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    • 81. 发明授权
    • Recessed encapsulated microelectronic devices and methods for formation
    • 嵌入式微电子器件和形成方法
    • US06819003B2
    • 2004-11-16
    • US10320882
    • 2002-12-16
    • Warren M. Farnworth
    • Warren M. Farnworth
    • H01L2328
    • H01L21/568H01L23/3128H01L24/48H01L2224/05599H01L2224/45099H01L2224/48091H01L2224/85001H01L2224/85399H01L2924/00014H01L2924/15311H01L2924/181H01L2924/18165H01L2924/00012H01L2224/45015H01L2924/207
    • A microelectronic device package and method for manufacture. In one embodiment, the device package can include a support member having a first surface, a second surface facing opposite the first surface and a cavity extending through the support member from the first surface to the second surface. A microelectronic device is disposed in the cavity and is supported in the cavity with a removable retention member. The microelectronic device is electrically coupled to the support member and is partially surrounded with an encapsulating material. The removable retention member is then removed to expose a surface of the microelectronic device. Accordingly, the package can have a low profile because the encapsulating material does not surround one of the microelectronic device surfaces. In one embodiment, a heat conductive material can be engaged with the exposed surface of the microelectronic device to increase the rate at which heat is transferred away from the microelectronic device.
    • 一种微电子器件封装及其制造方法。 在一个实施例中,装置包装可以包括具有第一表面,与第一表面相对的第二表面的支撑构件和从第一表面延伸穿过支撑构件到第二表面的空腔。 微电子器件设置在空腔中并且用可移除的保持构件支撑在空腔中。 微电子器件电耦合到支撑构件并且被封装材料部分地包围。 然后去除可移除的保持构件以暴露微电子器件的表面。 因此,由于封装材料不包围微电子器件表面之一,所以封装可以具有低的外形。 在一个实施例中,导热材料可以与微电子器件的暴露表面接合以增加热量从微电子器件转移的速率。
    • 84. 发明授权
    • Device and method for testing integrated circuit dice in an integrated circuit module
    • 在集成电路模块中测试集成电路芯片的装置和方法
    • US06801048B2
    • 2004-10-05
    • US10396163
    • 2003-03-25
    • Warren M. FarnworthJames M. WarkEric S. NelsonKevin G. Duesman
    • Warren M. FarnworthJames M. WarkEric S. NelsonKevin G. Duesman
    • G01R3128
    • G11C29/785G01R31/2884G01R31/31701G01R31/31719G01R31/318513G11C29/1201G11C29/46G11C29/80G11C29/808H01L22/22H01L2224/48091H01L2224/48227H04J2203/0062H01L2924/00014
    • An IC module, such as a Multi-Chip Module (MCM), includes multiple IC dice, each having a test mode enable bond pad, such as an output enable pad. A fuse incorporated into the MCM's substrate connects each die's test mode enable bond pad to one of the MCM's no-connection (N/C) pins, and a resistor incorporated into the substrate connects the test mode enable bond pads to one of the MCM's ground pins. By applying a supply voltage to the test mode enable bond pads through the N/C pin, a test mode is initiated in the dice. Once testing is complete, the fuse may be blown, and a ground voltage applied to the test mode enable bond pads through the ground pins so the resistor disables the test mode in the dice and initiates an operational mode. As a result, dice packaged in IC modules may be tested after packaging. A method for performing such testing once the test mode has been initiated and for repairing any failing elements found during testing includes providing test signals to the dice, receiving response signals from the dice, evaluating the response signals to identify any failing elements in the dice, programming the failing elements' addresses into anti-fuses in the dice with a programming voltage, confirming that the addresses are programmed by determining the resistance of the anti-fuses, re-testing the dice, receiving response signals from the re-tested dice, and evaluating the response signals to confirm all repairs.
    • 诸如多芯片模块(MCM)的IC模块包括多个IC芯片,每个具有测试模式使能焊盘,例如输出使能焊盘。 集成到MCM基板中的保险丝将每个管芯的测试模式使能接合焊盘连接到MCM的无连接(N / C)引脚之一,并且连接到衬底中的电阻将测试模式使能焊盘连接到MCM的一个接地 针脚。 通过向测试模式施加电源电压,使焊盘通过N / C引脚,在骰子中启动测试模式。 一旦测试完成,保险丝可能会被熔断,并且施加到测试模式的接地电压使得接合焊盘通过接地引脚,使得电阻器禁用骰子中的测试模式并启动操作模式。 因此,封装在IC模块中的裸片可以在封装后进行测试。 一旦测试模式已经启动并且用于修复在测试期间发现的任何故障元件,执行这种测试的方法包括向骰子提供测试信号,从骰子接收响应信号,评估响应信号以识别骰子中的任何故障元件, 使用编程电压将故障元件的地址编程为骰子中的防熔丝,确认通过确定防熔丝的电阻,重新测试骰子,从重新测试的骰子接收响应信号来编程地址, 并评估响应信号以确认所有维修。
    • 90. 发明授权
    • Opto-electric mounting apparatus
    • 光电安装装置
    • US06713788B2
    • 2004-03-30
    • US10341451
    • 2003-01-14
    • Kevin G. DuesmanWarren M. Farnworth
    • Kevin G. DuesmanWarren M. Farnworth
    • H01L3300
    • H05K1/181H01L25/167H01L2924/0002H01L2924/3011H05K2201/10121H05K2201/10515Y02P70/611H01L2924/00
    • An integrated circuit is provided with one or more connectors which allow an opto-electric device to be mounted on the integrated circuit directly on top of or underneath of it. Multiple opto-electric device interface regions can be defined on the integrated circuit such that an opto-electric device can be connected in a variety of directions or such that multiple opto-electric devices can be connected. In addition, an opto-electric device interface may be provided that causes the opto-electric device's leads to be directed to the corresponding integrated circuit lead in the shortest possible distance regardless of how the opto-electric device is positioned. Also disclosed is a substrate-mounted optical transmission system that may be used in connection with the opto-electric device.
    • 集成电路设置有一个或多个连接器,其允许光电装置直接安装在集成电路的顶部或其下方。 可以在集成电路上定义多个光电器件接口区域,使得光电器件可以在多个方向上连接,或者可以连接多个光电器件。 此外,可以提供光电装置接口,其使得光电装置的导线以尽可能短的距离被引导到相应的集成电路引线,而不管光电装置如何定位。 还公开了可以与光电装置结合使用的基板安装的光传输系统。