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    • 63. 发明授权
    • Molecular beam epitaxial growth device and molecular beam control method
therein for exactly controlling thickness and composition of epitaxial
film
    • 分子束外延生长装置和分子束控制方法,用于精确控制外延膜的厚度和组成
    • US5096533A
    • 1992-03-17
    • US672558
    • 1991-03-20
    • Takeshi Igarashi
    • Takeshi Igarashi
    • H05H3/02C23C14/54C30B23/02C30B23/08H01L21/203
    • C23C14/543C23C14/544C23C14/548C30B23/002
    • A measured molecular beam intensity V.sub.i is converted into a value V.sub.io at a reference temperature T.sub.O by calculating the following equation using the measured molecular beam intensity V.sub.i and a measured cell temperature T.sub.i : V.sub.io =V.sub.i .multidot.exp(A(1/T.sub.O -1/T.sub.i)). Next, a molecular beam intensity V.sub.O (t) at a time (t) is estimated after the last conversion time based on the reference temperature T.sub.o in accordance with the converted molecular beam intensity V.sub.io and a corresponding time t.sub.i thereof. Further, the temperature of a molecular beam source cell is controlled in accordance with an estimated cell temperature T.sub.SP (V.sub.SP), to realize a predetermined molecular beam intensity V.sub.SP, given by calculating the following equation using the estimated molecular beam intensity V.sub.O (t) and the predetermined molecular beam intensity V.sub.SP : T.sub.SP (V.sub.SP)=1/(1/T.sub.O +(log(V.sub.SP /V.sub.O (t)))/A).
    • 通过使用测量的分子束强度Vi和测量的电池温度Ti:Vio = Vixexp(A(1 / TO-1 / Ti)),通过计算以下等式,将测量的分子束强度Vi转换为参考温度TO的值Vio )。 接下来,根据转换的分子束强度Vio及其对应的时间ti,基于参考温度To在最后的转换时间之后估计时间(t)的分子束强度VO(t)。 此外,根据估计的单元温度TSP(VSP)来控制分子束源单元的温度,以实现通过使用估计分子束强度VO(t)和下式计算以下等式给出的预定分子束强度VSP: 预定的分子束强度VSP:TSP(VSP)= 1 /(1 / TO +(log(VSP / VO(t)))/ A)。
    • 65. 发明授权
    • Multi-layer microorganism culture testing apparatus
    • 多层微生物培养试验装置
    • US4485171A
    • 1984-11-27
    • US416594
    • 1982-09-10
    • Tatsuhiko IkedaTakeshi IgarashiAtsushi Shimizu
    • Tatsuhiko IkedaTakeshi IgarashiAtsushi Shimizu
    • C12M1/26C12M1/12C12M1/22C12M1/34G01N33/49C12Q1/04C12Q1/24
    • C12M23/10C12M25/02
    • A pad assembly for use in a microorganism culture test is provided which comprises, in sterile conditions, a water-absorbing pad which is impregnated with a culture medium for culturing given microorganisms and dried, a filter member bonded to the upper surface of said water absorbing pad and having submicron pores of a size capable of substantially preventing the microorganisms from passing therethrough, and a coating of an antibiotic deactivating agent applied to the upper surface of said filter member or to the common surface between said filter member and said water-absorbing pad, as well as testing apparatus having the pad assembly mounted in a vessel. The invention eliminates the adverse effect of antibiotics in a sample to be tested which will otherwise inhibit the growth of microorganisms in the sample to adversely alter test results.
    • 提供了一种用于微生物培养试验的垫组件,其在无菌条件下包括浸渍有用于培养给定微生物并干燥的培养基的吸水垫,过滤器构件结合到所述吸水的上表面 垫,并且具有能够基本上防止微生物通过的尺寸的亚微米孔,以及施加到所述过滤构件的上表面或所述过滤构件和所述吸水垫之间的共同表面的抗生素钝化剂的涂层 ,以及具有安装在容器中的垫组件的测试装置。 本发明消除了待测试样品中抗生素的不利影响,否则其将抑制样品中微生物的生长以不利地改变测试结果。