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    • 84. 发明授权
    • Current drive circuit avoiding effect of voltage drop caused by load and semiconductor memory device equipped therewith
    • 电流驱动电路避免了由装载的负载和半导体存储器件引起的电压降的影响
    • US06879513B2
    • 2005-04-12
    • US10396414
    • 2003-03-26
    • Tsukasa Ooishi
    • Tsukasa Ooishi
    • G11C11/15H01L21/8246H01L27/105G11C11/00
    • G11C11/15
    • A current drive circuit operates receiving higher voltage than in a waiting mode at source terminal of a P-channel first driver transistor, when supplying a current to a node connected to a load circuit. In accordance with the rising source potential of the first driver transistor, the gate potential output to the first driver transistor by a gate potential control circuit rises. When the first and second driver transistors are off, a precharge circuit configured with a P-channel MOS transistor precharges the node to a prescribed potential. As a result, the current drive circuit is provided with increased reliability of the gate insulating films of the driver transistors without decreasing the driving current.
    • 当向连接到负载电路的节点提供电流时,电流驱动电路操作接收比在P沟道第一驱动器晶体管的源极端处的等待模式更高的电压。 根据第一驱动晶体管的源极电位上升,由栅极电位控制电路向第一驱动晶体管输出的栅极电位上升。 当第一和第二驱动器晶体管截止时,配置有P沟道MOS晶体管的预充电电路将节点预充电到规定的电位。 结果,在不降低驱动电流的情况下,电流驱动电路具有提高驱动晶体管的栅极绝缘膜的可靠性。