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    • 87. 发明授权
    • Resist top coat composition and patterning process
    • 抵抗面漆组合和图案化工艺
    • US08088537B2
    • 2012-01-03
    • US12320183
    • 2009-01-21
    • Jun HatakeyamaYuji Harada
    • Jun HatakeyamaYuji Harada
    • G03F7/26G03F7/11C08L33/02
    • G03F7/11G03F7/2041
    • The present invention relates to a resist top coat composition and a patterning process adopting such a material, which resist top coat composition is provided for forming a top coat on a photoresist film so as to protect the photoresist film, in liguid immersion photolithography. The present invention provides a resist top coat composition for forming a top coat on a photoresist film, wherein the resist top coat composition comprises, at least: a polymer I including a repeating unit a represented by the following general formula (1); and a polymer II including repeating unit having a sulfonic acid or an amine salt of a sulfonic acid:
    • 本发明涉及一种抗蚀剂面漆组合物和采用这种材料的图案化方法,其抗蚀面漆组合物用于在光致抗蚀剂膜上形成顶涂层以保护光致抗蚀剂膜,在液体浸渍光刻中。 本发明提供了一种用于在光致抗蚀剂膜上形成顶涂层的抗蚀剂面漆组合物,其中抗蚀剂面漆组合物至少包含:包含由以下通式(1)表示的重复单元的聚合物I; 和包含具有磺酸或磺酸胺盐的重复单元的聚合物II: