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    • 82. 发明申请
    • Design Structure For A Duty Cycle Measurement Apparatus That Operates In A Calibration Mode And A Test Mode
    • 在校准模式和测试模式下工作的占空比测量装置的设计结构
    • US20090112555A1
    • 2009-04-30
    • US12347853
    • 2008-12-31
    • David William BoerstlerEskinder HailuJieming Qi
    • David William BoerstlerEskinder HailuJieming Qi
    • G06F17/50
    • G01R31/31727
    • A design structure for an on-chip duty cycle measurement system may be embodied in a machine readable medium for designing, manufacturing or testing an integrated circuit. The design structure may embody an apparatus that measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. The design structure may specify that the DCM circuit includes a capacitor driven by a charge pump and that a reference clock signal drives the charge pump. The design structure may specify that the clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The design structure may specify that the DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit may apply a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. The design structure may specify that control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
    • 用于片上占空比测量系统的设计结构可以体现在用于设计,制造或测试集成电路的机器可读介质中。 该设计结构可以体现测量时钟电路提供给占空比测量(DCM)电路的参考时钟信号的占空比的装置。 设计结构可以指定DCM电路包括由电荷泵驱动的电容器,并且参考时钟信号驱动电荷泵。 设计结构可以指定时钟电路在多个已知占空比值之间改变参考时钟信号的占空比。 该设计结构可以指定DCM电路将对应于每个已知占空比值的合成电容电压值存储在数据存储器中。 DCM电路可以通过电荷泵向电容器施加具有未知占空比的测试时钟信号,从而将电容器充电到对应于测试时钟信号占空比的新电压值。 设计结构可以指定控制软件访问数据存储以确定测试时钟信号对应的占空比。
    • 85. 发明申请
    • Apparatus and Method for Automatically Self-Calibrating a Duty Cycle Circuit for Maximum Chip Performance
    • 用于自动校准占空比电路以实现最大芯片性能的装置和方法
    • US20070300113A1
    • 2007-12-27
    • US11848314
    • 2007-08-31
    • David BoerstlerEskinder HailuJieming Qi
    • David BoerstlerEskinder HailuJieming Qi
    • G06F11/27
    • H03K5/1565G01R31/31727G01R31/3187
    • An apparatus and method for automatically calibrating a duty cycle circuit for maximum performance are provided. A chip level built-in circuit that automatically calibrates the duty cycle correction (DCC) circuit setting for each chip is provided. This chip level built-in circuit includes a clock generation macro unit, a simple duty cycle correction (DCC) circuit, an array slice and built-in self test unit, and a DCC circuit controller. Results of a built-in self test, i.e. pass or fail, of an array are provided to the DCC circuit controller. If the result of the built-in self test is a pass, then the current DCC circuit controller's DCC control bit setting is set as the setting for the chip. If the result from the built-in self test is a fail, the DCC circuit controller's DCC control bits setting is incremented to a next setting and the self-test is performed again.
    • 提供一种用于自动校准占空比电路以实现最大性能的装置和方法。 提供了自动校准每个芯片的占空比校正(DCC)电路设置的芯片级内置电路。 该芯片级内置电路包括时钟生成宏单元,简单占空比校正(DCC)电路,阵列片和内置自检单元以及DCC电路控制器。 向DCC电路控制器提供阵列的内置自检,即通过或失败的结果。 如果内置自检的结果是通过,则将当前DCC电路控制器的DCC控制位设置设置为芯片的设置。 如果内置自检的结果为失败,DCC电路控制器的DCC控制位设置将增加到下一个设置,并再次执行自检。
    • 86. 发明申请
    • DUTY CYCLE MEASUREMENT METHOD AND APPARATUS THAT OPERATES IN A CALIBRATION MODE AND A TEST MODE
    • 在校准模式和测试模式下运行的占空比测量方法和设备
    • US20070266285A1
    • 2007-11-15
    • US11381031
    • 2006-05-01
    • David BoerstlerEskinder HailuJieming Qi
    • David BoerstlerEskinder HailuJieming Qi
    • G01R31/28
    • G01R31/31727
    • The disclosed methodology and apparatus measure the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
    • 所公开的方法和装置测量时钟电路提供给占空比测量(DCM)电路的参考时钟信号的占空比。 在一个实施例中,DCM电路包括由电荷泵驱动的电容器。 参考时钟信号驱动电荷泵。 时钟电路在多个已知的占空比值之间改变参考时钟信号的占空比。 DCM电路将对应于每个已知占空比值的合成电容电压值存储在数据存储器中。 DCM电路通过电荷泵向电容器施加具有未知占空比的测试时钟信号,从而将电容器充电到对应于测试时钟信号占空比的新电压值。 控制软件访问数据存储,以确定测试时钟信号对应的占空比。
    • 87. 发明申请
    • Duty cycle measurement apparatus and method
    • 占空比测量装置及方法
    • US20070100505A1
    • 2007-05-03
    • US11260570
    • 2005-10-27
    • David BoerstlerEskinder HailuJieming Qi
    • David BoerstlerEskinder HailuJieming Qi
    • G05D11/00
    • G01R29/02G01R31/2884
    • A mechanism for measuring duty cycle of a signal under test in an integrated circuit device, such as a microprocessor or system-on-a-chip is provided. The mechanism generates a frequency which is proportional to the duty cycle and which can be measured using common lab or manufacturing equipment. The mechanism may be implemented using simple circuits in a standard complementary metal oxide semiconductor process which requires very little area and can be powered off when it is not being used. The mechanism may include, for example, a low pass filter, a voltage divider for providing calibration reference voltage signals, a voltage to frequency converter, a frequency divider for dividing a frequency signal output so that the frequency of the signal is within a predetermined range, and an output driver and output pad. From the frequency output signal, a duty cycle of the signal under test may be calculated using off-chip equipment.
    • 提供了一种用于测量诸如微处理器或片上系统的集成电路器件中被测信号占空比的机构。 该机制产生与占空比成比例的频率,可以使用普通实验室或制造设备测量。 该机构可以使用标准互补金属氧化物半导体工艺中的简单电路来实现,其需要非常小的面积并且可以在不使用时关闭电源。 该机构可以包括例如低通滤波器,用于提供校准参考电压信号的分压器,电压到频率转换器,用于分频频率信号输出的分频器,使得信号的频率在预定范围内 ,以及输出驱动器和输出板。 从频率输出信号,可以使用片外设备来计算被测信号的占空比。