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61. 发明授权

US2336286A Dilation or expansion testing furnace and measuring means 失效
标题翻译：膨胀或膨胀试验炉和测量装置
公开(公告)号：US2336286A
公开(公告)日：1943-12-07
申请号：US35180440
申请日：1940-08-08
申请人： OWEN WILLIAM H
发明人： OWEN WILLIAM H
IPC分类号： G01N25/16
CPC分类号： G01N25/16

62. 发明申请

US20180267011A1 METHOD OF PREDICTING DEFORMATION OF RESIN MOLDED ARTICLE 审中-公开
公开(公告)号：US20180267011A1
公开(公告)日：2018-09-20
申请号：US15924899
申请日：2018-03-19
申请人： AISIN SEIKI KABUSHIKI KAISHA
发明人： Mie Funamoto , Tsuyoshi Tanigaki , Daisuke Kaneda , Takuro Matsunaga , Kenzo Fukumori
IPC分类号： G01N33/44 , G01N25/00 , G06F17/50
CPC分类号： G01N33/442 , G01N3/32 , G01N25/00 , G01N25/16 , G01N2203/0075 , G01N2203/0092 , G06F17/50 , G06F17/5018 , G06F17/5086 , G06F2217/12 , G06F2217/16
摘要： A method of predicting deformation of a resin molded article includes: a step of acquiring resin temperature distribution data at the time of forming the resin molded article; a step of creating crystallinity distribution data, corresponding to the resin temperature distribution data, based on a first correlation between a temperature and crystallinity of the resin molded article, which is obtained using an actually measured crystallinity of the resin molded article; a step of creating mechanical property value distribution data, corresponding to the crystallinity distribution data, based on a second correlation between the crystallinity and the mechanical property value of the resin molded article, which is obtained from the actually measured crystallinity and the mechanical property value of the resin molded article; and a step of predicting the deformation of the resin molded article using the resin temperature distribution data and the mechanical property value distribution data.

63. 发明授权

US10010916B2 Measuring thermal expansion and the thermal crown of rolls 有权
公开(公告)号：US10010916B2
公开(公告)日：2018-07-03
申请号：US14203695
申请日：2014-03-11
申请人： NOVELIS INC.
发明人： Antoine Jean Willy Pralong
IPC分类号： B21B38/00 , B21B37/74 , B21B38/12 , G01N25/16
CPC分类号： B21B38/00 , B21B37/74 , B21B38/12 , B21B2267/06 , B21B2267/19 , G01N25/16
摘要： Systems and methods for measuring the thermal crown of rolls in-situ (e.g., at high temperature) either inside or outside the rolling mill can include sensors that measure propagation times of mechanical waves through the rolls. In some embodiments, one or more sensors are used to measure the propagation times of ultrasonic waves traveling inside the roll and normal to the roll's axis. These measurements can be taken when the roll is still hot and can be used to determine in real-time the thermal expansion at various points along the roll.

64. 发明授权

US09958406B1 Method of measurement and estimation of the coefficient of thermal expansion in components 有权
公开(公告)号：US09958406B1
公开(公告)日：2018-05-01
申请号：US14559214
申请日：2014-12-03
申请人： BLOOM ENERGY CORPORATION
发明人： Cheng-Yu Lin , Daniel Darga , Michael Groesch , Harald Herchen , Vijay Srivatsan
IPC分类号： G01N25/16 , G01N27/02
CPC分类号： G01N25/16 , G01N27/026
摘要： Methods and systems for measuring and/or estimating a coefficient of thermal expansion (CTE) of a component of a fuel cell system. A CTE measurement technique includes securing a measurement member over a surface of the component via a seal having a melting point, heating the seal above its melting point of the seal, cooling the component, measurement member and seal to a second temperature below the melting point of the seal, and determining the CTE of the component based on the change in the span of the measurement member after cooling. A fuel cell component characterization technique includes measuring an electrical resistivity (ER), conductivity (EC), resistance or conductance of the component, measuring at least one additional property of the component which, together with ER, EC, resistance or conductance, correlates to the CTE of the component, and sorting the component based on the measurements.

