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    • 72. 发明申请
    • DIFFERENTIAL SENSE AMPLIFIER WITHOUT DEDICATED PASS-GATE TRANSISTORS
    • 差分放大器,没有专用的门极晶体管
    • US20120275253A1
    • 2012-11-01
    • US13456047
    • 2012-04-25
    • Richard FerrantRoland Thewes
    • Richard FerrantRoland Thewes
    • G11C7/08G11C7/06G11C7/12
    • G11C7/065G11C11/4091G11C2207/002
    • A differential sense amplifier for sensing data stored in a plurality of memory cells of a memory cell array, including a first CMOS inverter having an output connected to a first bit line and an input connected to a second bit line complementary to the first bit line, and a second CMOS inverter having an output connected to the second bit line and an input connected to the first bit line. Each CMOS inverter includes a pull-up transistor and a pull-down transistor, and the sense amplifier has a pair of pass-gate transistors arranged to connect the first and second bit lines to a first and a second global bit lines. Advantageously, the pass-gate transistors are constituted by the pull-up transistors or the pull-up transistors.
    • 一种用于感测存储在存储单元阵列的多个存储单元中的数据的差分读出放大器,包括连接到第一位线的输出的第一CMOS反相器和连接到与第一位线互补的第二位线的输入端, 以及具有连接到第二位线的输出和连接到第一位线的输入的第二CMOS反相器。 每个CMOS反相器包括上拉晶体管和下拉晶体管,并且读出放大器具有一对传输栅晶体管,被布置为将第一和第二位线连接到第一和第二全局位线。 有利的是,栅极晶体管由上拉晶体管或上拉晶体管构成。
    • 73. 发明申请
    • DIFFERENTIAL SENSE AMPLIFIER WITHOUT SWITCH TRANSISTORS
    • 不带开关晶体管的差分放大器
    • US20120275252A1
    • 2012-11-01
    • US13456020
    • 2012-04-25
    • Richard FerrantRoland Thewes
    • Richard FerrantRoland Thewes
    • G11C7/12G11C7/02
    • G11C7/065G11C7/12G11C11/4091G11C11/4094G11C2211/4016
    • A differential sense amplifier for sensing data stored in a plurality of memory cells of a memory cell array, including a first CMOS inverter having an output connected to a first bit line (BL) and an input connected to a second bit line complementary to the first bit line and a second CMOS inverter having an output connected to the second bit line (/BL) and an input connected to the first bit line. Each CMOS inverter includes pull-up and pull-down transistors, wherein the sources of either of the pull-up transistors or the pull-down transistors are electrically coupled and connected to a pull-up voltage source or a pull-down voltage source without an intermediate transistor between the sources of the transistors and the voltage source.
    • 一种用于感测存储在存储单元阵列的多个存储单元中的数据的差分读出放大器,包括连接到第一位线(BL)的输出的第一CMOS反相器和连接到与第一位线互补的第二位线的输入端 位线和具有连接到第二位线(/ BL)的输出的第二CMOS反相器和连接到第一位线的输入。 每个CMOS反相器包括上拉和下拉晶体管,其中上拉晶体管或下拉晶体管中的任一个的源极电耦合并连接到上拉电压源或下拉电压源,而没有 在晶体管的源极和电压源之间的中间晶体管。
    • 78. 发明授权
    • Content addressable memory cell including resistive memory elements
    • 内容可寻址存储单元,包括电阻存储元件
    • US07130206B2
    • 2006-10-31
    • US10955836
    • 2004-09-30
    • Richard Ferrant
    • Richard Ferrant
    • G11C15/00G11C11/00
    • G11C13/0004G11C15/02G11C15/046
    • A content addressable memory cell is described. In one embodiment, the content addressable memory cell includes first and second resistive memory elements being coupled in a first series connection and being connected between a first potential value and a second potential value being smaller than said first potential value, and means for their switching between states exhibiting different electric resistance values. The memory cell includes a first field effect transistor and a second field effect transistor, said first and second transistors having drain-source-paths and gate electrodes, said drain-source-paths of said first and second transistors being connected in a second series connection and being connected to at least one of first current lines. The first current line is connected to a potential value level detector for sensing a potential difference as to said third potential value.
