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1. 发明授权

US09964588B2 Handler for testing semiconductor device and method for checking whether semiconductor device remains using the same 有权
公开(公告)号：US09964588B2
公开(公告)日：2018-05-08
申请号：US14250006
申请日：2014-04-10
申请人： TECHWING CO., LTD.
发明人： Sung Il Kwon , Jae Hun Jeong
IPC分类号： H04N9/47 , H04N7/18 , G01R31/28
CPC分类号： G01R31/2893
摘要： A handler for testing semiconductor device is disclosed. The handler for testing semiconductor device includes a socket plate having a test socket to be electrically connected to a tester, a device feeder configured to feed a semiconductor device to the test socket or recover the semiconductor device from the test socket, a camera obtaining an image of the test socket, a sensor sensing an exposing moment that at least one photographing area among photographing areas on the test socket is exposed to the camera, while the device feeder moves, and a controller configured to operate the camera to take a photograph at the exposing moment and to determine whether a semiconductor device remains in the test socket, using the image obtained by the camera.

2. 发明授权

US08919755B2 Hi-fix board clamping apparatus for use in test handler 有权
标题翻译：用于测试处理器的Hi-fix板夹紧装置
公开(公告)号：US08919755B2
公开(公告)日：2014-12-30
申请号：US11652181
申请日：2007-01-11
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： H01L21/687 , B25B5/00
CPC分类号： B25B5/006 , Y10S269/90 , Y10T24/44496
摘要： A clamping apparatus for clamping a plurality of Hi-Fix boards arranged in a row, includes at least one rotational clamping unit installed to clamp facing end sides of the two or more Hi-Fix boards together, and a plurality of clamping units installed to clamp end sides of the Hi-Fix boards other than the facing sides thereof. The rotational clamping unit includes a clamper installed to rotate about a fixed rotation point to clamp or release the claming of the facing end sides of the two or more Hi-Fix boards, and a driving unit for providing a rotational force to the clamper.
摘要翻译：一种用于夹紧排列成一列的多个Hi-Fix板的夹持装置，包括至少一个旋转夹紧单元，其安装成将两个或更多个Hi-Fix板的相对端侧夹在一起，并且多个夹紧单元安装成夹紧 Hi-Fix板的除了其正面侧之外的端面。旋转夹紧单元包括夹持器，其安装成围绕固定旋转点旋转以夹紧或释放两个或更多个Hi-Fix板的相对端侧的卡住，以及用于向夹持器提供旋转力的驱动单元。

3. 发明申请

US20130230377A1 PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT, PICKING APPARATUS THEREOF, AND METHOD FOR LOADING ELECTRONIC DEVICES ONTO LOADING ELEMENT 有权
标题翻译：用于电子设备检查设备的拾取和放置设备，其拾取装置以及用于将电子设备装载到加载元件上的方法
公开(公告)号：US20130230377A1
公开(公告)日：2013-09-05
申请号：US13870753
申请日：2013-04-25
申请人： TECHWING., CO. LTD.
发明人： Yun-Sung NA , In-Gu JEON , Dong-Hyun YO , Young-Chul LEE
IPC分类号： H01L21/677
CPC分类号： H01L21/677 , G01R31/2893 , Y10S901/16
摘要： A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
摘要翻译：提供了与电子设备检查设备的拾放装置相关的技术。拾取和放置装置包括可以与加载元件相互作用并且可以引导拾取器将电子装置加载到加载元件上的正确位置的引导单元。因此，拾取和放置装置可以允许电子装置，例如具有球型电接触引线（BGA，FBGA等）的半导体器件在测试器检查时以稳定的方式电气接触测试仪电子设备。

