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    • 81. 发明授权
    • Inspection method and apparatus
    • 检验方法和装置
    • US08357536B2
    • 2013-01-22
    • US12955550
    • 2010-11-29
    • Sander Frederik Wuister
    • Sander Frederik Wuister
    • G01N31/22G01N33/44G01N21/64
    • G01N21/91
    • In an embodiment, there is disclosed an inspection method for detecting the presence of imprintable medium on an imprint lithography template. The method includes contacting the imprint lithography template with a marker, the marker being attachable to imprintable medium that may be on the imprint lithography template, the marker being configured to interact with incident radiation when attached to the imprintable medium, directing radiation at the imprint lithography template, and measuring radiation re-directed by the imprint lithography template to attempt to detect presence of a marker that has attached to the imprintable medium, from the interaction of the marker with the incident radiation, and thus detect the presence of imprintable medium to which the marker is attached.
    • 在一个实施例中,公开了一种用于在压印光刻模板上检测可压印介质的存在的检查方法。 所述方法包括使压印光刻模板与标记物接触,所述标记可附接到可压印介质上,所述可压印介质可以在压印光刻模板上,所述标记被配置为在附着到可压印介质时与入射辐射相互作用,在刻印光刻时引导辐射 模板和测量由压印光刻模板重新引导的辐射,以从标记与入射辐射的相互作用中尝试检测附着于可压印介质的标记物的存在,从而检测可压印介质的存在, 附加标记。
    • 82. 发明授权
    • Imprint lithography
    • 印刷光刻
    • US08318253B2
    • 2012-11-27
    • US11478305
    • 2006-06-30
    • Marcus Antonius VerschuurenSander Frederik Wuister
    • Marcus Antonius VerschuurenSander Frederik Wuister
    • B05D5/00
    • B29C33/60B29C33/3857B29C33/40B29K2083/00B29L2031/756B82Y10/00B82Y40/00G03F7/0002
    • A method of making an imprint lithography template includes applying a curable material to a patterned surface of a master imprint template, allowing the curable material to cure and thereby forming a second imprint template having a patterned surface which is the inverse of the patterned surface of the master imprint template; removing the second imprint template from the master imprint template; applying inorganic sol-gel to a substrate; imprinting the inorganic sol-gel with the second imprint template; allowing the inorganic sol-gel to cure; and removing the second imprint template from the cured inorganic sol-gel, such that the inorganic sol-gel forms a third imprint template having a patterned surface which corresponds with the patterned surface of the master imprint template.
    • 制备压印光刻模板的方法包括将可固化材料施加到主压印模板的图案化表面,允许可固化材料固化,从而形成具有图案化表面的第二压印模板,该图案表面与图案化表面的图案表面相反 主印模板; 从主印记模板中移除第二个印记模板; 将无机溶胶 - 凝胶施加到基底上; 用第二印记模板印刷无机溶胶 - 凝胶; 使无机溶胶 - 凝胶固化; 以及从固化的无机溶胶 - 凝胶中除去第二印迹模板,使得无机溶胶 - 凝胶形成具有对应于主印模模板的图案化表面的图案化表面的第三印模模板。
    • 90. 发明授权
    • Method for providing an ordered layer of self-assemblable polymer for use in lithography
    • 提供用于光刻的自组装聚合物的有序层的方法
    • US08822139B2
    • 2014-09-02
    • US13640293
    • 2011-01-19
    • Emiel PeetersSander Frederik WuisterRoelof Koole
    • Emiel PeetersSander Frederik WuisterRoelof Koole
    • G03F7/26B29C59/00C08G83/00B82Y40/00B82Y10/00G03F7/00
    • G03F7/0002B82Y10/00B82Y40/00
    • A method for providing an ordered polymer layer at a surface of a substrate includes depositing a self-assemblable polymer layer directly onto a primer layer on a substrate to provide an interface between the self-assemblable polymer layer and the primer layer, and treating the self-assemblable polymer layer to provide self-assembly into an ordered polymer layer, such as a block copolymer, having first and second domain types at the interface. The primer layer is adapted to improve its chemical affinity to each domain type at the interface, in response to the presence of the respective domain type in the self-assembled polymer at the interface during the self-assembly of the self-assemblable polymer layer into the ordered polymer layer. This may lead to reduction in defect levels and/or improved persistence length for the ordered polymer layer. The method may be useful for forming resist layers for use in device lithography.
    • 在衬底的表面提供有序聚合物层的方法包括将可自组装的聚合物层直接沉积在基底上的底漆层上,以提供可自组装的聚合物层和底漆层之间的界面,以及处理自身 可以将聚合物层自组装成有序聚合物层,例如在界面处具有第一和第二域类型的嵌段共聚物。 响应于在自组装聚合物层的自组装期间在界面处的自组装聚合物中存在相应的畴型,引物层适于改善其在界面处对每种畴型的化学亲和力 有序聚合物层。 这可能导致有序聚合物层的缺陷水平和/或改善的持续长度的降低。 该方法可用于形成用于器件光刻的抗蚀剂层。