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61. 发明授权

US07963513B2 Mounting device 有权
标题翻译：安装装置
公开(公告)号：US07963513B2
公开(公告)日：2011-06-21
申请号：US12024556
申请日：2008-02-01
申请人： Hiroshi Shimoyama , Kazuya Yano , Masaru Suzuki
发明人： Hiroshi Shimoyama , Kazuya Yano , Masaru Suzuki
IPC分类号： B23Q1/64
CPC分类号： G01R31/2887 , H01L21/682 , Y10S269/90
摘要： A mounting device provided on a horizontally movable stage mechanism, includes a mounting table for mounting thereon a target object, a cylindrical elevation body, having a diameter smaller than a diameter of the mounting table, for supporting the mounting table, a plurality of elevation guide rails provided on an outer peripheral surface of the elevation body so as to be spaced from each other at substantially regular intervals in a circumferential direction, and a plurality of support members each having a vertical plate to which engaging bodies engaged with the elevation guide rails are fixed. Further, a plurality of reinforcing parts are vertically provided on the outer peripheral surface of the elevation body so as to be spaced from each other at substantially regular intervals in the circumferential direction.
摘要翻译：一种设置在水平移动平台机构上的安装装置，包括用于安装目标物体的安装台，具有小于安装台直径的直径的圆柱形升降体，用于支撑安装台，多个升降导轨轨道设置在立面体的外周面上，以在圆周方向上以大致规则的间隔彼此隔开;多个支撑构件，每个支撑构件具有与升降导轨接合的接合体的垂直板，固定。此外，多个加强部分在垂直体的外周面垂直地设置，以便在圆周方向上以大致规则的间隔彼此间隔开。

62. 发明申请

US20110140332A1 TESTING APPARATUS 失效
标题翻译：测试装置
公开(公告)号：US20110140332A1
公开(公告)日：2011-06-16
申请号：US12699898
申请日：2010-02-04
申请人： SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN , HSIEN-CHUAN LIANG
发明人： SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN , HSIEN-CHUAN LIANG
IPC分类号： B25B1/24 , A47B13/08 , A47B37/00 , B25H1/04 , B25H1/08
CPC分类号： G01R31/2887
摘要： A testing apparatus is for testing products on an assembly line and includes a worktable, a positioning device, and a testing member. The worktable includes a number of wheels pivotably attached to a bottom thereof, and a number of retractable feet attached to the bottom thereof. The positioning device is attached to the worktable and includes a number of clamping members to position a product to be test. The testing member is attached to the worktable and operated by a control box to move a robot arm with a testing head to test the product.
摘要翻译：测试装置用于在装配线上测试产品，并包括工作台，定位装置和测试构件。工作台包括可枢转地附接到其底部的多个轮子，以及附接到其底部的多个可缩回的脚。定位装置连接到工作台上并且包括多个夹紧构件以定位要测试的产品。测试构件连接到工作台上并由控制箱操作，以便使用测试头移动机器人手臂以测试产品。

63. 发明申请

US20110006796A1 PROBE RETENTION ARRANGEMENT 有权
标题翻译：探索保留安排
公开(公告)号：US20110006796A1
公开(公告)日：2011-01-13
申请号：US12871420
申请日：2010-08-30
申请人： January Kister , Alex Shtarker
发明人： January Kister , Alex Shtarker
IPC分类号： G01R31/00 , B23P11/00
CPC分类号： G01R31/2887 , G01R1/0408 , G01R1/07314 , G01R1/07342 , G01R1/07357 , G01R1/07371 , G01R3/00 , Y10T29/49826
摘要： A retention arrangement that includes one or more templates for securing and aligning probes for testing a device under test.
摘要翻译：一种保留装置，包括一个或多个模板，用于固定和对准探头以测试被测设备。

64. 发明申请

US20100301888A1 PROBE DEVICE 失效
标题翻译：探测器
公开(公告)号：US20100301888A1
公开(公告)日：2010-12-02
申请号：US12745306
申请日：2008-11-05
申请人： Toshihiro Yonezawa , Shinichiro Takase
发明人： Toshihiro Yonezawa , Shinichiro Takase
IPC分类号： G01R31/00
CPC分类号： G01R31/2889 , G01R31/2887
摘要： A reinforcing member is formed at a top surface side of a probe card including a support plate for supporting a contactor and a circuit board. A plurality of long guide holes are formed in an outer peripheral portion of the reinforcing member. Fixing members fixed to a holding member and collars formed around outer circumferences of the fixing members are formed in the guide holes. A length in a longitudinal direction of each of the guide holes is greater than a diameter of each of the collars, and a central line in the longitudinal direction of each of the guide holes passes through a center of the reinforcing member. Due to the guide holes, horizontal expansion of the reinforcing member itself is allowed.
摘要翻译：在包括用于支撑接触器的支撑板和电路板的探针卡的顶表面侧上形成加强构件。在加强构件的外周部形成有多个长导向孔。固定在保持构件上的固定构件和形成在固定构件的外周周围的凸缘形成在引导孔中。每个引导孔的长度方向上的长度大于每个轴环的直径，并且每个引导孔的纵向方向上的中心线穿过加强构件的中心。由于导向孔，允许加强构件本身的水平膨胀。