    • 描述内容可寻址存储器单元。 在一个实施例中,内容可寻址存储器单元包括第一和第二电阻存储器元件,其以第一串联连接耦合并连接在第一电位值和小于所述第一电位值的第二电位值之间, 呈现不同电阻值的状态。 存储单元包括第一场效应晶体管和第二场效应晶体管,所述第一和第二晶体管具有漏源路径和栅电极,所述第一和第二晶体管的所述漏源极路径以第二串联连接 并且连接到第一电流线中的至少一个。 第一电流线连接到电位值电平检测器,用于感测关于所述第三电位值的电位差。
    • 79. 发明授权
    • Resistive memory cell configuration and method for sensing resistance values
    • 电阻式存储单元配置及检测电阻值的方法
    • US07068533B2
    • 2006-06-27
    • US10955832
    • 2004-09-30
    • Richard FerrantArkalgud Sitaram
    • Richard FerrantArkalgud Sitaram
    • G11C11/00G11C11/14
    • G11C11/15
    • A configuration of resistive memory cells is disclosed. In one embodiment, the configuration of resistive memory cells comprises a plurality of first current lines; a plurality of second current lines; and a plurality of third current lines. A plurality of resistive memory cells being disposed in a memory matrix form between said first and second current lines, said first current lines defining the columns of said memory matrix form, while said second current lines defining the rows of it, wherein each one of the resistive memory cells being connected to one of said first current lines; a plurality of selection transistors having gates and drain-source paths, each drain-source path of said selection transistors being connected to a multiplicity of the resistive memory cells of a row of said memory matrix, said drain-source paths of different selection transistors being connected to a fourth current line (SL), the gates of said selection transistors of a row of said memory matrix form being connected to one of said third current lines. It further relates to a method for sensing the resistance values of a selected resistive memory cell.
    • 公开了一种电阻式存储单元的结构。 在一个实施例中,电阻存储单元的配置包括多条第一电流线; 多条第二电流线; 和多条第三电流线。 多个电阻存储器单元以所述第一和第二电流线之间的存储矩阵形式布置,所述第一电流线限定所述存储矩阵形式的列,而所述第二电流线限定其行,其中每个 电阻存储器单元连接到所述第一电流线之一; 具有栅极和漏极 - 源极路径的多个选择晶体管,所述选择晶体管的每个漏 - 源路径连接到所述存储矩阵的行的多个电阻存储单元,所述不同选择晶体管的所述漏 - 源路径为 连接到第四电流线(SL),所述存储矩阵形式的行的所述选择晶体管的栅极连接到所述第三电流线之一。 本发明还涉及一种用于感测所选择的电阻性存储单元的电阻值的方法。
    • 80. 发明授权
    • Memory circuit with dynamic redundancy
    • 具有动态冗余的内存电路
    • US06934202B2
    • 2005-08-23
    • US10345843
    • 2003-01-16
    • Richard Ferrant
    • Richard Ferrant
    • G11C29/00G11C7/00
    • G11C29/848
    • The present invention relates to an integrated circuit including at least one matrix network of identical elements capable of being individually addressed at least in a first direction and including, at least for this first direction, at least one redundancy element, and a circuit that reversibly inhibits the operation of a defective element and maintains the circuit operation by using the redundancy element. The integrated circuit also may include a circuit that definitely inhibits the operation of a defective element and maintains the circuit operation by using the redundancy element.
    • 本发明涉及一种集成电路,其包括至少一个相同元件的矩阵网络,能够至少在第一方向上被单独地寻址,并且至少包括至少对于该第一方向至少一个冗余元件,以及可逆地抑制 故障元件的操作并通过使用冗余元件来维持电路操作。 集成电路还可以包括绝对地禁止故障元件的操作并且通过使用冗余元件来维持电路操作的电路。