4. 发明授权

US08523163B2 Insert for carrier board of test handler 有权
标题翻译：插入测试处理程序的承载板
公开(公告)号：US08523163B2
公开(公告)日：2013-09-03
申请号：US12361945
申请日：2009-01-29
申请人： Yun-Sung Na , Dong-Han Kim , Young-Yong Kim
发明人： Yun-Sung Na , Dong-Han Kim , Young-Yong Kim
IPC分类号： B23Q3/00 , G03B23/02 , G11B23/107 , H01R12/00 , H05K1/00 , H01L21/683
CPC分类号： G01R1/0466
摘要： An insert for a carrier board of a test handler is disclosed. The insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch apparatus is installed to the insert pocket, so that the damaged latch apparatus can be easily replaced. The insert has a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes in the lower direction. Thus, the insert can load semiconductor devices regardless of the sizes of the semiconductor devices.
摘要翻译：公开了一种用于测试处理机的载板的插入件。具有钩的插入口可拆卸地联接到插入体。插入体可以重复使用。闩锁装置安装到插入口袋中，从而可以容易地更换损坏的闩锁装置。插入件在其装载部分的底部具有多个孔，以通过下方的孔露出半导体器件的引线。因此，无论半导体器件的尺寸如何，插入件都可以加载半导体器件。

5. 发明授权

US08277162B2 Unit for opening insert for test tray and method of mounting semiconductor device using the same 有权
标题翻译：用于测试盘的开口插入单元和使用其安装半导体器件的方法
公开(公告)号：US08277162B2
公开(公告)日：2012-10-02
申请号：US12407454
申请日：2009-03-19
申请人： Yun Sung Na , Tae Hung Ku , Jung Woo Hwang
发明人： Yun Sung Na , Tae Hung Ku , Jung Woo Hwang
IPC分类号： B65G1/00
CPC分类号： G01R31/2893
摘要： A unit for opening an insert of a test tray which comprises an accommodating space for accommodating a semiconductor device and a support for supporting the semiconductor device accommodated in the accommodating space, the unit includes a body, a pair of opening devices provided in the body to open the insert, and a positioning guide unit protruding to be inserted into an accommodating space for a semiconductor device when opening the insert and supporting the semiconductor device that is transferred into the accommodating space to be spaced upward apart from a support provided in the accommodating space.
摘要翻译：一种用于打开测试托盘的插入件的单元，其包括用于容纳半导体器件的容纳空间和用于支撑容纳在容纳空间中的半导体器件的支撑件，该单元包括主体，设置在主体中的一对打开装置打开插入件，以及定位引导单元，当打开插入件并且支撑转移到容纳空间中的半导体器件与设置在容纳空间中的支撑件向上分开时，突出地插入到用于半导体器件的容纳空间中。

6. 发明授权

US08146969B2 Pick-and-place module for test handlers 有权
标题翻译：用于测试处理程序的拾取和放置模块
公开(公告)号：US08146969B2
公开(公告)日：2012-04-03
申请号：US12784148
申请日：2010-05-20
申请人： Dong Hyun Yo , Hyun Song
发明人： Dong Hyun Yo , Hyun Song
IPC分类号： A47B97/00
CPC分类号： G01R31/2893
摘要： A pick-and-place module for test handlers includes a main body, and a kit. The main body has N-th vacuum paths (where N is plural). The kit has M-th pickers. The M-th pickers are provided so as respectively correspond to M-th vacuum passages (where 1≦M≦N), which are formed to respectively correspond to all or some of the N-th vacuum paths formed in the main body, and holds semiconductor devices or releasing the held semiconductor devices using vacuum pressures. The kit is detachably mounted to the main body.
摘要翻译：用于测试处理程序的拾取和放置模块包括主体和套件。主体具有第N个真空路径（N为多个）。该套件具有第M个选择器。第M个拾取器分别对应于形成为分别对应于形成在主体中的第N个真空通路的全部或一部分的第M个真空通道（其中1＆lt; NlE; M＆amp; N; N），以及保持半导体器件或使用真空压力释放所保持的半导体器件。该套件可拆卸地安装在主体上。