65. 发明授权

US07821254B2 Method and apparatus for improving load time for automated test equipment 有权
标题翻译：用于改善自动化测试设备的加载时间的方法和装置
公开(公告)号：US07821254B2
公开(公告)日：2010-10-26
申请号：US11639769
申请日：2006-12-15
申请人： Daven Septon
发明人： Daven Septon
IPC分类号： G01R31/28
CPC分类号： G01R31/2887
摘要： An SOC tester having test cards with memory cards is presented. The SOC tester may be running a test on a device under test using test programs stored on one set of memory cards. Test programs may be down loaded to a second set of memory cards during testing using test programs from the first set of memory cards or during off times.
摘要翻译：提出了具有存储卡测试卡的SOC测试器。 SOC测试器可以使用存储在一组存储卡上的测试程序在被测设备上进行测试。在使用来自第一组存储卡的测试程序或关闭时间期间，测试程序可能会被下载到第二组存储卡。

66. 发明申请

US20100264907A1 TEST HEAD POSITIONING SYSTEM AND METHOD 有权
标题翻译：测试头定位系统和方法
公开(公告)号：US20100264907A1
公开(公告)日：2010-10-21
申请号：US12762573
申请日：2010-04-19
申请人： Christian Mueller
发明人： Christian Mueller
IPC分类号： G01R31/28
CPC分类号： G01R31/2891 , G01R31/2887
摘要： An apparatus for supporting a load includes pneumatic units and couplers coupled to opposite sides of the load. The couplers move the load parallel to a first axis responsive to actuation of the pneumatic units. At least one of the couplers rotate the load about a second axis orthogonal to the first axis. The load is compliant along the first axis and about the second axis At least one of the pneumatic units provides compliance along the first axis and about the second axis.
摘要翻译：用于支撑负载的装置包括耦合到负载的相对侧的气动单元和耦合器。响应于气动单元的致动，联接器将负载平行于第一轴移动。耦合器中的至少一个使负载围绕与第一轴正交的第二轴旋转。所述负载沿着所述第一轴线并且围绕所述第二轴线是柔性的。所述气动单元中的至少一个提供沿着所述第一轴线和所述第二轴线的顺应性。

67. 发明授权

US07804316B2 Pusher, pusher unit and semiconductor testing apparatus 有权
标题翻译：推动器，推动器单元和半导体测试装置
公开(公告)号：US07804316B2
公开(公告)日：2010-09-28
申请号：US12016211
申请日：2008-01-18
申请人： Akihiko Ito , Tsuyoshi Yamashita , Tomoyuki Kanaumi
发明人： Akihiko Ito , Tsuyoshi Yamashita , Tomoyuki Kanaumi
IPC分类号： G01R31/02
CPC分类号： G01R31/2887
摘要： A pusher 200 that pushes a semiconductor device under test 300 against a test socket 500 in a semiconductor test apparatus 20 is provided that includes a main body section 210 that is thermally coupled with the thermal source 400 and a plurality of device pushing sections 220, each of which is physically and thermally coupled to the thermal source 400, is displaced toward the test socket 500 by the pushing force of the main body section 210 to contact a surface to be pushed of a semiconductor device under test 300, pushes the semiconductor device under test 300, and transmits heat from the thermal source 400 to the semiconductor device under test 300. Thermal conductivity between the pusher and the semiconductor device under test is enhanced to provide a pusher that can quickly and accurately test a semiconductor device.
摘要翻译：提供了一种将半导体器件300与半导体测试装置20相对的测试插座500推送的推动器200，其包括与热源400热耦合的主体部分210和多个装置推动部分220 物理和热耦合到热源400通过主体部分210的推动力朝向测试插座500移动，以接触待测试的半导体器件被推动的表面，将半导体器件按下测试300，并且将热量从热源400传递到被测试的300的半导体器件。推进器和被测半导体器件之间的热传导性得到增强，以提供可以快速且准确地测试半导体器件的推动器。

