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    • 73. 发明申请
    • METHOD FOR FABRICATING A TRENCH CAPACITOR OF DRAM
    • 用于制造DRAM的TRENCH电容器的方法
    • US20050277247A1
    • 2005-12-15
    • US10707027
    • 2003-11-16
    • Kuo-Chien WuPing Hsu
    • Kuo-Chien WuPing Hsu
    • H01L21/20H01L21/334H01L21/8242
    • H01L27/1087H01L29/66181
    • This invention discloses a method for fabricating a deep trench capacitor. A substrate is provided. A pad oxide layer and a pad nitride layer are stacked on a main surface of the substrate. A deep trench is etched into the substrate through the pad oxide layer and the pad nitride layer. A doped area is formed at the lower portion of the deep trench serving as the first electrode of the trench capacitor. A node dielectric is coated on the interior surface of the deep trench. A first polysilicon layer is deposited in the deep trench and is then recessed to a first depth. A silicon spacer layer is formed on sidewall of the deep trench over the node dielectric. An upper portion of the silicon spacer layer is doped with dopants such as BF2. The un-doped portion of the silicon spacer layer is selectively removed to expose a portion of the node dielectric. The exposed node dielectric is stripped off to expose the substrate. The remaining node dielectric covered by the doped silicon spacer layer form a protection spacer for protecting the pad oxide layer from corrosion during the subsequent etching processes.
    • 本发明公开了一种制造深沟槽电容器的方法。 提供基板。 衬底氧化物层和衬垫氮化物层堆叠在衬底的主表面上。 通过衬垫氧化物层和衬垫氮化物层将深沟槽蚀刻到衬底中。 在作为沟槽电容器的第一电极的深沟槽的下部形成掺杂区域。 节点电介质涂覆在深沟槽的内表面上。 第一多晶硅层沉积在深沟槽中,然后凹入第一深度。 硅间隔层形成在节点电介质上的深沟槽的侧壁上。 硅间隔层的上部掺杂有诸如BF 2 N的掺杂剂。 选择性地去除硅间隔层的未掺杂部分以暴露节点电介质的一部分。 将暴露的节点电介质剥离以露出衬底。 由掺杂硅间隔层覆盖的剩余节点电介质形成保护间隔物,用于在随后的蚀刻工艺期间保护衬垫氧化物层不受腐蚀。
    • 78. 发明授权
    • Substrate within a Ni/Au structure electroplated on electrical contact pads and method for fabricating the same
    • 在电接触焊盘上电镀的Ni / Au结构中的衬底及其制造方法
    • US06853084B2
    • 2005-02-08
    • US10364431
    • 2003-02-10
    • Shih-Ping HsuChiang-Du ChenYen-Hung Liu
    • Shih-Ping HsuChiang-Du ChenYen-Hung Liu
    • H01L21/48H01L23/498H05K3/24H01L23/52H01L23/48H01L29/40
    • H01L23/49811H01L21/4846H01L2924/0002H05K3/243H05K2203/0542H05K2203/0577H05K2203/1476H01L2924/00
    • The present invention discloses a substrate within a Ni/Au structure electroplated on electrical contact pads and a method for fabricating the same. The method comprises: providing a substrate with a circuit layout pattern and forming a conducting film on the surface of the substrate; depositing a first photoresist layer within an opening on said electrical conducting film surface to expose a portion of said circuit layout pattern to be electrical contact pads; removing the exposed conducting film uncovered by the first photoresist layer; depositing a second photoresist layer, covering the conducting film exposed in the openings of the first photoresist layer; electroplating Ni/Au covering the surface of the electrical contact pads; removing the first and second photoresists, and the conducting film covered by the photoresists; depositing solder mask on the substrate within an opening to expose said electrical contact pads. It improves the electrical coupling between gold wires and the electrical contact pads of the substrate, prevents the electrical contact pads from oxidation, and insurances the electrical interconnection performance.
    • 本发明公开了在电接触焊盘上电镀的Ni / Au结构内的基板及其制造方法。 该方法包括:提供具有电路布局图案的衬底并在衬底的表面上形成导电膜; 在所述导电膜表面上的开口内沉积第一光致抗蚀剂层,以将所述电路布局图案的一部分暴露为电接触焊盘; 去除未被所述第一光致抗蚀剂层覆盖的暴露的导电膜; 沉积第二光致抗蚀剂层,覆盖暴露在第一光致抗蚀剂层的开口中的导电膜; 覆盖电接触垫表面的电镀Ni / Au; 去除第一和第二光致抗蚀剂,以及由光致抗蚀剂覆盖的导电膜; 在开口内的衬底上沉积焊料掩模以暴露所述电接触焊盘。 它改善了金线和基片的电接触焊盘之间的电耦合,防止了电接触垫的氧化,并保证了电气互连性能。