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61. 发明授权

US09911634B2 Self-contained metrology wafer carrier systems 有权
公开(公告)号：US09911634B2
公开(公告)日：2018-03-06
申请号：US15193502
申请日：2016-06-27
申请人： GLOBALFOUNDRIES Inc.
发明人： Abner Bello , Stephanie Waite , William J. Fosnight , Thomas Beeg
IPC分类号： G01J5/00 , H01L21/673 , H01L21/66 , G01N21/55 , G01N21/21 , G01J5/08
CPC分类号： G01J5/0096 , G01J5/0007 , G01J5/025 , G01J5/0825 , G01J5/0896 , G01N21/211 , G01N21/55 , G01N2201/06113 , G01N2201/0683 , G01N2201/12 , G01R27/00 , H01L21/67253 , H01L21/6732 , H01L21/67353 , H01L21/67386 , H01L22/12
摘要： A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.

62. 发明授权

US09893423B2 Electromagnetic wave sensor and/or emitter 有权
公开(公告)号：US09893423B2
公开(公告)日：2018-02-13
申请号：US14534030
申请日：2014-11-05
申请人： CANON KABUSHIKI KAISHA
发明人： Alexis Debray
IPC分类号： H01Q7/00 , G01N22/00 , G01R27/06 , G01R27/00 , H01Q1/24 , H01Q5/40 , G01S13/89 , G01S13/02
CPC分类号： H01Q7/00 , G01N22/00 , G01R27/00 , G01R27/06 , G01S13/0209 , G01S13/89 , H01Q1/248 , H01Q5/40
摘要： Provided is a device for performing at least one of detection and emission of electromagnetic waves, including a plurality of antennas, in which a first antenna includes a first radiating element and a first electronic element electrically connected to the first radiating element, and is sensitive to a first frequency band, and in which a second antenna includes a second radiating element and a second electronic element electrically connected to the second radiating element, and is sensitive to a second frequency band. At least a part of the second radiating element is arranged inside the first radiating element.

63. 发明授权

US09860054B1 Real-time phase synchronization of a remote receiver with a measurement instrument 有权
公开(公告)号：US09860054B1
公开(公告)日：2018-01-02
申请号：US15351291
申请日：2016-11-14
申请人： ANRITSU COMPANY
发明人： Donald Anthony Bradley
IPC分类号： H04B10/00 , H04L7/00 , H04B10/079 , H04L5/14
CPC分类号： H04L7/0075 , G01R25/00 , G01R27/00 , G01R31/282 , H03L7/07 , H03L7/0812 , H03L7/18 , H04B10/0795 , H04B10/25 , H04L5/14 , H04L7/0331
摘要： A measurement instrument for measuring electrical characteristics of a device under test (DUT) includes a synchronization signal generator for generating a synchronization signal transmittable to a receiver, a voltage controlled phase shifter (VCPS) connected with the synchronization signal generator and a phase-to-voltage converter configured to drive the VCPS. The synchronization signal is transmitted via a duplexer configured to transmit the synchronization signal from the measurement instrument to the receiver via a fiber optic cable and retransmit the received synchronization signal from the receiver to the measurement instrument via the fiber optic cable. The phase-to-voltage converter receives as inputs the synchronization signal input to the VCPS, the synchronization signal output from the VCPS and the retransmitted synchronization signal received at the measurement instrument from the receiver. An output of the phase-to-voltage converter is provided as input to the VCPS.

64. 发明申请

US20170279544A1 ELECTRIC FIELD INTENSITY DISTRIBUTION MEASUREMENT DEVICE AND ELECTRIC FIELD INTENSITY DISTRIBUTION MEASUREMENT METHOD 有权
公开(公告)号：US20170279544A1
公开(公告)日：2017-09-28
申请号：US15467400
申请日：2017-03-23
申请人： ANRITSU CORPORATION
发明人： Hanako Noda
IPC分类号： H04B17/10 , H04B17/16 , H04L7/04 , H04B17/12
CPC分类号： H04B17/102 , G01R27/00 , H04B17/00 , H04B17/12 , H04B17/16 , H04B17/318 , H04L7/041
摘要： An electric field intensity distribution measurement device 1 that measures, in a near field, a radio signal transmitted from an antenna 110 including a plurality of antenna elements T1 to TN integrated into a transmission device 100 includes a measurement antenna 11 that receives the radio signal as a measurement signal at a plurality of scanning points included in a predetermined scanning range, a reference antenna 12 that receives the radio signal as a reference signal, a phase difference and amplitude calculation unit 16 that calculates a phase difference between a measurement signal and a reference signal with respect to each scanning point, and an amplitude of the measurement signal, and a far-field electric field intensity distribution calculation unit 17 that calculates an electric field intensity distribution in a far field using information on the phase difference and the amplitude calculated by the phase difference and amplitude calculation unit 16.

