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    • 72. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US5703381A
    • 1997-12-30
    • US557731
    • 1995-11-13
    • Kiyoaki IwasaShigeo Ohshima
    • Kiyoaki IwasaShigeo Ohshima
    • G01R31/26G01R31/28H01L21/66H01L21/822H01L23/544H01L27/04H01L23/58
    • H01L22/34G01R31/2884
    • A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.
    • 半导体集成电路包括具有主表面的矩形半导体芯片,形成在半导体芯片的主表面的周边部分中的多个焊盘,用于连接到外部连接构件,多个集成电路的电路元件形成在 除了形成多个焊盘的区域之外的主表面的区域,以及至少一个特征评估电路元件,其通过共享形成的杂质掺杂区域而与集成电路的多个电路元件中的至少一个连接 所述至少一个电路元件的一部分与所述集成电路的所述至少一个电路元件在所述主表面的除了形成所述多个焊盘的外围部分之外的区域中。
    • 73. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5287306A
    • 1994-02-15
    • US718449
    • 1991-06-20
    • Shinji MiyamotoShigeo Ohshima
    • Shinji MiyamotoShigeo Ohshima
    • G11C11/413G11C5/14G11C7/10G11C11/407G11C11/409G11C11/417H03K17/16H03K17/687H03K19/0175G11C7/00
    • G11C5/14G11C7/1051
    • A semiconductor memory device includes a first power source having a non-ground potential V.sub.cc1 terminal and a ground potential V.sub.ss1 terminal. The internal circuit is supplied with power from the first power source. The first power source is dedicated to the internal circuit. The internal circuit selects a memory cell of a memory cell array in accordance with an inputted address. The internal circuit has a first output terminal and a second output terminal the first output terminal outputs one of a pair of potential V.sub.cc1 and V.sub.ss1 and the second output terminal outputs the other of the pair in accordance with the data in the selected memory cell. A second power source has a non-ground potential V.sub.cc2 terminal and a ground potential V.sub.ss2 terminal. The output circuit is supplied with power from the second power source which is dedicated to the output circuit. The output circuit has first and second transistors serially connected between the V.sub.cc2 terminal and V.sub.ss2. The control terminals of the first and second transistors are connected to the first and second output terminals. A third transistor is connected between an interconnection between the first and second transistors connected to a data output from which data is externally outputted and the first output terminal, and the control terminal of the third transistor being connected to the second output terminal.
    • 半导体存储器件包括具有非接地电位Vcc1端子和接地电位Vss1端子的第一电源。 内部电路由第一个电源供电。 第一个电源专用于内部电路。 内部电路根据输入的地址选择存储单元阵列的存储单元。 内部电路具有第一输出端子和第二输出端子,第一输出端子输出一对电位Vcc1和Vss1中的一个,第二输出端子根据所选存储单元中的数据输出该对中的另一个。 第二电源具有非接地电位Vcc2端子和接地电位Vss2端子。 输出电路由专用于输出电路的第二电源供电。 输出电路具有串联连接在Vcc2端子和Vss2之间的第一和第二晶体管。 第一和第二晶体管的控制端子连接到第一和第二输出端子。 第三晶体管连接在与外部输出数据的数据输出端连接的第一和第二晶体管之间的互连和第一输出端子之间,第三晶体管的控制端子连接到第二输出端子。
    • 75. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5229971A
    • 1993-07-20
    • US613001
    • 1990-11-15
    • Masakazu KiryuShigeo Ohshima
    • Masakazu KiryuShigeo Ohshima
    • G11C11/401G11C7/00G11C11/407G11C11/4096
    • G11C7/00G11C11/4096
    • A semiconductor memory device comprises a memory cell array, a row decoder, a column decoder, registers and a control unit. The control unit allows the write operational mode of the column decoder to switch. In the ordinary write operational mode, data in the n registers are written into the active memory cells of the n memory cell columns in on column block selected by the column decoder, respectively. In the block write mode, data in the n registers are written into active memory cells of the n memory cell columns in the 2.sup.N column blocks selected by the column decoder, respectively. Another semiconductor memory device comprises N memory units. Each memory unit comprises a memory cell array, a row decoder, a first column decoder, a second column decoder, a data input terminal, registers and a control circuit. The control circuit is operative to allow the operational mode. When the device is in the ordinary mode, data latched in the register is written into one memory cell connected to one word line selected by the row decoder of one column selected by the first column decoder of column blocks selected by the second decoder. While when the device is in the block write mode, data latched in the register is written at the same time into j memory cells connected to one word line selected by the row decoder of column blocks selected by the second column decoder.