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1. 发明授权

US08028990B2 Paper thickness detecting apparatus with applying electrodes 有权
标题翻译：具有施加电极的纸厚检测装置
公开(公告)号：US08028990B2
公开(公告)日：2011-10-04
申请号：US12690456
申请日：2010-01-20
申请人： Akinori Miyamoto
发明人： Akinori Miyamoto
IPC分类号： B65H7/02
CPC分类号： B65H7/02 , B65H2511/13 , B65H2511/162 , B65H2515/712 , B65H2553/23 , B65H2553/232 , G01B7/087 , G07D7/026 , G07D7/164 , B65H2220/03 , B65H2220/01
摘要： A paper thickness detecting apparatus includes a first sensor and a second sensor in which the electrostatic capacitance changes when a piece of paper such as a bank note or a piece of copying paper is inserted, and a thickness detecting unit for detecting the thickness of the piece of paper from the signals obtained from the respective first sensor and the second sensor, in order to provide a paper thickness detecting apparatus that can reliably detect a foreign object adhered to the paper.
摘要翻译：纸厚度检测装置包括第一传感器和第二传感器，当插入诸如纸币或复印纸的一张纸时，静电电容发生变化;以及厚度检测单元，用于检测该片的厚度从第一传感器和第二传感器获得的信号中的纸张，以便提供能够可靠地检测附着在纸张上的异物的纸张厚度检测装置。

2. 发明申请

US20100117295A1 PAPER THICKNESS DETECTING APPARATUS 有权
标题翻译：纸厚度检测装置
公开(公告)号：US20100117295A1
公开(公告)日：2010-05-13
申请号：US12690456
申请日：2010-01-20
申请人： Akinori MIYAMOTO
发明人： Akinori MIYAMOTO
IPC分类号： B65H7/02
CPC分类号： B65H7/02 , B65H2511/13 , B65H2511/162 , B65H2515/712 , B65H2553/23 , B65H2553/232 , G01B7/087 , G07D7/026 , G07D7/164 , B65H2220/03 , B65H2220/01
摘要： A paper thickness detecting apparatus 300 includes a first sensor 301 and a second sensor 302 in which the electrostatic capacitance changes when a piece of paper 304 such as a bank note or a piece of copying paper is inserted, and a thickness detecting unit 303 for detecting the thickness of the piece of paper 304 from the signals obtained from the respective first sensor 301 and the second sensor 302, in order to provide a paper thickness detecting apparatus that can reliably detect a foreign object adhered to the paper.
摘要翻译：纸厚度检测装置300包括第一传感器301和第二传感器302，其中插入诸如纸币或复印纸的一张纸304时静电电容发生变化;厚度检测单元303，用于检测从相应的第一传感器301和第二传感器302获得的信号中的纸张304的厚度，以提供能够可靠地检测粘附到纸上的异物的纸张厚度检测装置。

3. 发明申请

US20060146314A1 Elastic-wave monitoring device and surface-acoustic-wave device 失效
公开(公告)号：US20060146314A1
公开(公告)日：2006-07-06
申请号：US11365655
申请日：2006-03-02
申请人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
发明人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
IPC分类号： G01B11/16 , G01J4/00
CPC分类号： H03H9/14544 , G01H9/00 , G01N21/21 , H03H9/02708 , H03H9/14547
摘要： An elastic-wave monitoring device includes an optical system which is arranged so that a circularly polarized light from a light source is incident to a measured object and a light beam from the measured object passes through a polarizing filter to a photodetector. A detection unit detects periodic fluctuation components of an output signal of the photodetector. In the elastic-wave monitoring device, the polarizing filter is arranged to have a polarization transmission axis directed to one of directions of principal axes of an ellipse formed by intersections of an index ellipsoid of the measured object and a plane perpendicular to an incidence direction of the light beam and passing through an origin of the index ellipsoid.

4. 发明授权

US07054005B2 Elastic-wave monitoring device and surface-acoustic-wave device 失效
公开(公告)号：US07054005B2
公开(公告)日：2006-05-30
申请号：US10406268
申请日：2003-04-04
申请人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
发明人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
IPC分类号： G01J4/00
CPC分类号： H03H9/14544 , G01H9/00 , G01N21/21 , H03H9/02708 , H03H9/14547
摘要： An elastic-wave monitoring device includes an optical system which is arranged so that a circularly polarized light from a light source is incident to a measured object and a light beam from the measured object passes through a polarizing filter to a photodetector. A detection unit detects periodic fluctuation components of an output signal of the photodetector. In the elastic-wave monitoring device, the polarizing filter is arranged to have a polarization transmission axis directed to one of directions of principal axes of an ellipse formed by intersections of an index ellipsoid of the measured object and a plane perpendicular to an incidence direction of the light beam and passing through an origin of the index ellipsoid.