7. 发明授权

US08141922B2 Pick-and-place apparatus 有权
标题翻译：拾取和放置设备
公开(公告)号：US08141922B2
公开(公告)日：2012-03-27
申请号：US12304718
申请日：2007-06-26
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Dong Hyun Yo
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Dong Hyun Yo
IPC分类号： H01L21/673 , B66C1/02
CPC分类号： H01L21/6838
摘要： A pick-and-place apparatus for transferring and loading semiconductor devices between first and second loading elements is provided. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units, and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode, are alternately regulated to the second row interval and the third row interval in turn at the second mode, and are alternately regulated to the third row interval and the second row interval in turn at the third mode.
摘要翻译：提供了用于在第一和第二加载元件之间传送和加载半导体器件的拾取和放置装置。拾取和放置装置包括多个拾取单元模块，每个拾取单元模块具有至少一个或多个采摘单元，以及间隔调节装置，用于在第一至第三模式下调节采摘单元模块之间的间隔。第一到第三行间隔值彼此不同。拾取单元模块之间的间隔都被调节为与第一模式下的第一行间隔相同，在第二模式下依次交替地调节到第二行间隔和第三行间隔，并且被交替地调节到第三行间隔行间隔，第二行间隔依次为第三模式。

8. 发明授权

US08038191B2 Pick and place apparatus 有权
标题翻译：拾取和放置仪器
公开(公告)号：US08038191B2
公开(公告)日：2011-10-18
申请号：US12103306
申请日：2008-04-15
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Hyun Yo
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Hyun Yo
IPC分类号： B25J15/06 , B65G47/91
CPC分类号： G01R31/2893 , H05K13/0482
摘要： A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.
摘要翻译：拾取和放置装置包括预定布置的多个装置孔元件; 电源机构，用于提供用于控制所述多个设备保持元件之间的水平间距的电力; 动力传递机构，用于将来自供电机构的动力作为水平方向的平移力传递到多个装置保持元件; 用于引导所述多个装置保持元件中的一些的水平移动的第一线性运动引导机构; 以及第二线性运动引导机构，其设置在所述第一线性运动引导机构的下方，用于引导所述另一装置保持元件的水平运动。多个装置保持元件交替地可滑动地联接到第一和第二直线运动引导机构。

9. 发明申请

US20100134136A1 OPERATING METHOD OF TEST HANDLER 有权
标题翻译：测试手术操作方法
公开(公告)号：US20100134136A1
公开(公告)日：2010-06-03
申请号：US12698532
申请日：2010-02-02
申请人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
发明人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
IPC分类号： G01R31/26
CPC分类号： G01R31/2893
摘要： Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.
摘要翻译：公开了测试处理器的操作方法。拾取和放置装置从在第一加载元件上排列成矩阵的第一加载隔间拾取半导体器件，移动并放置在第二加载元件上排列成矩阵的第二加载隔间上。拾取和放置装置的拾取器从第一加载隔间拾取半导体器件，并且在一次操作期间将它们选择性地放置在第二加载隔间的多个相邻奇数行或多个相邻偶数行上。拾取和放置装置包括相对大量的拾取器，优选地排列成矩阵，并且因此以相对高的速度执行半导体器件的装载和卸载。

10. 发明授权

US06844717B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US06844717B2
公开(公告)日：2005-01-18
申请号：US09975861
申请日：2001-10-12
申请人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
发明人： Jae-Gyun Shim , Seung-Won Jeon , Yun-Sung Na , In-Gu Jeon
IPC分类号： G01R31/28 , H01L21/00 , H01L21/677 , G01R31/26
CPC分类号： H01L21/67236 , G01R31/2887 , G01R31/2893 , H01L21/67242 , H01L21/67778
摘要： The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.
摘要翻译：本发明公开了一种测试处理器，包括主体，包括用户托盘供应器的储料器和用于在设备测试期间装载携带半导体器件的多个用户托盘的用户托盘输送器，多个测试托盘，用于传送的设备加载装置用户托盘的用户托盘中的设备供应到测试托盘，第一托盘变换器改变测试托盘的水平姿势，准备所需测试温度条件的浸泡室，完成测试的测试室，脱泡室恢复设备温度，第二托盘变换器反转到水平姿态的测试托盘，装置卸载装置将半导体器件传送到测试托盘上。本发明可以使单位操作中的批量增加一倍，以提高设备运行率。此外，可以减少装置加载时间和卸载，从而可以增加在单元操作中处理的装置的数量。

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