03K19/1731
    • A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control signals.
    • 一种用于确定从集成电路中提供的功能的多个设置中指定的设置的方法和装置,其中通过将外部测量电阻器连接到集成电路的测量端子来指定该设置,包括将直流电流施加到 集成电路的测量端子,从而在测量端产生测量电压; 将所述直流电流施加到所述集成电路的参考端子,其中所述参考端子具有与其连接的外部参考电阻,从而在所述参考端产生参考电压; 量化表示基准电压与测量电压之间的电压差的差分电压的电压电平,从而产生量化电压; 以及向所述集成电路内的功能模块提供控制信号,所述控制信号表示对应于所述量化电压的所述设置之一,其中每个所述设置由不同的量化电压表示; 其中所述功能模块实现由所述控制信号表示的所述设置之一。