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    • 83. 发明授权
    • Semiconductor system, relay apparatus, and chip circuit
    • 半导体系统,中继装置和芯片电路
    • US09164944B2
    • 2015-10-20
    • US13283942
    • 2011-10-28
    • Takao YamaguchiTomoki IshiiAtsushi Yoshida
    • Takao YamaguchiTomoki IshiiAtsushi Yoshida
    • H04L1/00G06F13/40G06F13/16H04L12/721
    • G06F13/4022G06F13/1663H04L45/123
    • Highly efficient and low latency network transmission in consideration of a difference in the traffic characteristic and a memory access load which changes moment by moment is realized. A relay device transmits data on a networked communication bus between a bus master and a memory. The relay device includes a delay time processor for obtaining information on processing delay time in other relay devices located on a plurality of transmission routes on which the data is transmitted; and a low latency route selector for selecting a memory and one of transmission routes to the memory, among the plurality of transmission routes, based on obtained information on the processing delay time regarding the plurality of transmission routes.
    • 考虑到流量特性和瞬间变化的存储器访问负载的差异,实现了高效和低延迟的网络传输。 中继设备在总线主机和存储器之间的网络通信总线上传输数据。 所述中继装置包括延迟时间处理器,用于获取位于发送所述数据的多个传输路由上的其他中继装置中处理延迟时间的信息; 以及低等待时间路由选择器,用于基于获得的关于多个传输路由的处理延迟时间的信息,在多个传输路由之中选择存储器和到存储器的传输路由中的一条路由。
    • 84. 发明授权
    • Semiconductor test device, semiconductor test circuit connection device, and semiconductor test method
    • 半导体测试器件,半导体测试电路连接器件和半导体测试方法
    • US08970235B2
    • 2015-03-03
    • US13244548
    • 2011-09-25
    • Atsushi Yoshida
    • Atsushi Yoshida
    • G01R31/26G01R31/42G01R31/28
    • G01R31/2608G01R31/2628G01R31/2841G01R31/42
    • A semiconductor test device and method for sequentially carrying out tests including an AC test, DC test, and thermal resistance test on a power semiconductor device are provided. The semiconductor test device includes a holding unit that positions the power semiconductor device. Test units each generate a test signal for the power semiconductor device and determine a test result generated in response to the test signal. A connection unit switches between the test units and selectively connects the test units electrically to electrodes of the power semiconductor device. The connection unit is controlled such that the test units are sequentially connected to the power semiconductor device to perform a plurality of the tests. The connection unit may include parallel plate electrodes in proximity to each other across an insulating sheet. The parallel plate electrodes may connect the power semiconductor device to positive and negative power sources of the test unit.
    • 提供一种用于在功率半导体器件上顺次进行AC测试,DC测试和热电阻测试的测试的半导体测试装置和方法。 半导体测试装置包括定位功率半导体器件的保持单元。 测试单元各自产生用于功率半导体器件的测试信号,并确定响应于测试信号产生的测试结果。 连接单元在测试单元之间切换并且将测试单元电选择性地连接到功率半导体器件的电极。 控制连接单元,使得测试单元顺序地连接到功率半导体器件以执行多个测试。 连接单元可以包括穿过绝缘片彼此靠近的平行板电极。 平行板电极可以将功率半导体器件连接到测试单元的正电源和负电源。
    • 85. 发明授权
    • Relay device
    • 继电器
    • US08670327B2
    • 2014-03-11
    • US13227740
    • 2011-09-08
    • Atsushi YoshidaTakao YamaguchiTomoki Ishii
    • Atsushi YoshidaTakao YamaguchiTomoki Ishii
    • H04L12/407
    • H04L47/283H04L49/102H04L49/505
    • A relay device includes a switch for switching a combination of an input for receiving traffic data and an output for sending the traffic data; a congestion information processing section for obtaining congestion information indicating a degree of congestion of each of a plurality of traffics from an adjacent relay device, and congestion information of each traffic in the relay device; a congestion information comparison section for finding information on a congestion level which quantitatively indicates difficulty of flowing of each traffic on a transmission route based on the congestion information obtained from the adjacent relay device and the congestion information of the relay device; a transmission scheduling adjustment section for assigning a transmission band of a bus to each traffic based on the congestion level; and a switch assignment section for shifting the switch based on a result of the assignment of the transmission band of the bus.
    • 中继装置包括用于切换用于接收业务数据的输入和用于发送业务数据的输出的组合的交换机; 拥塞信息处理部分,用于获得指示来自相邻中继设备的多个业务中的每一个的拥塞程度的拥塞信息,以及所述中继设备中每个业务的拥塞信息; 拥堵信息比较部,基于从所述相邻中继装置获取的拥塞信息和所述中继装置的所述拥塞信息,定量地表示各个流量在传输路由上流动的难度的拥堵度信息; 传输调度调整部分,用于基于拥塞级别将总线的传输频带分配给每个业务; 以及用于基于总线的传输频带的分配结果来转换开关的开关分配部分。
    • 89. 发明授权
    • Device linkage control apparatus
    • 装置联动控制装置
    • US08417808B2
    • 2013-04-09
    • US10521577
    • 2003-06-26
    • Atsushi YoshidaShouichi ArakiHiroshi Kutsumi
    • Atsushi YoshidaShouichi ArakiHiroshi Kutsumi
    • G06F15/173G06F11/00
    • G05B23/0283
    • A device linkage control system is provided that includes a life data recording apparatus for accumulating usage information on the use of devices by a user, as life data, and a life pattern extraction apparatus including an episode creation unit that takes, as element data, details related to an identified episode from among life data and creates episode data which is a combination of the element data. Moreover, the system includes an episode analysis unit that analyzes relationships between the element data included in the episode data, and a life pattern interpretation unit that identifies, from the relationships between the element data, the life pattern which is characteristic of the user, and records this pattern, as life pattern information, and a control apparatus for linkage controlling of the devices by using the life pattern information of the user stored in the life pattern storage unit.
    • 提供了一种设备联动控制系统,其包括用于累积用户使用设备的使用信息的生命数据记录装置作为生命数据,以及包括发作创建单元的生命模式提取装置,该单元将元数据作为元素数据, 与生命数据中识别的剧集相关,并创建作为元素数据组合的剧集数据。 此外,该系统包括一个情节分析单元,其分析包含在情节数据中的元素数据之间的关系,以及生命模式解释单元,其从元素数据之间的关系识别作为用户的特征的生活模式和 记录该图案作为寿命图案信息,以及通过使用存储在寿命图案存储单元中的用户的寿命模式信息来连接控制装置的控制装置。