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61. 发明申请

US20160318632A1 NOVEL SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF AIRPLANES 审中-公开
公开(公告)号：US20160318632A1
公开(公告)日：2016-11-03
申请号：US15007203
申请日：2016-01-26
申请人： Aerobotics, Inc.
发明人： Douglas Allen Froom , William T. Manak
IPC分类号： B64F5/00 , G01M5/00 , G01N23/04 , G01N29/04
CPC分类号： G01N23/04 , B64F5/00 , B64F5/40 , B64F5/60 , G01M5/0016 , G01M5/0033 , G01M5/0041 , G01M5/0091 , G01N23/00 , G01N29/04 , G01N29/44 , G01N2223/646 , G01N2291/2694 , Y10S901/44
摘要： A method for managing an airplane fleet is described. The method includes: (i) developing a gold body database for an airplane model for each non-destructive inspection system implemented to detect defects; (ii) inspecting, over a period of time, a plurality of candidate airplanes of the airplane model, using different types of non-destructive inspection systems and the gold body database associated with each of the different types of non-destructive inspection systems, to identify defects present on the plurality of candidate airplanes; (iii) repairing or monitoring defects detected on the plurality of candidate airplanes; (iv) conducting a trend analysis by analyzing collective defect data obtained from inspecting of plurality of candidate airplanes; and (v) maintaining the airplane fleet, which includes plurality of candidate airplanes, by performing predictive analysis using results of trend analysis.

62. 发明申请

US20160123903A1 METHOD OF INSPECTING A PART USING A MARKING TEMPLATE FOR RADIOGRAPHY 有权
标题翻译：使用标记模板检查零件的方法进行放射学检查
公开(公告)号：US20160123903A1
公开(公告)日：2016-05-05
申请号：US14991179
申请日：2016-01-08
申请人： PCC Structurals, Inc.
发明人： James Raphord Barrett , Jason Armstrong , Doug Nikolas , Andrew Isaac Deceuster , Lawrence Lang
IPC分类号： G01N23/04 , G21K1/10
CPC分类号： G01N23/04 , A61B6/12 , B29C64/106 , B29C64/153 , G01N2223/417 , G01N2223/646 , G21K1/00 , G21K1/10 , Y10T29/49 , Y10T29/49718
摘要： A method of inspecting a part is provided that includes the steps of aligning a contoured sheet having at least one surface that corresponds to at least one surface of the part, the contoured sheet having first portions and second portions, the first portions being radiodense and the second portions being radiolucent, and at least some of the second portions corresponding to internal features of the part. The part with the contoured sheet is exposed to x-rays to produce a first radiograph with markings that correspond to the first and second portions of the contoured sheet.
摘要翻译：提供了一种检查零件的方法，其包括以下步骤：使具有至少一个表面的成形片材对准，所述至少一个表面对应于所述部件的至少一个表面，所述轮廓片材具有第一部分和第二部分，所述第一部分是放射状的，第二部分是可透射的，并且至少一些第二部分对应于该部分的内部特征。具有轮廓的片材的部件暴露于x射线以产生具有与轮廓片材的第一和第二部分相对应的标记的第一射线照片。

63. 发明申请

US20160084967A1 Low-Rate Inexpensive Digital Gamma-Ray Imaging/Inspection System 有权
标题翻译：低价廉价数字伽玛射线成像/检测系统
公开(公告)号：US20160084967A1
公开(公告)日：2016-03-24
申请号：US14493982
申请日：2014-09-23
申请人： Sharpxview AS
发明人： Einar NYGARD
IPC分类号： G01T1/20 , G01N23/04 , G01T1/202 , G01T1/208
CPC分类号： G01T1/2018 , G01N23/04 , G01N23/18 , G01N2223/202 , G01N2223/301 , G01N2223/3303 , G01N2223/628 , G01N2223/646 , G01T1/202 , G01T1/208 , G01T7/00
摘要： A γ-ray scanner includes a Solid-State Single-Photon Detector (“SSSPD”) and a γ-ray source, which may be a radioisotope such as Americium oxide (Am-241) that may not require certification since it has a low intensity that is safe even over extended periods of exposure to a human body. The γ-ray scanner may be used for monitoring a fixed object such as a pipe and includes an imaging assembly having a stationary annular gantry surrounding the pipe and an armature that fixedly supports the γ-source and the detector in mutual opposed alignment, so that they are constrained to move together. The armature rides around an inside periphery of the gantry, while the armature or the gantry moves laterally in a direction parallel to a rotation axis of the armature so as to move the γ-ray beam around and along the pipe.
摘要翻译： γ射线扫描仪包括固体单光子检测器（“SSSPD”）和γ射线源，其可以是可能不需要认证的放射性同位素，例如氧化oxide（Am-241），因为它具有低的强度即使在长时间暴露于人体时也是安全的。 γ射线扫描器可以用于监测诸如管道的固定物体，并且包括具有围绕管的固定环形龙门架的成像组件和以相互对准的方式固定地支撑γ源和检测器的电枢，使得它们被限制在一起移动。电枢围绕台架的内周围，同时电枢或龙门架沿与电枢的旋转轴线平行的方向横向移动，以使γ射线束沿着管道移动。

