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    • 76. 发明授权
    • Ball grid array package
    • 球栅阵列封装
    • US06396707B1
    • 2002-05-28
    • US09454006
    • 1999-12-03
    • Chien-Ping HuangGrace Yang
    • Chien-Ping HuangGrace Yang
    • H05K702
    • H01L23/49816H01L2924/0002H05K3/3452H05K3/3457H05K2201/0989H01L2924/00
    • A ball grid array package comprises a substrate having a first surface and a second surface, a chip, an insulating material, and a solder ball. The surface of the substrate comprises ball pads, conducting traces, and solder masks wherein the conducting traces are disposed in between the adjacent ball pads, and are covered by the solder mask, in addition, a portion of each of the ball pads is also covered by the solder mask. The solder mask includes an opening positioned in the area corresponding to the ball pads wherein the opening exposes a portion of the surface the ball pad and a portion of the side wall of the ball pad. The chip is disposed on the second surface of the substrate, and is sealed and encapsulated by the insulated material. The solder balls are disposed on the first surface of the substrate, and are positioned at the openings of the ball pads. Additionally, the solder balls are electrically connected to a portion of the surface of the ball pads and a portion of the side wall of the ball pads disposed at the ball pad openings.
    • 球栅阵列封装包括具有第一表面和第二表面的衬底,芯片,绝缘材料和焊球。 衬底的表面包括球垫,导电迹线和焊接掩模,其中导电迹线设置在相邻的球垫之间,并被焊接掩模覆盖,此外,每个球垫的一部分也被覆盖 通过焊接面罩。 焊接掩模包括位于对应于球垫的区域中的开口,其中开口暴露表面的一部分球垫和球垫的侧壁的一部分。 芯片设置在基板的第二表面上,并被绝缘材料密封和封装。 焊球设置在基板的第一表面上,并且位于球垫的开口处。 此外,焊球与电极焊盘表面的一部分电连接,球垫侧壁的一部分设置在球垫开口处。
    • 78. 发明授权
    • Flash-free mold structure for integrated circuit package
    • 无闪存模块结构用于集成电路封装
    • US06290481B1
    • 2001-09-18
    • US09574878
    • 2000-05-19
    • Chien-Ping Huang
    • Chien-Ping Huang
    • B29C4514
    • B29C45/2701H01L21/565H01L2924/0002H01L2924/00
    • A flash-free mold structure is designed for use in the molding of an encapsulant for encapsulating a semiconductor die. The flash-free mold structure includes a first molding piece and a second molding piece. The second molding piece is formed with a resin passage for an encapsulating material to flow therethrough during molding process. It is a characteristic feature of this flash-free mold structure that a cutaway portion, which can be either an one-step cutaway portion or a multi-step cutaway portion, is formed at the rim of the resin passage. The cutaway portion is dimensioned significantly smaller than the resin passage for the retarding the flow speed of the encapsulating material from the resin passage into the cutaway portion during the molding process, thereby preventing the encapsulating material from entering the fissure in the junction between the first and second molding pieces. The resin passage can be either a cull, a runner, or a subrunner defined by the first and second molding pieces. With this flash-free mold structure, the IC packaging quality can be assured and fabrication tools can be prevented from contamination.
    • 无闪光模具结构被设计用于模制用于封装半导体管芯的密封剂。 无闪光模具结构包括第一成型件和第二成型件。 第二成型件在模制过程中由用于密封材料的树脂通道形成为流过其中。 这种无闪光模具结构的特征在于,在树脂通道的边缘处形成有可以是一步切口部分或多段切口部分的切口部分。 切割部分的尺寸明显小于树脂通道,用于在模制过程中阻止封装材料从树脂通道进入切除部分的流动速度,从而防止封装材料在第一和第二部分之间的接合处进入裂缝 第二个成型件。 树脂通道可以是由第一和第二成型件限定的剔除,流道或辅助材料。 利用这种无闪光模具结构,可以确保IC封装质量,并可防止制造工具的污染。