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    • 83. 发明授权
    • Sequential memory and accessing method thereof
    • 顺序存储器及其访问方法
    • US07391672B1
    • 2008-06-24
    • US11645708
    • 2006-12-27
    • Chang-Ting ChenChung-Kuang Chen
    • Chang-Ting ChenChung-Kuang Chen
    • G11C7/00
    • G11C7/12G11C7/1018G11C16/0491G11C16/26G11C17/126G11C2207/005
    • A method for accessing a memory sequentially. The memory has (m+1) bit lines and at least one row of transistors, wherein m is a positive integer. This method includes the following steps. First, voltage levels of first and second terminals of the transistors are equalized to a ground voltage in a pre-discharge period. Next, the voltage levels of the first and second terminals of the nth transistor are respectively transformed into a source voltage and a drain voltage in an nth reading period, and the voltage level of the second terminal of the (n+1)th transistor is transformed into an isolation voltage, wherein n is a positive integer smaller than m. Thereafter, the voltage levels of the first and second terminals of the mth transistor are respectively transformed into the source voltage and the drain voltage in an mth reading period. The source voltage equals the ground voltage.
    • 一种顺序访问存储器的方法。 存储器具有(m + 1)位线和至少一行晶体管,其中m是正整数。 该方法包括以下步骤。 首先,晶体管的第一和第二端子的电压电平在预放电时段内与地电压相等。 接下来,第n 晶体管的第一端子和第二端子的电压电平分别在第n 读取周期中变换为源极电压和漏极电压,并且 (n + 1)晶体管的第二端子的电压电平变换为隔离电压,其中n是小于m的正整数。 此后,在第m个读取周期中,第m个/或者以上晶体管的第一和第二端子的电压电平分别变换为源极电压和漏极电压。 源极电压等于接地电压。
    • 85. 发明申请
    • Fast pre-charge circuit and method of providing same for memory devices
    • 快速预充电电路及其为存储器件提供相同的方法
    • US20070070744A1
    • 2007-03-29
    • US11236347
    • 2005-09-27
    • Chung-Kuang Chen
    • Chung-Kuang Chen
    • G11C7/00
    • G11C7/12G11C8/08G11C2207/2254
    • A fast pre-charge circuit and method of providing a fast pre-charge for an integrated circuit memory device is disclosed. The fast pre-charge circuit comprises an address calculating unit and a multi-power driver. The address calculating unit detects the sector distance from driver of the integrated circuit memory device, and the driver provides a voltage to the loading of the integrated circuit memory device based on an output of the address calculating unit. Unlike a conventional fixed-power wordline driver, the driver of the present invention provides multiple voltage levels to the wordline or dynamically adjusts for different loading situations.
    • 公开了一种为集成电路存储器件提供快速预充电的快速预充电电路和方法。 快速预充电电路包括地址计算单元和多功率驱动器。 地址计算单元检测与集成电路存储器件的驱动器的扇区距离,并且驱动器基于地址计算单元的输出向集成电路存储器件的加载提供电压。 与传统的固定功率字线驱动器不同,本发明的驱动器向字线提供多个电压电平或者针对不同的负载情况动态调整。
    • 86. 发明授权
    • Memory with low and fixed pre-charge loading
    • 内存低,固定预充电负载
    • US06980456B2
    • 2005-12-27
    • US10794048
    • 2004-03-08
    • Chung-Kuang ChenHsiang-Pang Li
    • Chung-Kuang ChenHsiang-Pang Li
    • G11C5/06G11C5/14G11C7/00G11C17/00
    • G11C16/0491G11C5/063G11C7/12G11C16/26
    • A virtual ground memory with low and fixed pre-charge loading is provided. First metal lines GL(n−1), GL(n), and GL(n+1) and second metal lines BL(n−1) and BL(n) are disposed in the sequence GL(n−1), BL(n−1), GL(n), BL(n) and GL(n+1). Each first metal line and the adjacent second metal line are coupled respectively to two ends of the corresponding memory cell. Word lines are used for controlling memory cells. The second metal lines BL are in high level when the memory cells which the second metal lines BL are coupled to are chosen. A first and second sense amplifier are coupled to the second metal line BL(n−1) and BL(n) respectively, and the first metal lines GL(n−1) and GL(n+1) are coupled to ground level. One of the word lines is enabled to read the corresponding memory cells. A virtual ground memory loading can be fixed by this invention.
