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    • 84. 发明授权
    • High temperature lift-off technique
    • 高温剥离技术
    • US4224361A
    • 1980-09-23
    • US939926
    • 1978-09-05
    • Lubomyr T. Romankiw
    • Lubomyr T. Romankiw
    • G03F1/68G03F7/26H01L21/027H01L21/033H05K3/14G03C5/00
    • G03F1/68G03F7/26H01L21/0271H01L21/0331H05K3/143
    • A layer of resist is applied to a metal substrate, and a matrix is formed in the resist. A metal or dielectric mask having overhanging upper edges is formed by electroplating metal into the resist matrix which has preformed openings for defining the mask. The resist matrix is then removed from the substrate. A film is then deposited upon the substrate, where it is exposed, and the mask with the overhanging upper edges protecting the side walls of the mask from being covered. Then a chemical, such as an etchant, is applied to the side walls of the mask to remove it, lifting off the material deposited upon it. The mask is made by plating metal through apertures or coating of tapered holes.
    • 将抗蚀剂层施加到金属基板上,并且在抗蚀剂中形成基体。 具有突出的上边缘的金属或介电掩模通过将金属电镀到抗蚀剂基质中而形成,该抗蚀剂基体具有用于限定掩模的开口。 然后将抗蚀剂基质从基材上除去。 然后将膜沉积在衬底上,在其上暴露,并且具有保护面罩侧壁的悬垂上边缘的掩模不被覆盖。 然后,将诸如蚀刻剂的化学品施加到掩模的侧壁以将其去除,从而沉积在其上的材料。 面罩是通过孔或电镀锥形孔制成的。
    • 85. 发明授权
    • Method for forming thick self-supporting masks
    • 用于形成厚自支撑面罩的方法
    • US4080267A
    • 1978-03-21
    • US645108
    • 1975-12-29
    • Eugene E. CastellaniPatrick M. McCaffreyAloysius T. PfeifferLubomyr T. Romankiw
    • Eugene E. CastellaniPatrick M. McCaffreyAloysius T. PfeifferLubomyr T. Romankiw
    • G03F7/038G03F1/20G03F7/004H01L21/027C25D5/02C25D1/08C25D1/20
    • G03F1/20
    • A method of constructing a relatively thick, self-supporting mask suitable for electron beam projection processes. Thickness is achieved by multiple steps of coating with resist, exposure, development and plating. First an intermediate or lift off layer is deposited on a substrate. A plating or a cathode layer may then be deposited. Resist is then applied. A first mask layer comprises metal plated in accordance with the first pattern. For the second exposure a geometrically similar pattern is employed to generate larger apertures. Thus, if the first mask layer has 0.20 mil apertures, the second layer might have corresponding 0.21 mil to 0.22 mil apertures. For initial mask patterns of about 2 mil the second layer might be 2.02 mils. If desired, a third exposure can be employed with a third pattern, similar to the first two, but having larger apertures (by 0.02 to 0.03 mils) than the second pattern.
    • 一种构造适合于电子束投影工艺的相对厚的自支撑掩模的方法。 厚度通过涂覆抗蚀剂,曝光,显影和电镀的多个步骤来实现。 首先将中间层或剥离层沉积在基底上。 然后可以沉积电镀或阴极层。 然后施加抗蚀剂。 第一掩模层包括根据第一图案电镀的金属。 对于第二次曝光,采用几何相似的图案来产生较大的孔。 因此,如果第一掩模层具有0.20密耳的孔,则第二层可具有相应的0.21密耳至0.22密耳孔。 对于约2密耳的初始掩模图案,第二层可以是2.02密耳。 如果需要,可以采用类似于前两个第三图案的第三曝光,但是具有比第二图案更大的孔(0.02至0.03密耳)。