5. 发明申请

US20110235046A1 IMAGING APPARATUS 审中-公开
标题翻译：成像设备
公开(公告)号：US20110235046A1
公开(公告)日：2011-09-29
申请号：US13070024
申请日：2011-03-23
申请人： Kazunori MARUYAMA , Shinya HASEGAWA , Akinori MIYAMOTO , Norihiko ITANI
发明人： Kazunori MARUYAMA , Shinya HASEGAWA , Akinori MIYAMOTO , Norihiko ITANI
IPC分类号： G01J3/45
CPC分类号： G02B21/14 , G02B21/0004
摘要： An imaging apparatus includes an optical source configured to emit an electromagnetic wave, a wave dividing unit configured to divide the wave from the optical source into a first and a second wave beam, a probe optical source configured to emit a probe beam, a probe-beam dividing unit configured to divide the probe beam into a first and a second probe beam, a first crystal on which the first crystal is irradiated through an object and the first probe beam is incident, a second crystal on which the second crystal is irradiated through an object and the second probe beam is incident, an interference unit configured to allow the first probe beam from the first crystal to interfere with the second probe beam from the second crystal, and an image pickup device configured to capture an interference figure between the first and the second probe beam.
摘要翻译：一种成像装置，包括：被配置为发射电磁波的光源;波分割部，被配置为将来自光源的波分成第一和第二波束;被配置为发射探测光束的探测光源; 光束分割单元，被配置为将探测光束分成第一和第二探测光束，第一晶体，其上通过物体照射第一晶体，并且第一探测光束入射;第二晶体，其上照射第二晶体的第二晶体物体和第二探测光束入射;干涉单元，被配置为允许来自第一晶体的第一探测光束与来自第二晶体的第二探测光束干涉;以及图像拾取器件，被配置为捕获第一和第二探测光束。

6. 发明授权

US07362033B2 Surface-acoustic-wave device 失效
标题翻译：表面声波装置
公开(公告)号：US07362033B2
公开(公告)日：2008-04-22
申请号：US11365655
申请日：2006-03-02
申请人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
发明人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
IPC分类号： H01L41/08 , H03H9/64
CPC分类号： H03H9/14544 , G01H9/00 , G01N21/21 , H03H9/02708 , H03H9/14547
摘要： A surface-acoustic-wave device includes a piezoelectric substrate and first and second comb-shaped electrodes each having a bus-bar portion parallel to a propagation direction of a surface acoustic wave in the substrate. Respective electrode fingers are periodically formed on the piezoelectric substrate and extend in directions perpendicular to the propagation direction, wherein the electrode fingers of the first comb-shaped electrode and the electrode fingers of the second comb-shaped electrode are separated away from the bus-bar portion of the opposing comb-shaped electrode. The respective electrode fingers being periodically arrayed in the propagation direction of the surface-acoustic-wave, and the electrode fingers of each comb-shaped electrode are inclined at root portions thereof outwardly right and left from the bus-bar portion of the corresponding comb-shaped electrode so that the inclined portions of the electrode fingers face a direction of a leaking surface-acoustic-wave perpendicularly.
摘要翻译：表面声波装置包括压电基板和每个具有平行于基板中的表面声波的传播方向的汇流条部分的第一和第二梳状电极。相应的电极指周期性地形成在压电基片上并且在垂直于传播方向的方向上延伸，其中第一梳状电极的电极指和第二梳状电极的电极指分离离母线相对的梳状电极的一部分。各个电极指沿周向排列在表面声波的传播方向上，并且每个梳状电极的电极指从其相应梳状电极的汇流条部分向右和向左的根部分倾斜，使得电极指的倾斜部分垂直面向泄漏的表面声波的方向。

7. 发明授权

US06259244B1 Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect 有权
标题翻译：电波电压波形测量方法采用光采样技术，采用Pockels效应
公开(公告)号：US06259244B1
公开(公告)日：2001-07-10
申请号：US09487897
申请日：2000-01-19
申请人： Shin-ichi Wakana , Akinori Miyamoto , Soichi Hama , Kazuyuki Ozaki , Toshiaki Nagai
发明人： Shin-ichi Wakana , Akinori Miyamoto , Soichi Hama , Kazuyuki Ozaki , Toshiaki Nagai
IPC分类号： G01R31308
CPC分类号： G01R31/308 , G01R13/347
摘要： An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.
摘要翻译：一种电光电压波形测量装置，其包括具有电光效应的电光元件; 安装在电光元件上并电耦合到待测量物体的第一电极; 以及将光照射在电光元件上的第一光源。电波电压波形测量装置还包括：偏振分析器，用于分析通过电光元件的光的偏振态，并检测物体的电压波形; 安装在电光元件上并与第一电极分离的第二电极; 以及放大器，其具有耦合到所述第二电极的输入端子并输出所述对象的电压波形的低频分量。电波电压波形测量装置还包括电压波形组合处理器，通过将从偏振分析器的输出获得的对象的电压波形的高频分量与低频分量的低频分量相组合，获得对象的测量电压波形从放大器输出的物体的电压波形。