    • 提供具有低和固定预充电负载的虚拟接地存储器。 第一金属线GL(n-1),GL(n)和GL(n + 1)和第二金属线BL(n-1)和BL(n) (n-1),GL(n),BL(n)和GL(n + 1)。 每个第一金属线和相邻的第二金属线分别耦合到相应存储单元的两端。 字线用于控制存储单元。 当选择第二金属线BL耦合到的存储单元时,第二金属线BL处于高电平。 第一和第二读出放大器分别耦合到第二金属线BL(n-1)和BL(n),并且第一金属线GL(n-1)和GL(n + 1)被耦合到地电平。 其中一条字线能够读取相应的存储单元。 虚拟地面存储器加载可以通过本发明来修复。
    • 87. 发明授权
    • Memory apparatus with multi-level cells and operation method thereof
    • 具有多级单元的存储装置及其操作方法
    • US08386884B2
    • 2013-02-26
    • US12502353
    • 2009-07-14
    • Chung-Kuang Chen
    • Chung-Kuang Chen
    • G11C29/00G11C11/34
    • G11C11/5621G06F11/1072G11C16/34
    • A memory apparatus and an operation method thereof are provided. The memory apparatus includes a plurality of multi-level cells and a controller. The controller encodes input data according to a target encoding code to generate a plurality of encoded subsets, and stores the encoded subsets into the multi-level cells. Thereafter, the controller could read data from the multi-level cells, perform an error correction procedure on the read data to correct and recover the read data as recovered data, and decode the recovered data according to the target encoding code. Consequently, sensing windows between threshold voltage distributions of the multi-level cells are expanded.
    • 提供了一种存储装置及其操作方法。 存储装置包括多个多电平单元和控制器。 控制器根据目标编码代码对输入数据进行编码以生成多个编码子集,并将经编码的子集存储到多级单元中。 此后,控制器可以从多电平单元读取数据,对读取的数据执行纠错过程,以校正并恢复读取的数据作为恢复的数据,并根据目标编码代码解码恢复的数据。 因此,扩展了多级单元的阈值电压分布之间的感测窗口。
    • 89. 发明申请
    • SEQUENTIAL MEMORY AND ACCESSING METHOD THEREOF
    • 顺序存储器及其访问方法
    • US20080159060A1
    • 2008-07-03
    • US11645708
    • 2006-12-27
    • Chang-Ting ChenChung-Kuang Chen
    • Chang-Ting ChenChung-Kuang Chen
    • G11C8/00
    • G11C7/12G11C7/1018G11C16/0491G11C16/26G11C17/126G11C2207/005
    • A method for accessing a memory sequentially. The memory has (m+1) bit lines and at least one row of transistors, wherein m is a positive integer. This method includes the following steps. First, voltage levels of first and second terminals of the transistors are equalized to a ground voltage in a pre-discharge period. Next, the voltage levels of the first and second terminals of the nth transistor are respectively transformed into a source voltage and a drain voltage in an nth reading period, and the voltage level of the second terminal of the (n+1)th transistor is transformed into an isolation voltage, wherein n is a positive integer smaller than m. Thereafter, the voltage levels of the first and second terminals of the mth transistor are respectively transformed into the source voltage and the drain voltage in an mth reading period. The source voltage equals the ground voltage.
    • 一种顺序访问存储器的方法。 存储器具有(m + 1)位线和至少一行晶体管,其中m是正整数。 该方法包括以下步骤。 首先,晶体管的第一和第二端子的电压电平在预放电时段内与地电压相等。 接下来,第n 晶体管的第一端子和第二端子的电压电平分别在第n 读取周期中变换为源极电压和漏极电压,并且 将第(n + 1)个第晶体管的第二端子的电压电平变换为隔离电压,其中n是小于m的正整数。 此后,在第m个读取周期中,第m个/或者以上晶体管的第一和第二端子的电压电平分别变换为源极电压和漏极电压。 源极电压等于接地电压。