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    • 6. 发明授权
    • High performance tiling for RRAM memory
    • 高性能平铺的RRAM内存
    • US07739471B2
    • 2010-06-15
    • US11256830
    • 2005-10-24
    • Alexander AndreevIgor VikhliantsevRanko Scepanovic
    • Alexander AndreevIgor VikhliantsevRanko Scepanovic
    • G06F12/02
    • G11C8/12G11C2207/104
    • A method of configuring a random access memory matrix containing partially configured memories in the matrix. The method includes the steps of independently calculating a memory enable signal and a configuration signal for a partially configured memory in each memory tile of the memory matrix. Memory tiles not supported by a memory compiler are determined. A memory wrapper is provided for each tile not supported by the memory compiler. An address controller is inserted in the memory matrix for each tile in a group of tiles. Output signals from each memory location in a memory group having a common group index are combined into a single output signal. A first stripe of memory tiles containing non-configured memory having a first width is selected. A second strip of memory tiles containing configured memory having a second width is also selected.
    • 一种在矩阵中配置包含部分配置的存储器的随机存取存储器矩阵的方法。 该方法包括以下步骤:对存储器矩阵的每个存储器块中的部分配置的存储器独立地计算存储器使能信号和配置信号。 确定内存编译器不支持的内存片。 为存储器编译器不支持的每个片提供内存包装器。 在一组瓦片中的每个瓦片的存储矩阵中插入地址控制器。 来自具有公共组索引的存储器组中的每个存储器位置的输出信号被组合成单个输出信号。 选择包含具有第一宽度的非配置存储器的第一条存储器片。 还选择包含具有第二宽度的配置存储器的第二条存储器片。
    • 8. 发明授权
    • Built in self test transport controller architecture
    • 内置自检传输控制器架构
    • US07546505B2
    • 2009-06-09
    • US11557513
    • 2006-11-08
    • Sergey GribokAlexander AndreevIvan Pavisic
    • Sergey GribokAlexander AndreevIvan Pavisic
    • G01R31/28G11C29/00
    • G11C29/16G11C29/34G11C2029/0401G11C2029/1204G11C2029/2602
    • A built in self test circuit in a memory matrix. Memory cells within the matrix are disposed into columns. The circuit has only one memory test controller, adapted to initiate commands and receive results. Transport controllers are paired with the columns of memory cells. The controllers receive commands from the memory test controller, test memory cells within the column, receive test results, and provide the results to the memory test controller. The transport controllers operate in three modes. A production testing mode tests the memory cells in different columns, accumulating the results for a given column with the controller associated with the column. A production testing mode retrieves the results from the controllers. A diagnostic testing mode tests memory cells within one column, while retrieving results for the column.
    • 内存自检电路在内存矩阵中。 矩阵内的存储单元被排列成列。 该电路只有一个内存测试控制器,适用于启动命令并接收结果。 传输控制器与存储单元的列配对。 控制器从存储器测试控制器接收命令,测试列内的测试存储单元,接收测试结果,并将结果提供给存储器测试控制器。 运输控制器以三种模式运行。 生产测试模式测试不同列中的存储单元,使用与列相关联的控制器累积给定列的结果。 生产测试模式从控制器检索结果。 诊断测试模式测试一列内的存储单元,同时检索列的结果。
    • 9. 发明申请
    • PIPELINED LDPC ARITHMETIC UNIT
    • 管道LDPC算法单元
    • US20080178057A1
    • 2008-07-24
    • US11626400
    • 2007-01-24
    • Alexander AndreevVojislav VukovicRanko Scepanovic
    • Alexander AndreevVojislav VukovicRanko Scepanovic
    • H03M13/00
    • H03M13/1145
    • An improvement to an arithmetic unit of a low-density parity-check decoder, where the arithmetic unit has a pipelined architecture of modules. A first module calculates a difference between absolute values of md_R and md_g_in, and passes the result to a first Gallager module. The first Gallager module converts this value from a p0/p1 representation to a 2*p0−1 representation, and passes the result to a second module. The second module selectively adjusts the result of the previous module based on the sign values of md_g_in and md_R, and passes one of its outputs to a third module (the other two outputs, loc_item_out and hard_out, are not a part of the pipeline). The third module calculates a new md_g value by adding the result of the second module and loc_item_in, and passes this result to a fourth module. The fourth module separates a sign and an absolute value of the new md_g, and passes the result to a second Gallager module. The second Gallager module converts the result from the 2*p0−1 representation to the p0/p1 representation and the final value leaves the unit as md_g_out. In these calculations, md_R=a check node value from the previous iteration, md_g=an edge value (md_g_in—from the previous iteration, md_g_out—for the next iteration), p0=probability that a value is zero, p1=probability that a value is one, loc_item_in/loc_item_out=intermediate values used for the md_g_out calculation, and hard_out=a bit value estimation for the current iteration of the pipelined arithmetic unit.
    • 对低密度奇偶校验解码器的算术单元的改进,其中算术单元具有模块的流水线架构。 第一模块计算md_R和md_g_in的绝对值之间的差值,并将结果传递给第一个Gallager模块。 第一个Gallager模块将该值从p0 / p1表示转换为2 * p0-1表示,并将结果传递给第二个模块。 第二个模块根据md_g_in和md_R的符号值有选择地调整前一个模块的结果,并将其一个输出传递给第三个模块(另外两个输出loc_item_out和hard_out不是流水线的一部分)。 第三个模块通过添加第二个模块的结果和loc_item_in来计算一个新的md_g值,并将该结果传递给第四个模块。 第四个模块分离新的md_g的符号和绝对值,并将结果传递给第二个Gallager模块。 第二个Gallager模块将2 * p0-1表示的结果转换为p0 / p1表示,最终值将单位设为md_g_out。 在这些计算中,md_R =来自前一次迭代的校验节点值,md_g =边缘值(md_g_in - 来自上一次迭代,md_g_out-用于下一次迭代),p0 =值为零的概率,p1 = 值为1,loc_item_in / loc_item_out =用于md_g_out计算的中间值,hard_out =流水线运算单元当前迭代的位值估计。