8. 发明申请

US20110309572A1 PAPER THICKNESS DETECTING APPARATUS 审中-公开
标题翻译：纸厚度检测装置
公开(公告)号：US20110309572A1
公开(公告)日：2011-12-22
申请号：US13223699
申请日：2011-09-01
申请人： Akinori MIYAMOTO
发明人： Akinori MIYAMOTO
IPC分类号： B65H7/12
CPC分类号： B65H7/02 , B65H2511/13 , B65H2511/162 , B65H2515/712 , B65H2553/23 , B65H2553/232 , G01B7/087 , G07D7/026 , G07D7/164 , B65H2220/03 , B65H2220/01
摘要： A paper thickness detecting apparatus includes a first sensor and a second sensor in which the electrostatic capacitance changes when a piece of paper such as a bank note or a piece of copying paper is inserted, and a thickness detecting unit for detecting the thickness of the piece of paper from the signals obtained from the respective first sensor and the second sensor, in order to provide a paper thickness detecting apparatus that can reliably detect a foreign object adhered to the paper.
摘要翻译：纸厚度检测装置包括第一传感器和第二传感器，当插入诸如纸币或复印纸的一张纸时，静电电容发生变化;以及厚度检测单元，用于检测该片的厚度从第一传感器和第二传感器获得的信号中的纸张，以便提供能够可靠地检测附着在纸张上的异物的纸张厚度检测装置。

9. 发明申请

US20080189665A1 Surface-acoustic-wave device 审中-公开
标题翻译：表面声波装置
公开(公告)号：US20080189665A1
公开(公告)日：2008-08-07
申请号：US12073277
申请日：2008-03-03
申请人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
发明人： Shinichi Wakana , Akinori Miyamoto , Satoru Matsuda
IPC分类号： H01L41/22 , G01R29/22
CPC分类号： H03H9/14544 , G01H9/00 , G01N21/21 , H03H9/02708 , H03H9/14547
摘要： A surface-acoustic-wave device comprises a piezoelectric substrate and first and second comb-shaped electrodes each having a bus-bar portion parallel to a propagation direction of a surface acoustic wave in the substrate. Respective electrode fingers are periodically formed on the piezoelectric substrate and extend in directions perpendicular to the propagation direction, wherein the electrode fingers of the first comb-shaped electrode and the electrode fingers of the second comb-shaped electrode are separated away from the bus-bar portion of the opposing comb-shaped electrode. The respective electrode fingers being periodically arrayed in the propagation direction of the surface-acoustic-wave, and the electrode fingers of each comb-shaped electrode are inclined at root portions thereof outwardly right and left from the bus-bar portion of the corresponding comb-shaped electrode so that the inclined portions of the electrode fingers face a direction of a leaking surface-acoustic-wave perpendicularly.
摘要翻译：表面声波装置包括压电基板和每个具有与基板中的表面声波的传播方向平行的汇流条部分的第一和第二梳状电极。相应的电极指周期性地形成在压电基片上并且在垂直于传播方向的方向上延伸，其中第一梳状电极的电极指和第二梳状电极的电极指分离离母线相对的梳状电极的一部分。各个电极指沿周向排列在表面声波的传播方向上，并且每个梳状电极的电极指从其相应梳状电极的汇流条部分向右和向左的根部分倾斜，使得电极指的倾斜部分垂直面向泄漏的表面声波的方向。

10. 发明授权

US6057677A Electrooptic voltage waveform measuring method and apparatus 失效
标题翻译：电光电压波形测量装置，具有电光效应的电光元件
公开(公告)号：US6057677A
公开(公告)日：2000-05-02
申请号：US844995
申请日：1997-04-23
申请人： Shin-ichi Wakana , Akinori Miyamoto , Soichi Hama , Kazuyuki Ozaki , Toshiaki Nagai
发明人： Shin-ichi Wakana , Akinori Miyamoto , Soichi Hama , Kazuyuki Ozaki , Toshiaki Nagai
IPC分类号： G01R13/34 , G01R31/308
CPC分类号： G01R31/308 , G01R13/347
摘要： An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.
摘要翻译：一种电光电压波形测量装置，其包括具有电光效应的电光元件; 安装在电光元件上并电耦合到待测量物体的第一电极; 以及将光照射在电光元件上的第一光源。电波电压波形测量装置还包括：偏振分析器，用于分析通过电光元件的光的偏振态，并检测物体的电压波形; 安装在电光元件上并与第一电极分离的第二电极; 以及放大器，其具有耦合到所述第二电极的输入端子并输出所述对象的电压波形的低频分量。电波电压波形测量装置还包括电压波形组合处理器，通过将从偏振分析器的输出获得的对象的电压波形的高频分量与低频分量的低频分量相组合，获得对象的测量电压波形从放大器输出的物体的电压波形。

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