65. 发明授权

US09899279B2 Flat laminate, symmetrical test structures and method of use to gauge white bump sensitivity 有权
公开(公告)号：US09899279B2
公开(公告)日：2018-02-20
申请号：US14517053
申请日：2014-10-17
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： William E. Bernier , Timothy H. Daubenspeck , Virendra R. Jadhav , Valerie A. Oberson , David L. Questad
IPC分类号： H01L23/538 , H05K1/18 , B05D1/36 , G01N25/16 , H01L21/66 , H01L23/00 , G01N3/60 , G01N19/04
CPC分类号： H01L22/30 , B05D1/36 , G01N3/60 , G01N19/04 , G01N25/16 , G01N2203/0296 , G01N2203/0298 , H01L24/13 , H01L2224/131 , H01L2924/10253 , H01L2924/351 , H01L2924/014 , H01L2924/00
摘要： A symmetrical, flat laminate structure used to minimize variables in a test structure to experimentally gauge white bump sensitivity to CTE mismatch is disclosed. The test structure includes a flat laminate structure. The method of using the test structure includes isolating a cause of a multivariable chip join problem that is adversely impacted by warpage and quantifying a contribution of the warpage, itself, in a formation of the multivariable chip join problem.

66. 发明申请

US20170254764A1 PRESSURIZABLE DILATOMETER SYSTEM AND APPARATUS 审中-公开
公开(公告)号：US20170254764A1
公开(公告)日：2017-09-07
申请号：US15443598
申请日：2017-02-27
申请人： David N. BREWER
发明人： David N. BREWER
IPC分类号： G01N25/16
CPC分类号： G01N25/16
摘要： Dilatometer systems for measuring characteristics of material samples are disclosed. In one embodiment, a dilatometer system includes a reactor adapted to receive the test sample, a density trap in fluid communication with the reactor, a first fluid selectively filling the reactor and a portion of the density trap, and a second fluid selectively filling a portion of the density trap. The first fluid and the second fluid are immiscible with one another and selectively form an immiscible fluid boundary in the density trap. The dilatometer system further includes a heater that selectively heats the first fluid.

67. 发明授权

US09574875B2 Wafer or reticle thermal deformation measuring techniques 有权
标题翻译：晶圆或掩模版热变形测量技术
公开(公告)号：US09574875B2
公开(公告)日：2017-02-21
申请号：US14159604
申请日：2014-01-21
申请人： Taiwan Semiconductor Manufacturing Co., Ltd.
发明人： Tsung-Hsun Lee , Kai-Fa Ho
IPC分类号： G01N19/00 , G01B21/32 , G01N25/16
CPC分类号： G01B21/32 , G01N25/16
摘要： A system includes a wafer stage adapted to hold a semiconductor wafer thereon. A moveable temperature sensor array is configured to move to a plurality of different positions over a surface of the wafer stage and to take a plurality of temperature measurements at the plurality of positions, respectively. Based on the plurality of temperature measurements, a controller is adapted to determine an expected thermal deformation for the semiconductor wafer or for a reticle arranged over the semiconductor wafer.
摘要翻译：系统包括适于在其上保持半导体晶片的晶片台。可移动温度传感器阵列被配置为移动到晶片台的表面上的多个不同位置并且分别在多个位置处进行多个温度测量。基于多个温度测量，控制器适于确定半导体晶片或布置在半导体晶片上的掩模版的预期热变形。