64. 发明申请

US20160069824A1 Nonaqueous Radiopaque Fluid and Associated Imaging System and Method 有权
标题翻译：非水不透液体和相关成像系统及方法
公开(公告)号：US20160069824A1
公开(公告)日：2016-03-10
申请号：US14478241
申请日：2014-09-05
申请人： The Boeing Company
发明人： Elizabeth M. Bowman , Danielle N. Bowman , Dennis L. Coad , Alan Buitekant , Chris T. Radcliffe
IPC分类号： G01N23/18 , G01N23/04
CPC分类号： G01N23/04 , G01N23/18 , G01N2223/319 , G01N2223/404 , G01N2223/646
摘要： An imaging system including an imaging device having a field of view, an object positioned in the field of view, the object defining a void, and a nonaqueous radiopaque fluid in the void.
摘要翻译：一种成像系统，包括具有视野的成像装置，位于视野中的物体，限定空隙的物体和空隙中的非水不透射线的流体。

65. 发明申请

US20150185170A1 X-ray fluorescence analysis of thin-film coverage defects 有权
标题翻译：薄膜覆盖缺陷的X射线荧光分析
公开(公告)号：US20150185170A1
公开(公告)日：2015-07-02
申请号：US14140709
申请日：2013-12-26
申请人： Intermolecular Inc.
发明人： Edwin Adhiprakasha
IPC分类号： G01N23/22 , C23F1/30 , C03C15/00
CPC分类号： G01N23/22 , B24B37/013 , C03C15/00 , C23F1/00 , G01N23/223 , G01N2223/61 , G01N2223/646 , H01L22/12 , H01L22/26
摘要： X-ray fluorescence (XRF) monitoring of characteristic peaks while etching thin-film layers can reveal coverage defects and thickness nonuniformity in the top film. To measure coverage and uniformity while screening candidate layer materials and processes, the candidate layers may be formed above an underlayer of a different composition. A wet etchant that selectively etches the underlayer faster than the candidate layer is applied to the candidate layer, and the XRF spectrum is monitored. Pinholes, cracks, islands, and nonuniform thickness in the candidate layer produce characteristic features in the time-dependent behavior of XRF peaks from the underlayer and/or the candidate layer. “Etch/XRF” tests can be used to rapidly and objectively identify the most uniform contiguous candidate layers to advance to further screening or production. XRF may also be calibrated against a known thickness indicator to detect the approach of a desired endpoint in an etch process.
摘要翻译：蚀刻薄膜层时的特征峰的X射线荧光（XRF）监测可以揭示顶膜的覆盖缺陷和厚度不均匀性。为了在筛选候选层材料和工艺的同时测量覆盖率和均匀性，候选层可以形成在不同组成的底层之上。将候选层选择性地蚀刻底层的湿蚀刻剂施加到候选层，并且监测XRF谱。候选层中的针孔，裂纹，岛和不均匀厚度在底层和/或候选层的XRF峰的时间依赖性行为中产生特征。 “Etch / XRF”测试可用于快速和客观地识别最均匀的连续候选层，以进一步筛选或生产。 XRF也可以针对已知的厚度指示器进行校准，以在蚀刻过程中检测所需端点的接近。

