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    • 74. 发明授权
    • Display device and driving method thereof
    • 显示装置及其驱动方法
    • US07710366B2
    • 2010-05-04
    • US11133878
    • 2005-05-19
    • Jae-Hoon LeeBong-Hyun YouMin-Koo Han
    • Jae-Hoon LeeBong-Hyun YouMin-Koo Han
    • G09G3/32
    • G09G3/3233G09G3/3291G09G2300/043G09G2300/0819G09G2300/0842G09G2300/0861G09G2320/043
    • Each pixel includes: a light emitting element; a capacitor; a driving transistor that has a control terminal, an input terminal, and an output terminal and supplies a driving current to the light emitting element to emit light; a first switching unit that diode-connects the driving transistor and supplies a data voltage to the driving transistor in response to a scanning signal; and a second switching unit that supplies a driving voltage to the driving transistor and connects the light emitting element and the capacitor to the driving transistor in response to an emission signal, wherein the capacitor is connected to the driving transistor through the first switching unit, stores a control voltage being a function of the data voltage and the threshold voltage of the driving transistor, and is connected to the driving transistor through the second switching unit to supply the control voltage to the driving transistor.
    • 每个像素包括:发光元件; 电容器 驱动晶体管,其具有控制端子,输入端子和输出端子,并且向发光元件提供驱动电流以发光; 第二开关单元,二极管连接驱动晶体管,并响应于扫描信号将数据电压提供给驱动晶体管; 以及第二开关单元,其向所述驱动晶体管提供驱动电压,并且响应于发射信号将所述发光元件和所述电容器连接到所述驱动晶体管,其中所述电容器通过所述第一开关单元连接到所述驱动晶体管, 控制电压是驱动晶体管的数据电压和阈值电压的函数,并且通过第二开关单元连接到驱动晶体管,以向驱动晶体管提供控制电压。
    • 75. 发明授权
    • Pad unit having a test logic circuit and method of driving a system including the same
    • 具有测试逻辑电路的垫单元和驱动包括该测试逻辑电路的系统的方法
    • US07596735B2
    • 2009-09-29
    • US11945352
    • 2007-11-27
    • Jae-Hoon Lee
    • Jae-Hoon Lee
    • G01R31/28
    • G01R31/31715G01R31/318572
    • Noise may cause malfunction and reduction of yield in semiconductor devices operating with a low supply voltage, and a logic test is generally performed for testing characteristics of input/output pads. In the logic test, High Level Input Voltage (VIH), Low Level Input Voltage (VIL), and Input Signal Fault Detection may be considered. In a normal operation mode, the noise propagates through a logic chain by toggling of the test logic circuit, and a circuit can prevent the noise propagation using logical operations. Thus, a characteristic degradation due to the noise propagation may be reduced.
    • 在低电源电压下工作的半导体器件的噪声可能导致误动作和降低产量,通常执行逻辑测试以测试输入/输出焊盘的特性。 在逻辑测试中,可以考虑高电平输入电压(VIH),低电平输入电压(VIL)和输入信号故障检测。 在正常工作模式下,通过切换测试逻辑电路,噪声通过逻辑链传播,电路可以通过逻辑运算来防止噪声传播。 因此,由于噪声传播引起的特性劣化可能降低。