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    • 77. 发明授权
    • Manufacturing method and manufacturing apparatus of semiconductor
    • 半导体的制造方法和制造装置
    • US07981766B2
    • 2011-07-19
    • US12222546
    • 2008-08-12
    • Shunpei YamazakiKoichiro Tanaka
    • Shunpei YamazakiKoichiro Tanaka
    • H01L21/30H01L21/46
    • H01L27/1266H01L27/1214H01L27/1229H01L27/3244Y10T29/41
    • To provide a manufacturing method of a semiconductor device using an SOI substrate, by which mobility can be improved. A plurality of semiconductor films formed using a plurality of bond substrates (semiconductor substrates) are bonded to one base substrate (support substrate). At least one of the plurality of bond substrates has a crystal plane orientation different from that of the other bond substrates. Accordingly, at least one of the plurality of semiconductor films formed over one base substrate has a crystal plane orientation different from that of the other semiconductor films. The crystal plane orientation of the semiconductor film is determined in accordance with the polarity of a semiconductor element formed using the semiconductor film. For example, an n-channel element in which electrons are majority carriers is formed using a semiconductor film having a face {100}, and a p-channel element in which holes are majority carriers is formed using a semiconductor film having a face {110}.
    • 为了提供使用SOI衬底的半导体器件的制造方法,可以提高移动性。 使用多个接合基板(半导体基板)形成的多个半导体膜被接合到一个基板(支撑基板)。 多个接合基板中的至少一个具有不同于其它接合基板的晶面取向。 因此,在一个基底基板上形成的多个半导体膜中的至少一个具有不同于其它半导体膜的晶面取向。 根据使用半导体膜形成的半导体元件的极性来确定半导体膜的晶面取向。 例如,使用具有面{100}的半导体膜,使用具有面{110}的半导体膜形成空穴为多数载流子的p沟道元件,形成电子为多数载流子的n沟道元件 }。