66. 发明申请

US20150134274A1 NOVEL SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF AIRPLANES 审中-公开
标题翻译：用于非破坏性检查飞机的新系统和方法
公开(公告)号：US20150134274A1
公开(公告)日：2015-05-14
申请号：US14571310
申请日：2014-12-16
申请人： Aerobotics, Inc.
发明人： Douglas Allen Froom , William T. Manak
IPC分类号： B64F5/00 , G01N29/04 , G01N23/00 , G01N29/44
CPC分类号： B64F5/0045 , B64F5/00 , B64F5/40 , B64F5/60 , G01M5/0016 , G01M5/0033 , G01M5/0041 , G01M5/0091 , G01N23/00 , G01N23/04 , G01N29/04 , G01N29/44 , G01N2223/646 , G01N2291/2694 , Y10S901/44
摘要： A method for managing an airplane fleet is described. The method includes: (i) developing a gold body database for an airplane model for each non-destructive inspection system implemented to detect defects; (ii) inspecting, over a period of time, a plurality of candidate airplanes of the airplane model, using different types of non-destructive inspection systems and the gold body database associated with each of the different types of non-destructive inspection systems, to identify defects present on the plurality of candidate airplanes; (iii) repairing or monitoring defects detected on the plurality of candidate airplanes; (iv) conducting a trend analysis by analyzing collective defect data obtained from inspecting of plurality of candidate airplanes; and (v) maintaining the airplane fleet, which includes plurality of candidate airplanes, by performing predictive analysis using results of trend analysis.
摘要翻译：描述了一种用于管理飞机机队的方法。该方法包括：（i）为每个用于检测缺陷的非破坏性检查系统开发用于飞机模型的金体数据库; （ii）在一段时间内使用不同类型的非破坏性检查系统和与各种不相似的无损检测系统相关联的金体数据库来检查飞机模型的多个候选飞机，以识别多个候选飞机上存在的缺陷; （iii）修复或监测在多个候选飞机上检测到的缺陷; （iv）通过分析从检查多个候选飞机获得的集体缺陷数据进行趋势分析; 和（v）通过使用趋势分析结果执行预测分析来维护包括多个候选飞机的飞机机队。

67. 发明申请

US20150078526A1 X-ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers 有权
$X-ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers$
标题翻译：在立方半导体（100）晶片中，Sigma = 3双缺陷的X射线衍射（XRD）表征方法
公开(公告)号：US20150078526A1
公开(公告)日：2015-03-19
申请号：US14484517
申请日：2014-09-12
申请人： U.S.A. represented by the Administrator of the National Aeronautics and Space Administration
发明人： Yeonjoon Park , Hyun Jung KIM , Jonathan R. SKUZA , Kunik LEE , Glen C. KING , Sang Hyouk CHOI
IPC分类号： G01N23/207
CPC分类号： G01N23/207 , G01N23/20 , G01N2223/0566 , G01N2223/6116 , G01N2223/646 , G01N2223/6462
摘要： An X-ray defraction (XRD) characterization method for sigma=3 twin defects in cubic semiconductor (100) wafers includes a concentration measurement method and a wafer mapping method for any cubic tetrahedral semiconductor wafers including GaAs (100) wafers and Si (100) wafers. The methods use the cubic semiconductor's (004) pole figure in order to detect sigma=3/{111} twin defects. The XRD methods are applicable to any (100) wafers of tetrahedral cubic semiconductors in the diamond structure (Si, Ge, C) and cubic zinc-blende structure (InP, InGaAs, CdTe, ZnSe, and so on) with various growth methods such as Liquid Encapsulated Czochralski (LEC) growth, Molecular Beam Epitaxy (MBE), Organometallic Vapor Phase Epitaxy (OMVPE), Czochralski growth and Metal Organic Chemical Vapor Deposition (MOCVD) growth.
摘要翻译：对于立方半导体（100）晶片中的σ= 3双缺陷的X射线衍射（XRD）表征方法包括用于包括GaAs（100）晶片和Si（100））的任何立方四面体半导体晶片的浓度测量方法和晶片映射方法，晶圆这些方法使用立方半导体（004）极数来检测sigma = 3 / {111}双缺陷。 XRD方法适用于具有各种生长方法的金刚石结构（Si，Ge，C）和立方体闪锌矿结构（InP，InGaAs，CdTe，ZnSe等）中的任何（100）四面体立方半导体晶片，作为液体封装的切克劳斯基（LEC）生长，分子束外延（MBE），有机金属气相外延（OMVPE），切克劳斯基生长和金属有机化学气相沉积（MOCVD）生长。