65. 发明授权

US09699894B2 Deformation sensing flexible substrate using pattern formed of conductive material 有权
公开(公告)号：US09699894B2
公开(公告)日：2017-07-04
申请号：US14895944
申请日：2015-03-11
申请人： Seoul National University R&DB Foundation
发明人： Maenghyo Cho , Kyu Jin Cho , Junghyun Ryu , Je Sung Koh , Jong Gu Lee
IPC分类号： G01R27/08 , H05K1/02 , H05K3/12 , G01B7/16 , G01R27/02 , G01N27/00 , G01R27/00 , G01N27/02
CPC分类号： H05K1/028 , G01B7/18 , G01B7/20 , G01N27/00 , G01N27/02 , G01R27/00 , G01R27/02 , G01R27/08 , H05K1/02 , H05K3/12 , H05K2201/07
摘要： Disclosed herein is a deformation sensing flexible substrate using a pattern formed of a conductive material. The deformation sensing flexible substrate, using the pattern formed of the conductive material, includes a flexible substrate; and conductive patterns in which conductors including a conductive material are arranged and formed to be contactable and non-contact to each other based on deformation of the flexible substrate.

66. 发明申请

US20170160369A1 MEASURING SYSTEM, CALIBRATION DEVICE AND MEASURING METHOD WITH UNCERTAINTY ANALYSIS 有权
公开(公告)号：US20170160369A1
公开(公告)日：2017-06-08
申请号：US14961788
申请日：2015-12-07
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Martin LEIBFRITZ
IPC分类号： G01R35/00 , G01R27/28
CPC分类号： G01R35/005 , G01R27/00 , G01R27/28 , G01R31/3191 , G01R35/00
摘要： A calibration apparatus, for calibration of a measurement device, is provided. The calibration device comprises a calibration device configured to calibrate the measurement device. The calibration device further comprises a verification device configured to verify the calibration of the measurement device. The calibration device further comprises a switch configured to switch between a connection of the measurement device to the calibration device and a connection of the measurement device to the verification device.

67. 发明申请

US20160117020A1 Electronic Device 有权
标题翻译：电子设备
公开(公告)号：US20160117020A1
公开(公告)日：2016-04-28
申请号：US14919252
申请日：2015-10-21
申请人： Semiconductor Energy Laboratory Co., Ltd.
发明人： Yasuhiko Takemura
IPC分类号： G06F3/044
CPC分类号： G06F3/044 , G01R27/00 , G06F3/0416 , G11C11/1653 , G11C11/1673 , G11C11/1693
摘要： The accuracy of reading characteristics or data of pixels or memory cells in a matrix device is increased. An electronic device includes a plurality of drive lines, a sense line intersecting the drive lines, a plurality of element devices provided at intersections thereof, a detecting circuit, a decoder, and a driver. The detecting circuit can detect a first physical quantity of the sense line and transmit a digital signal obtained by digitizing the first physical quantity to the decoder. Each of the element devices can change the first physical quantity of the sense line in accordance with a signal of the corresponding drive line. The driver can transmit coded signals based on a Hadamard matrix to the decoder and the drive lines. The decoder can perform arithmetic processing with use of the coded signals and the digital signal and calculate values based on second physical quantities of the element devices.
摘要翻译：增加了矩阵装置中的像素或存储单元的读取特性或数据的精度。电子设备包括多个驱动线，与驱动线交叉的感测线，在其交叉处设置的多个元件装置，检测电路，解码器和驱动器。检测电路可以检测感测线的第一物理量，并将通过将第一物理量数字化而获得的数字信号发送到解码器。每个元件装置可以根据对应的驱动线的信号改变感测线的第一物理量。驱动器可以将基于Hadamard矩阵的编码信号发送到解码器和驱动线。解码器可以使用编码信号和数字信号执行算术处理，并且基于元件装置的第二物理量来计算值。