68. 发明授权

US07741861B2 Test apparatus for the testing of electronic components 有权
标题翻译：用于电子元件测试的测试仪器
公开(公告)号：US07741861B2
公开(公告)日：2010-06-22
申请号：US12090419
申请日：2007-03-29
申请人： Maximilian Schaule , Manuel Petermann , Stefan Kurz , Andeas Nagy
发明人： Maximilian Schaule , Manuel Petermann , Stefan Kurz , Andeas Nagy
IPC分类号： G01R31/02
CPC分类号： G01R31/2887 , G01R31/2863
摘要： In the case of a test apparatus for testing electronic components which are present in an assembly, in particular in the form of strips, a slide-like contacting board supporting device, to which the contacting board can be fastened, is mounted on the test head. The contacting board supporting device can be moved parallel to the plane of the contacting board when the contacting nest is docked on the test head, with the result that the contacting board can be brought into different test positions which are laterally beside one another.
摘要翻译：在用于测试存在于组件中，特别是带状形式的电子部件的测试装置的情况下，可将紧固接触板的滑动式接触板支撑装置安装在测试头上。当接触座对接在测试头上时，接触板支撑装置可以平行于接触板的平面移动，结果使得接触板可以进入彼此横向相邻的不同的测试位置。

69. 发明授权

US07733081B2 Automated test equipment interface 有权
标题翻译：自动化测试设备接口
公开(公告)号：US07733081B2
公开(公告)日：2010-06-08
申请号：US11875627
申请日：2007-10-19
申请人： Vladimir Vayner , Brian Donovan
发明人： Vladimir Vayner , Brian Donovan
IPC分类号： G01R31/28
CPC分类号： G01R31/2889 , G01R31/2887
摘要： An automated test equipment interface system, e.g., for attaching a handler to a test head, includes a device interface board assembly. The device interface board assembly includes a stiffener frame having a frame body that is configured for attachment to a test head, alignment brackets connected to the frame body, and cam followers connected to the alignment brackets. The system also includes a docking device. The docking device includes a docking plate that is configured for attachment to a handler, pull-down ramps connected to the docking plate and movable between a retracted position and an extended position, an actuator operable to initiate movement of the pull-down ramps, and a coupling that translates movement of the actuator to corresponding movements of the pull-down ramps. The pull-down ramps can include cam surfaces that are configured to engage the cam followers of the device interface board assembly during movement between the retracted and extended positions to pull the device interface board assembly towards the docking plate.
摘要翻译：自动测试设备接口系统，例如用于将处理器附接到测试头，包括设备接口板组件。设备接口板组件包括加强框架，该加强框架具有被配置为附接到测试头的框架主体，连接到框架主体的对准支架以及连接到对准支架的凸轮从动件。该系统还包括对接装置。对接装置包括配置成附接到处理器的对接板，连接到对接板并可在缩回位置和延伸位置之间移动的下拉斜面，可操作以启动下拉斜坡的移动的致动器，以及将致动器的运动平移到下拉斜面的相应运动的联接器。下拉斜面可以包括凸轮表面，凸轮表面构造成在缩回位置和延伸位置之间移动期间接合装置接口板组件的凸轮从动件，以将装置接口板组件拉向对接板。

70. 发明授权

US07728615B2 Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus 失效
标题翻译：测试连接第一设备和第二设备的被测设备和连接设备的测试设备
公开(公告)号：US07728615B2
公开(公告)日：2010-06-01
申请号：US12047330
申请日：2008-03-13
申请人： Tetsuya Koishi
发明人： Tetsuya Koishi
IPC分类号： G01R31/02
CPC分类号： G01R31/2887
摘要： Provided is a test apparatus that tests a device under test, including a test head that generates a test signal for testing the device under test; a socket board onto which is mounted the device under test, that transmits signals between the test head and the device under test; a plurality of actuators that are disposed on a lower surface of the socket board to correspond one-to-one with support positions thereof, and that each have a state thereof changed according to a control signal supplied thereto to independently move the corresponding support position in a direction vertical to the lower surface of the socket board; and a connection control section that supplies a first control signal to each actuator to set each actuator to be in the same state, and thereafter supplies commonly to each actuator a second control signal that gradually decreases an apparatus separation distance between the socket board and the test head.
摘要翻译：提供了一种测试被测设备的测试装置，包括产生用于测试被测设备的测试信号的测试头; 在其上安装被测器件的插座板，其在测试头和被测器件之间传输信号; 多个致动器，其设置在所述插座板的下表面上，以与其支撑位置一一对应，并且每个致动器的状态根据提供给其的控制信号而改变，以独立地将相应的支撑位置移动到垂直于插座板的下表面的方向; 以及连接控制部，其向每个致动器提供第一控制信号，以将每个致动器设置在相同的状态，然后向每个致动器共同供给第二控制信号，该第二控制信号逐渐减小插座板和测试之间的设备间隔距离头。

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