68. 发明申请

US20150131697A1 INDUSTRIAL MACHINE AND METHOD FOR MEASURING AMOUNT OF EXPANSION/CONTRACTION OF INDUSTRIAL MACHINE 有权
标题翻译：用于测量工业机械膨胀/承包量的工业机器和方法
公开(公告)号：US20150131697A1
公开(公告)日：2015-05-14
申请号：US14514882
申请日：2014-10-15
申请人： MITUTOYO CORPORATION
发明人： Hisayoshi SAKAI
IPC分类号： G01N25/16 , G01B11/14 , G01B7/14
CPC分类号： G01N25/16 , G01B5/0014 , G01B5/008 , G01B21/045
摘要： An industrial machine includes a moving mechanism moving one of a probe and a tool relative to a work piece, using three displacement axes parallel to each of three orthogonal axis directions; a low thermal expansion member formed with a material having a smaller thermal expansion coefficient than a material forming a structural element of the moving mechanism; and an expansion/contraction measurer measuring, using the low thermal expansion member as a reference, an amount of expansion/contraction of the structural element in one of the three orthogonal axis directions, the expansion/contraction occurring due to a change in temperature.
摘要翻译：一种工业机械包括使用平行于三个正交轴方向中的每一个的三个位移轴移动探针和工具中的一个相对于工件的移动机构; 低热膨胀构件，其形成有具有比形成移动机构的结构元件的材料更小的热膨胀系数的材料; 以及使用低热膨胀构件作为基准的膨胀/收缩测量器在三个正交轴方向中的一个方向上的结构元件的膨胀/收缩量，由于温度变化而发生膨胀/收缩。

69. 发明申请

US20150036716A1 FLAT LAMINATE, SYMMETRICAL TEST STRUCTURES AND METHOD OF USE TO GAUGE WHITE BUMP SENSITIVITY 有权
标题翻译：平板层压板，对称测试结构和使用白炽灯灵敏度的方法
公开(公告)号：US20150036716A1
公开(公告)日：2015-02-05
申请号：US14517053
申请日：2014-10-17
申请人： International Business Machines Corporation
发明人： William E. Bernier , Timothy H. Daubenspeck , Virendra R. Jadhav , Valerie A. Oberson , David L. Questad
IPC分类号： G01N25/16 , B05D1/36
CPC分类号： H01L22/30 , B05D1/36 , G01N3/60 , G01N19/04 , G01N25/16 , G01N2203/0296 , G01N2203/0298 , H01L24/13 , H01L2224/131 , H01L2924/10253 , H01L2924/351 , H01L2924/014 , H01L2924/00
摘要： A symmetrical, flat laminate structure used to minimize variables in a test structure to experimentally gauge white bump sensitivity to CTE mismatch is disclosed. The test structure includes a flat laminate structure. The method of using the test structure includes isolating a cause of a multivariable chip join problem that is adversely impacted by warpage and quantifying a contribution of the warpage, itself, in a formation of the multivariable chip join problem.
摘要翻译：公开了一种对称的平板层压结构，用于使测试结构中的变量最小化，以实验测量白色凸起对CTE不匹配的敏感性。测试结构包括平板层压结构。使用测试结构的方法包括隔离多变量芯片连接问题的原因，其由翘曲不利地影响并量化翘曲的贡献本身在多变量芯片连接问题的形成中。

70. 发明申请

US20150003494A1 TEMPERATURE-CONTROLLED BATH 有权
标题翻译：温度控制浴
公开(公告)号：US20150003494A1
公开(公告)日：2015-01-01
申请号：US14295781
申请日：2014-06-04
申请人： MITUTOYO CORPORATION
发明人： Yuichiro YOKOYAMA , Takeshi HAGINO
IPC分类号： G01N25/16 , G01N1/44
CPC分类号： G01N25/16 , G01N1/44
摘要： A temperature-controlled bath capable of swiftly changing the temperature of a sample to a target temperature and maintaining the temperature of the sample at a fixed temperature after the temperature change is provided. A temperature-controlled bath includes a temperature changing means, a temperature-controlled chamber, a sample holding chamber, and connection cut-off means. The temperature changing means is disposed in the temperature-controlled chamber, and the temperature of the temperature-controlled chamber is adjusted by the temperature changing means. The sample holding chamber is separated from the temperature-controlled chamber by a thermally conducive wall, and contains a sample therein. The connection cut-off means change a connection between the temperature-controlled chamber and the sample holding chamber to a connected state or a cut-off state.
摘要翻译：提供能够迅速将样品温度改变到目标温度并且在温度变化之后将样品温度保持在固定温度的温度控制浴。温度控制浴包括温度改变装置，温度控制室，样品保持室和连接切断装置。温度调节装置设置在温度控制室中，温度控制室的温度由温度变化装置调节。样品保持室通过热导壁从温度控制室分离，并在其中包含样品。连接切断装置将温度控制室和样品保持室之间的连接改变为连接状态或截止状态。

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