68. 发明授权

US08954298B2 Methods and systems for helicopter rotor blade balancing 有权
标题翻译：直升机转子叶片平衡的方法和系统
公开(公告)号：US08954298B2
公开(公告)日：2015-02-10
申请号：US13342351
申请日：2012-01-03
申请人： Arthur E. Santerre , Sharyn E. Mlinar
发明人： Arthur E. Santerre , Sharyn E. Mlinar
IPC分类号： G06F17/50
CPC分类号： G06F17/5086 , B64C27/008 , B64F5/40 , G01N2223/646
摘要： Methods and systems for balancing helicopter rotor blades are disclosed. In some examples, density data of a rotor blade may be acquired by scanning the rotor blade. In some examples, a three-dimensional model of a rotor blade may be merged with density data of the rotor blade. In some examples, simulations may be performed to predict flight data associated with a modeled rotor blade. In some examples, a database may be referenced to predict a desired weight balance of a rotor blade.
摘要翻译：公开了用于平衡直升机转子叶片的方法和系统。在一些示例中，可以通过扫描转子叶片来获得转子叶片的密度数据。在一些示例中，转子叶片的三维模型可以与转子叶片的密度数据合并。在一些示例中，可以执行模拟以预测与建模的转子叶片相关联的飞行数据。在一些示例中，可以参考数据库来预测转子叶片的期望重量平衡。

69. 发明申请

US20140259588A1 MARKING TEMPLATE FOR RADIOGRAPHY 有权
标题翻译：标记模板用于放射学
公开(公告)号：US20140259588A1
公开(公告)日：2014-09-18
申请号：US13827895
申请日：2013-03-14
申请人： PCC Structurals, Inc.
发明人： James Raphord Barrett , Jason Armstrong , Doug Nikolas , Andrew Isaac Deceuster , Lawrence Lang
IPC分类号： G21K1/00 , B29C67/00 , G01N23/04
CPC分类号： G01N23/04 , A61B6/12 , B29C64/106 , B29C64/153 , G01N2223/417 , G01N2223/646 , G21K1/00 , G21K1/10 , Y10T29/49 , Y10T29/49718
摘要： A template for radiography and methods of using and making a template are described. The template can include a contoured sheet having first portions and second portions. The first portions are radiodense and the second portions are radiolucent to provide markings on a radiograph. At least one surface of the contoured sheet can correspond to at least one surface of a target part to provide alignment of the contoured sheet to the target part.
摘要翻译：描述用于放射线照相的模板以及使用和制作模板的方法。模板可以包括具有第一部分和第二部分的轮廓片。第一部分是放射碘化物，第二部分是放射线照射的，以在放射照片上提供标记。轮廓片材的至少一个表面可以对应于目标部件的至少一个表面，以提供成形片材与目标部件的对准。

70. 发明申请

US20140205063A1 ROLLING ELEMENT INSPECTION METHOD, ROLLING ELEMENT MANUFACTURING METHOD, AND ROLLING ELEMENT 审中-公开
标题翻译：滚动元件检测方法，滚动元件制造方法和滚动元件
公开(公告)号：US20140205063A1
公开(公告)日：2014-07-24
申请号：US14241043
申请日：2012-07-27
申请人： Yutaka Tanaka , Katsutoshi Muramatsu , Hiroaki Suzuki , Daichi Ito , Masayuki Nozaki
发明人： Yutaka Tanaka , Katsutoshi Muramatsu , Hiroaki Suzuki , Daichi Ito , Masayuki Nozaki
IPC分类号： G01N23/04 , F16C33/30
CPC分类号： G01N23/04 , F16C33/30 , G01M13/04 , G01N23/083 , G01N2223/646
摘要： An inspection method of a rolling element includes the steps of: projecting an X-ray from a light source to a rolling element, detecting the X-ray passing through the rolling element by a detector, calculating data of the detected X-ray to form an image, and detecting a defect in the rolling element based on the image. At the step of projecting an X-ray, the light source rotates relatively around the rolling element while the X-ray is projected to an entire region of the rolling element facing the light source. At the step of forming an image, data of the X-ray for one circuit around the rolling element is calculated to generate the image.
摘要翻译：滚动元件的检查方法包括以下步骤：将来自光源的X射线投射到滚动元件，通过检测器检测通过滚动元件的X射线，计算检测到的X射线的数据以形成基于图像检测滚动元件的缺陷。在投影X射线的步骤中，光源相对于滚动元件旋转，同时X射线投影到面向光源的滚动元件的整个区域。在形成图像的步骤中，计算围绕滚动元件的一个电路的X射线的数据，以生成图像。

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