68. 发明授权

US09103653B2 Non-contact sheet conductivity measurements implementing a rotating magnetic braking system 有权
标题翻译：实现旋转磁制动系统的非接触片电导率测量
公开(公告)号：US09103653B2
公开(公告)日：2015-08-11
申请号：US13533187
申请日：2012-06-26
申请人： Oki Gunawan
发明人： Oki Gunawan
IPC分类号： G01N27/02 , G01B7/06 , G01R27/00 , G01B7/02
CPC分类号： G01B7/087 , G01B7/023 , G01R27/00
摘要： A method for calculating sheet conductivity with an absolute working distance measurement includes selecting a motor frequency fM for a motor having a first magnet disposed on a shaft, tuning a motor voltage VM for the motor, measuring a no-load power of the motor, inserting a material adjacent the first magnet, tuning the motor frequency to fM, measuring the on-load power of the motor, measuring the absolute working distance and calculating the sheet conductivity of the material.
摘要翻译：一种绝对工作距离测量用于计算片材导电率的方法包括：选择具有设置在轴上的第一磁体的电动机的电动机频率fM，调整电动机的电动机电压VM，测量电动机的空载功率，插入与第一磁体相邻的材料，将电机频率调谐到fM，测量电机的负载功率，测量绝对工作距离并计算材料的片材电导率。

69. 发明申请

US20150090573A1 SILVER NANOSTRUCTURE-BASED OPTICAL STACKS AND TOUCH SENSORS WITH UV PROTECTION 有权
标题翻译：基于银纳米结构的光学堆叠和触摸传感器，具有紫外线保护
公开(公告)号：US20150090573A1
公开(公告)日：2015-04-02
申请号：US14460999
申请日：2014-08-15
申请人： Cambrios Technologies Corporation
发明人： Paul Mansky , Pierre-Marc Allemand
IPC分类号： G02B5/20 , G01R27/00 , H03K17/96 , G01R27/26
CPC分类号： G02B5/208 , G01R27/00 , G01R27/2605 , G06F3/044 , H03K17/9618 , H03K2017/9613 , H03K2217/96015
摘要： Disclosed herein are optical stacks that are stable to light exposure by incorporating one or more UV-blocking layers.
摘要翻译：本文公开了通过并入一个或多个UV阻挡层而对曝光稳定的光学堆叠。

70. 发明申请

US20140084933A1 ISOLATION RESISTANCE MEASURING APPARATUS HAVING FAULT SELF-DIAGNOSING FUNCTION AND SELF-DIAGNOSING METHOD USING THE SAME 有权
标题翻译：具有故障自诊断功能的分离电阻测量装置和使用该自诊断功能的自我诊断方法
公开(公告)号：US20140084933A1
公开(公告)日：2014-03-27
申请号：US14090719
申请日：2013-11-26
申请人： LG CHEM, LTD.
发明人： Jin-Su JANG , Joong-Woo LEE , Seung Won BACK
IPC分类号： G01R31/36
CPC分类号： G01R31/3606 , G01R27/00 , G01R27/025 , G01R27/18 , G01R31/025 , G01R31/3679 , G01R35/00 , H01M2/1072 , H01M10/48 , H01M2220/20
摘要： Disclosed is an isolation resistance measuring apparatus having a fault self-diagnosing function. The isolation resistance measuring apparatus having a fault self-diagnosing function forms a diagnosis circuit by means of a first isolation resistance measuring unit and a second isolation resistance measuring unit respectively connected to a cathode terminal and an anode terminal of a battery, and includes a control unit for determining whether a fault arises at the isolation resistance measuring apparatus by using a circuit equation derived from the diagnosis circuit and first and second diagnosis voltages. Therefore, the isolation resistance measuring apparatus may diagnose whether a fault arises at a device which measures isolation resistance of a battery.
摘要翻译：公开了一种具有故障自诊断功能的隔离电阻测量装置。具有故障自诊断功能的隔离电阻测量装置通过分别连接到电池的阴极端子和阳极端子的第一隔离电阻测量单元和第二隔离电阻测量单元形成诊断电路，并且包括控制单元，用于通过使用从诊断电路导出的电路方程和第一和第二诊断电压来确定隔离电阻测量装置是否出现故障。因此，隔离电阻测量装置可以诊断在测量电池的隔离电阻的装置处是否发生故障。

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